IP Library › Granted Patent US 9,318,466
Granted Patent B2
US 9,318,466 · App. 14/471,620 · Granted Apr 19, 2016

Method for electronic circuit assembly on a paper substrate

Inventors: Saket Chadda (San Jose, CA); Ramakanth Alapati (Rexford, NY); Adam Beece (Ballston Spa, NY)
Assignee: GlobalFoundries Inc.
H01L25/0652H01L25/50H01L2225/06517H01L2225/06524H01L2225/06548H01L2225/06589
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Quick Facts
Patent No.
US 9,318,466
App. No.
14/471,620
Granted
Apr 19, 2016
Kind
B2
Abstract

A methodology for a thin, flexible substrate having integrated passive circuit elements, and the resulting device are disclosed. Embodiments may include integrating one or more passive circuit components on a first or second surface of a substrate, and interconnecting one or more integrated circuit (IC) dies on a second surface of the interposer to the one or more passive circuit components with one or more metal-filled vias between the first and second surfaces, the first and second surfaces being opposite surfaces of the substrate.

Claims (33)

1. A method comprising:

integrating one or more passive circuit components on a first surface of a substrate; and

interconnecting one or more integrated circuit (IC) dies on a second surface of the substrate to the one or more passive circuit components with one or more metal-filled vias between the first and second surfaces,

wherein the first and second surfaces are opposite surfaces of the substrate, and

wherein the substrate is formed from a carbon-based material different from silicon (Si) and FR4 and which has a coefficient of thermal expansion (CTE) matched to that of Si, and by depositing alumina or a multilayer dielectric that has low permeability to oxygen and moisture on a paper substrate, by atomic layer deposition (ALD).

2. The method of claim 1 , wherein the substrate has a CTE from 1 to 11 ppm/° C.

3. The method of claim 1 , wherein the substrate has a thickness from 25 to 300 microns (μm).

4. The method of claim 1 , further comprising:

forming one or more openings in the substrate;

forming a conformal dielectric layer on all exposed surfaces of the substrate; and

forming the one or more metal-filled vias by filling the one or more openings with solder, tungsten (W), copper (Cu), silver (Ag), titanium (Ti), or other metal-based paste.

5. The method of claim 4 , comprising forming the one or more openings by mechanical punching, laser drilling, or chemical etching.

6. The method of claim 4 , comprising filling the openings by:

performing a first squeegee operation over the first surface of the substrate; and

performing a second squeegee operation over the second surface of the substrate,

wherein the openings in the substrate are utilized as a stencil.

7. The method of claim 1 , comprising integrating the one or more passive circuit components on the first surface of the substrate by:

patterning a metal layer formed on the first surface of the substrate;

forming an insulating layer on the patterned metal layer and on exposed surfaces of the first surface of the substrate; and

forming the one or more passive circuit components in the insulating layer at the patterned metal layer.

8. The method of claim 1 , comprising mounting the one or more IC dies on the second surface of the substrate using one or more solder balls at the one or more metal-filled vias.

9. A method comprising:

forming one or more openings in a substrate by mechanical punching, laser drilling, or chemical etching;

forming a conformal dielectric layer on all exposed surfaces of the substrate;

filling the one or more openings with solder, tungsten (W), copper (Cu), titanium (Ti), silver (Ag) or other metal-based paste, to form one or more metal filled vias;

forming a patterned metal layer on the conformal dielectric layer on one side of the substrate;

forming an insulating layer on the one side of the substrate over the patterned metal layer;

integrating one or more passive circuit components in the insulating layer on the patterned metal layer;

forming one or more solder balls on another side of the substrate at the one or more metal-filled vias; and

mounting one or more integrated circuit (IC) dies on the one or more solder balls,

wherein the one side and the another side correspond to opposite surfaces of the substrate, and

wherein the substrate is formed by depositing alumina or other dielectric that has low permeability to oxygen and moisture on a paper substrate by atomic layer deposition (ALD).

10. The method of claim 9 , comprising forming the substrate from a carbon-based material different from silicon (Si) and FR4 and having a coefficient of thermal expansion (CTE) matched to that of Si.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded May 12, 2021
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 056987/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2020
From: GLOBALFOUNDRIES INC.
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 054633/0001 →
SECURITY AGREEMENT Recorded Nov 29, 2018
From: GLOBALFOUNDRIES INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 049490/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2014
From: CHADDA, SAKET; ALAPATI, RAMAKANTH; BEECE, ADAM
To: GLOBALFOUNDRIES INC.
Reel/Frame 033632/0034 →
Continuity (1)
Related Publication 20160064354A1 · Mar 3, 2016