IP Library Granted Patent US 10,170,632
Granted Patent B2
US 10,170,632 · App. 15/443,096 · Granted Jan 1, 2019

Semiconductor device including oxide semiconductor layer

Inventors: Hidekazu Miyairi (Isehara, JP); Takeshi Osada (Isehara, JP); Shunpei Yamazaki (Setagaya, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L29/7869H01L21/02565H01L21/477H01L21/47635H01L27/1225H01L27/1251H01L27/1259H01L29/24H01L29/41733H01L29/42356H01L29/42384H01L29/45H01L29/66969H01L29/78621H01L29/78645H01L29/78648
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Quick Facts
Patent No.
US 10,170,632
App. No.
15/443,096
Granted
Jan 1, 2019
Kind
B2
Abstract

As a display device has a higher definition, the number of pixels, gate lines, and signal lines are increased. When the number of the gate lines and the signal lines are increased, a problem of higher manufacturing cost, because it is difficult to mount an IC chip including a driver circuit for driving of the gate and signal lines by bonding or the like. A pixel portion and a driver circuit for driving the pixel portion are provided over the same substrate, and at least part of the driver circuit includes a thin film transistor using an oxide semiconductor interposed between gate electrodes provided above and below the oxide semiconductor. Therefore, when the pixel portion and the driver portion are provided over the same substrate, manufacturing cost can be reduced.

Claims (24)

1. A semiconductor device comprising:

a first transistor including a first oxide semiconductor layer; and

a second transistor including a second oxide semiconductor layer,

wherein the second transistor includes a first gate electrode below the second oxide semiconductor layer and a second gate electrode above the second oxide semiconductor layer,

wherein the second oxide semiconductor layer includes a first region and a second region,

wherein the second region overlaps with a source or a drain electrode of the second transistor,

wherein a thickness of the first region is smaller than a thickness of the second region, and

wherein the first transistor is electrically connected to a pixel electrode, and the pixel electrode is formed using the same material as the second gate electrode.

2. The semiconductor device according to claim 1 , wherein the second oxide semiconductor layer overlaps with the first gate electrode with a first insulating layer therebetween and overlaps with the second gate electrode with a second insulating layer therebetween, and the second insulating layer is in contact with the first region.

3. The semiconductor device according to claim 1 , wherein the first oxide semiconductor layer and the second oxide semiconductor layer include at least one selected from the group consisting of indium, gallium, and zinc.

4. The semiconductor device according to claim 1 , wherein the first gate electrode and the second gate electrode have the same potential.

5. The semiconductor device according to claim 1 , wherein the first gate electrode and the second gate electrode have different potentials.

6. A semiconductor device comprising:

a first transistor including a first oxide semiconductor layer; and

a second transistor including a second oxide semiconductor layer,

wherein the second transistor includes a first gate electrode below the second oxide semiconductor layer and a second gate electrode above the second oxide semiconductor layer,

wherein the second oxide semiconductor layer includes a first region and a second region,

wherein the second region overlaps with a source or a drain electrode of the second transistor,

wherein a thickness of the first region is smaller than a thickness of the second region, and

wherein the first transistor is electrically connected to a pixel electrode, and the pixel electrode is formed using a different material from the second gate electrode.

7. The semiconductor device according to claim 6 , wherein the second oxide semiconductor layer overlaps with the first gate electrode with a first insulating layer therebetween and overlaps with the second gate electrode with a second insulating layer therebetween, and the second insulating layer is in contact with the first region.

8. The semiconductor device according to claim 6 , wherein the first oxide semiconductor layer and the second oxide semiconductor layer include at least one selected from the group consisting of indium, gallium, and zinc.

9. The semiconductor device according to claim 6 , wherein the first gate electrode and the second gate electrode have the same potential.

10. The semiconductor device according to claim 6 , wherein the first gate electrode and the second gate electrode have different potentials.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2018
From: MIYAIRI, HIDEKAZU; OSADA, TAKESHI; YAMAZAKI, SHUNPEI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 047818/0226 →
Priority Claims (1)
JP 2008-274540 · Oct 24, 2008 · national
Continuity (5)
Continuation 15071674 · Mar 16, 2016
Continuation 14694212 · Apr 23, 2015
Continuation 13302222 · Nov 22, 2011
Continuation 12581918 · Oct 20, 2009
Related Publication 20170170328A1 · Jun 15, 2017
Cited By (4)
US 12,190,842 US 12,211,569 US 12,431,207 US 12,477,781