IP Library › Granted Patent US 10,332,610
Granted Patent B2
US 10,332,610 · App. 15/807,119 · Granted Jun 25, 2019

Liquid crystal display device and electronic device including the same

Inventor: Atsushi Umezaki (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
G11C19/28G02F1/13454G02F1/136286G09G3/3677H01L23/528H01L29/786G02F2001/13606G02F2201/124G09G3/3688G09G2300/0408G09G2300/0417G09G2310/0286H01L27/1214H01L29/7869H01L2924/0002
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Quick Facts
Patent No.
US 10,332,610
App. No.
15/807,119
Granted
Jun 25, 2019
Kind
B2
Abstract

A driver circuit includes first to third transistors, a first circuit, and a second circuit. In the first transistor, a first terminal is electrically connected to a second wiring, a second terminal is electrically connected to a first wiring, and a gate is electrically connected to the second circuit and a first terminal of the third transistor. In the second transistor, a first terminal is electrically connected to the first wiring, a second terminal is electrically connected to a sixth wiring, a gate is electrically connected to the first circuit and a gate of the third transistor. A second terminal of the third transistor is electrically connected to the sixth wiring. The first circuit is electrically connected to a third wiring, a fourth wiring, a fifth wiring, and the sixth wiring. The second circuit is electrically connected to the first wiring, the second wiring, and the sixth wiring.

Claims (35)

1. A semiconductor device comprising:

a driver circuit comprising:

a first transistor;

a second transistor;

a third transistor; and

a fourth transistor,

wherein one of a source electrode and a drain electrode of the first transistor, one of a source electrode and a drain electrode of the fourth transistor, and a first gate line are electrically connected to each other,

wherein a gate electrode of the first transistor, one of a source electrode and a drain electrode of the second transistor, and one of a source electrode and a drain electrode of the third transistor are electrically connected to each other,

wherein the other of the source electrode and the drain electrode of the second transistor, a gate electrode of the second transistor, and a second gate line are electrically connected to each other,

wherein a gate electrode of the third transistor and a gate electrode of the fourth transistor are electrically connected to each other,

wherein the other of the source electrode and the drain electrode of the third transistor is electrically connected to a power supply line,

wherein the other of the source electrode and the drain electrode of the fourth transistor is electrically connected to the power supply line,

wherein, in the first transistor, an area where the one of the source electrode and the drain electrode overlaps with the gate electrode is larger than an area where the other of the source electrode and the drain electrode overlaps with the gate electrode,

wherein, in the second transistor, an area where the one of the source electrode and the drain electrode overlaps with the gate electrode is smaller than an area where the other of the source electrode and the drain electrode overlaps with the gate electrode,

wherein, in the third transistor, an area where the one of the source electrode and the drain electrode overlaps with the gate electrode is smaller than an area where the other of the source electrode and the drain electrode overlaps with the gate electrode, and

wherein a channel width of the third transistor is larger than a channel width of the fourth transistor.

2. A semiconductor device comprising:

a driver circuit comprising:

a first transistor;

a second transistor;

a third transistor; and

a fourth transistor,

wherein one of a source electrode and a drain electrode of the first transistor, one of a source electrode and a drain electrode of the fourth transistor, and a first gate line are electrically connected to each other,

wherein a gate electrode of the first transistor, one of a source electrode and a drain electrode of the second transistor, and one of a source electrode and a drain electrode of the third transistor are electrically connected to each other,

wherein the other of the source electrode and the drain electrode of the second transistor, a gate electrode of the second transistor, and a second gate line are electrically connected to each other,

wherein a gate electrode of the third transistor and a gate electrode of the fourth transistor are electrically connected to each other,

wherein the other of the source electrode and the drain electrode of the first transistor is electrically connected to a clock signal line,

wherein the other of the source electrode and the drain electrode of the third transistor is electrically connected to a power supply line,

wherein the other of the source electrode and the drain electrode of the fourth transistor is electrically connected to the power supply line,

wherein, in the first transistor, an area where the one of the source electrode and the drain electrode overlaps with the gate electrode is larger than an area where the other of the source electrode and the drain electrode overlaps with the gate electrode,

wherein, in the second transistor, an area where the one of the source electrode and the drain electrode overlaps with the gate electrode is smaller than an area where the other of the source electrode and the drain electrode overlaps with the gate electrode,

wherein, in the third transistor, an area where the one of the source electrode and the drain electrode overlaps with the gate electrode is smaller than an area where the other of the source electrode and the drain electrode overlaps with the gate electrode,

wherein a channel width of the third transistor is larger than a channel width of the fourth transistor,

wherein a channel width of the first transistor is larger than a channel width of the second transistor, larger than the channel width of the third transistor, and larger than the channel width of the fourth transistor, and

wherein an area of a semiconductor layer of the first transistor is larger than an area of a semiconductor layer of the second transistor, larger than an area of a semiconductor layer of the third transistor, and larger than an area of a semiconductor layer of the fourth transistor.

Priority Claims (1)
JP 2009-007419 · Jan 16, 2009 · national
Continuity (4)
Continuation 14285819 · May 23, 2014
Continuation 13742662 · Jan 16, 2013
Continuation 12685439 · Jan 11, 2010
Related Publication 20180075924A1 · Mar 15, 2018
Cited By (1)
US 12,744,016