Apparatuses and methods of reading memory cells based on response to a test pulse

1. A method of reading a memory device, comprising:

selecting a memory cell from a plurality of memory cells, the memory cell capable of storing a first logic state associated with a first threshold voltage within a first range of threshold voltages and capable of storing a second logic state associated with a second threshold voltage within a second range of threshold voltages, the first range of threshold voltages overlapping with the second range of threshold voltages within a predetermined read voltage window;

determining that an initial logic state of the selected memory cell has an initial threshold voltage within the predetermined read voltage window;

applying a test pulse to the selected memory cell; and

determining that the initial logic state of the selected memory cell corresponds to the first logic state or the second logic state based at least in part on a response to the applied test pulse.

2. The method of claim 1 , wherein determining that the initial logic state of the selected memory cell has an initial threshold voltage within the predetermined read voltage window comprises:

applying a first read pulse having a voltage at a lower bound of the predetermined read voltage window to the selected memory cell; and

determining whether a threshold event relating to the selected memory cell occurred based at least in part on the first read pulse.

3. The method of claim 2 , wherein determining that the initial logic state of the selected memory cell has an initial threshold voltage within the predetermined read voltage window comprises:

applying a second read pulse having a voltage at an upper bound of the predetermined read voltage window to the selected memory cell, wherein the second read pulse is applied based at least in part on determining whether the threshold event relating to the selected memory cell occurred; and

determining whether another threshold event relating to the selected memory cell occurred based at least in part on the second read pulse.

4. The method of claim 2 , wherein determining whether the threshold event relating to the selected memory cell occurred comprises:

identifying a change in a relationship of a current of the first read pulse relative to the voltage of the first read pulse.

5. The method of claim 1 , wherein applying the test pulse to the selected memory cell comprises:

applying a write pulse to the selected memory cell.

6. An apparatus comprising:

memory cells each capable of storing a first logic state corresponding to a first threshold voltage associated with a first range of threshold voltages and capable of storing a second logic state corresponding to a second threshold voltage associated with a second range of threshold voltages, the first range of threshold voltages overlapping with the second range of threshold voltages within a read voltage range; and

a memory controller comprising instructions configured to:

select a memory cell;

determine that the first logic state of the selected memory cell has an initial threshold voltage within the read voltage range;

apply a test pulse to the selected memory cell;

determine the first logic state of the selected memory cell based at least in part on a response to the applied test pulse; and

initiate an operation based at least in part on the determination of the first logic state.

7. The apparatus of claim 6 , wherein the instructions configured to determine the first logic state of the selected memory cell comprise instructions to:

apply a first read pulse having a voltage at a first value of the read voltage range to the selected memory cell; and

determine whether a threshold event relating to the selected memory cell occurred after the first read pulse.

8. The apparatus of claim 7 , wherein the instructions configured to determine whether the threshold event relating to the selected memory cell occurred after the first read pulse comprises instructions to:

identify a change between a current and a voltage applied to the selected memory cell based at least in part on the first read pulse.

9. The apparatus of claim 7 , wherein the instructions configured to determine the first logic state of the selected memory cell comprise instructions to:

apply a second read pulse having a voltage at a second value of the read voltage range to the selected memory cell based at least in part on determining whether the threshold event relating to the selected memory cell occurred after the first read pulse; and

determine whether a second threshold event relating to the selected memory cell occurred after the second read pulse.

10. The apparatus of claim 9 , wherein the instructions configured to determine the first logic state of the selected memory cell comprise instructions to:

apply a third read pulse to the memory cell, the third read pulse having a lower value or a higher value that is greater than the lower value; and

determine whether a third threshold event occurred after the third read pulse.

11. The apparatus of claim 6 , wherein the memory controller further comprises instructions to:

determine whether the selected memory cell comprises a modified logic state different from the first logic state after the test pulse.

12. The apparatus of claim 11 , wherein the memory controller further comprises instructions to:

apply a write pulse to the selected memory cell based at least in part on determining whether the selected memory cell has the modified logic state.