IP Library › Granted Patent US 10,151,027
Granted Patent B2
US 10,151,027 · App. 15/447,065 · Granted Dec 11, 2018

Plasma-enhanced chemical vapor deposition methods for graphene deposition

Inventors: Sunny Chugh (West Lafayette, IN); Ruchit Mehta (Hillsboro, OR); Zhihong Chen (West Lafayette, IN)
Assignee: Purdue Research Foundation
C23C16/26C01B32/182C01B32/184C01B32/186C23C16/0227C23C16/505H01J37/32082H01L21/0237H01L21/0242H01L21/0262H01L21/02378H01L21/02381H01L21/02395H01L21/02433H01L21/02527H01L29/1608
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Quick Facts
Patent No.
US 10,151,027
App. No.
15/447,065
Granted
Dec 11, 2018
Kind
B2
Abstract

A graphene deposition process. The process includes the steps of placing a substrate into a deposition chamber and heating the chamber, generating radio frequency plasma at a location proximate to the substrate while flowing a precursor gas containing carbon through the plasma and over the substrate.

Claims (19)

1. A graphene deposition process, comprising:

placing a substrate suitable to be heated only up to about 200° C. into a deposition chamber;

heating the chamber up to about 200° C.; and

generating radio frequency plasma at a location proximate to the substrate while flowing a precursor gas containing carbon through the plasma and over the substrate,

wherein the precursor gas is flown through the plasma and over the substrate for a predetermined period of time, ranging between about 1 to about 30 minutes,

wherein the precursor gas is flown over the substrate at a partial pressure of about 1 mTorr,

wherein the precursor gas is flown over the substrate at a flow rate of about 6 sccm, and

wherein the precursor gas is selected from the group consisting of CH 4 , C 2 H 2 , C 2 H 4 , and C 2 H 6 .

2. The process of claim 1 , the substrate is a metal selected from the group consisting of Copper, Aluminum, Nickel, Titanium, Titanium Nitride, Cobalt, Ruthenium, Platinum, Iridium, and Silver.

3. The process of claim 1 , the substrate is an insulator selected from the group consisting of SiO 2 , Sapphire, MgO, and Quartz.

4. The process of claim 1 , the substrate is a semiconductor selected from the group consisting of Silicon, Silicon Carbide, and GaAs.

5. The process of claim 1 , prior to placing the substrate into the deposition chamber, comprising: washing the substrate with i) solvents; or ii) an etching solution.

6. The process of claim 5 , the solvent is selected from the group consisting of Toluene, Acetone, Methanol and Isopropyl alcohol; and the etching solution is piranha etch.

7. The process of claim 1 , the radio frequency plasma is generated at about 13.56 MHz.

8. The process of claim 1 , the plasma is generated upstream from the substrate.

9. The process of claim 1 , the plasma is generated adjacent to the substrate.

10. The process of claim 1 , the predetermined period of time is between about 1 to about 15 minutes, when the substrate is copper.

11. The process of claim 1 , the predetermined period of time is between about 5 to about 15 minutes, when the substrate is Quartz.

12. The process of claim 1 , the predetermined period of time is between about 10 to about 15 minutes, when the substrate is SiO 2 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2018
From: CHEN, ZHIHONG; CHUGH, SUNNY; MEHTA, RUCHIT
To: PURDUE RESEARCH FOUNDATION
Reel/Frame 047252/0278 →
Continuity (2)
Provisional Application 62302361 · Mar 2, 2016
Related Publication 20170253962A1 · Sep 7, 2017
Cited By (1)
US 12,421,598