Electronic device having a pin for setting its mode of operation and method to set a mode of operation for an electronic device having a pin
An electronic device having a pin for setting its mode of operation, wherein the pin is connected or connectable to a first connection of a resistor, wherein the electronic device is arranged to detect a location of the resistor, wherein the electronic device is arranged to detect a size of the resistor, wherein the electronic device is arranged to determine a first setting based on the location of the resistor, and wherein the electronic device is arranged to determine a second setting based on the size of the resistor.
1. An electronic device having a pin for setting its mode of operation, the electronic device comprising:
a push-pull stage including a first transistor having a first current electrode coupled to the pin and a second current electrode coupled to a first reference voltage and a second transistor having a first current electrode coupled to the pin and a second current electrode coupled to a second reference voltage, the push-pull stage configured to adjust a voltage provided at the pin;
a first current mirror including a third transistor, a control electrode of the third transistor coupled to a control electrode of the first transistor, the first current mirror to clone a current conducted at the first transistor; and
a second current mirror including a fourth transistor, a control electrode of the fourth transistor coupled to a control electrode of the second transistor, the second current mirror to clone a current conducted at the second transistor,
wherein the pin is connected to a first terminal of a resistor,
wherein the electronic device is arranged to detect a location of the resistor, the location identifying connectivity of a second terminal of the resistor,
wherein the electronic device is arranged to detect a size of the resistor based on a current provided by the first current mirror and a current provided by the second current mirror,
wherein the electronic device is arranged to determine a first setting based on the location of the resistor, and
wherein the electronic device is arranged to determine a second setting based on the size of the resistor.
2. The electronic device as claimed in claim 1 ,
wherein the electronic device is arranged to detect the location of the resistor based on a sensed first internal current and a sensed second internal current,
wherein the sensed first internal current flows between a voltage supply pin of the electronic device and the pin, and wherein the sensed second internal current flows concurrent with the first internal current between the pin and a ground pin of the electronic device.
3. The electronic device as claimed in claim 2 , wherein the electronic device is arranged to generate a first signal for the first setting based on a sign of a difference between the sensed first internal current and the sensed second internal current.
4. The electronic device as claimed in claim 2 , wherein the electronic device is arranged to generate a second signal for the second setting based on an absolute value of a difference between the sensed first internal current and the sensed second internal current.
5. The electronic device as claimed in claim 4 , wherein the electronic device is arranged to detect the absolute value of the difference between the sensed first internal current and the sensed second internal current In by a comparison with at least one reference current source.
6. The electronic device as claimed in claim 1 , wherein the first setting is related to a debug mode.
7. The electronic device as claimed in claim 1 , wherein the second setting is related to a hardware configuration.
8. A method to set a mode of operation for an electronic device having a pin connected to a first terminal of a resistor, the method comprising:
generating a first current conducted between a first current electrode and a second current electrode of a first transistor of a push pull circuit, the first current electrode coupled to the pin and a second current electrode coupled to a first reference voltage;
generating a second current conducted between a first current electrode and a second current electrode of a second transistor of the push pull circuit, the second transistor having a first current electrode coupled to the pin and a second current electrode coupled to a second reference voltage, the push-pull stage configured to adjust a voltage provided at the pin;
cloning the first current at a first current mirror, the first current mirror including a third transistor, a control electrode of the third transistor coupled to a control electrode of the first transistor; and
cloning the second current at a second current mirror, the second current mirror including a fourth transistor, a control electrode of the fourth transistor coupled to a control electrode of the second transistor;
wherein the electronic device detects a location of the resistor, the location identifying connectivity of a second terminal of the resistor,
wherein the electronic device detects a size of the resistor based on the cloned first current and the cloned second current,
wherein the electronic device determines a first setting based on the location of the resistor, and
wherein the electronic device determines a second setting based on the size of the resistor.
9. The method as claimed in claim 8 ,
wherein the electronic device detects the location of the resistor based on a sensed first internal current and a sensed second internal current,
wherein the sensed first internal current flows between a voltage supply pin and the pin, and wherein the sensed second internal current flows between the pin and a ground pin.
10. The method as claimed in claim 9 , wherein the electronic device generates a first signal for the first setting based on the sign of a difference between the sensed first internal current and the sensed second internal current.
11. The method as claimed in claim 9 , wherein the electronic device generates a second signal for the second setting based on an absolute value of a difference between the sensed first internal current and the sensed second internal current.
12. The method as claimed in claim 11 , wherein the electronic device detects the absolute value of the difference between the sensed first internal current and the sensed second internal current by a comparison with at least one reference current source.
13. The method as claimed in claim 8 , wherein the first setting is related to a debug mode.
14. The method according to claim 8 , wherein the second setting is related to a hardware configuration.
15. An electronic device having a pin for setting its mode of operation, the electronic device comprising:
wherein the pin is connected to a first terminal of a resistor,
wherein the electronic device is arranged to detect a location of the resistor, the location identifying connectivity of a second terminal of the resistor,
wherein the electronic device is arranged to detect a size of the resistor,
wherein the electronic device is arranged to determine a first setting based on the location of the resistor,
wherein the electronic device is arranged to determine a second setting based on the size of the resistor,
wherein the electronic device is arranged to detect the location of the resistor based on a sensed first internal current and a sensed second internal current,
wherein the sensed first internal current flows between a voltage supply pin of the electronic device and the pin, and wherein the sensed second internal current flows concurrent with the first internal current between the pin and a ground pin of the electronic device.
16. The electronic device as claimed in claim 15 , wherein the electronic device is arranged to generate a first signal for the first setting based on a sign of a difference between the sensed first internal current and the sensed second internal current.
17. The electronic device as claimed in claim 15 , wherein the electronic device is arranged to generate a second signal for the second setting based on an absolute value of a difference between the sensed first internal current and the sensed second internal current.
18. The electronic device as claimed in claim 17 , wherein the electronic device is arranged to detect the absolute value of the difference between the sensed first internal current and the sensed second internal current In by a comparison with at least one reference current source.
19. The electronic device as claimed in claim 15 , wherein the first setting is related to a debug mode.
20. The electronic device as claimed in claim 1 , wherein the second setting is related to a hardware configuration.