Cantilever microprobes for contacting electronic components
Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments are directed to methods for fabricating such probe or cantilever structures. In some embodiments, for example, cantilever probes have extended base structures, slide in mounting structures, multi-beam configurations, offset bonding locations to allow closer positioning of adjacent probes, compliant elements with tensional configurations, improved over travel, improved compliance, improved scrubbing capability, and/or the like.
1. A compliant probe for making contact with an electronic circuit element, the probe comprising:
a post element having a proximal end;
a cantilever portion comprising a solid section and at least three beam elements, the solid section having a proximal end connected to the post element and having a distal end, and each of the at least three beam elements having a proximal end and a distal end,
wherein the proximal end of each of the at least three beam elements joins the solid section and the distal end of each of the at least three beam elements joins to a connection element; and
a contact portion functionally connected to the connection element,
wherein the at least three beam elements are spaced by gaps and are laterally extending, and
wherein the solid section has a thickness in a direction substantially perpendicular to a lateral extent of at least two beam elements that is at least as thick as a thickness of two consecutive beam elements and a gap between at least two of the at least three beam elements,
wherein the at least three beam elements comprise first, second, and third beam elements and wherein a portion of the solid section connecting the first and second beam elements has a first length while a portion of the solid section connecting the second and third beam elements has a second length, wherein the first and second lengths are different.
2. The compliant probe of claim 1 wherein the solid section has a first thickness and wherein each of the at least three beam elements has a thickness, wherein the first thickness is greater than the thickness of any of the at least three beam elements.
3. The compliant probe of claim 1 wherein at least one of the at least three beam elements comprises a first length and another of the at least three beam elements comprises a second length, wherein the first and second lengths are different.
4. The compliant probe of claim 1 wherein the contact portion comprises a first material and wherein the cantilever portion comprises a second material, wherein the first and second materials are different.
5. The compliant probe of claim 1 further comprising an elongated base element connecting to the proximal end of the post element and extending at least partway under the cantilever portion.
6. The compliant probe of claim 5 wherein the elongated base extends more than at least 75% of a length from the post element to the contact portion.
7. The compliant probe of claim 6 wherein the elongated base extends beyond the lateral extent of the contact portion.
8. The compliant probe of claim 1 wherein the post element and the cantilever portion comprise a plurality of adhered planar layers of metal.
9. The compliant probe of claim 8 wherein the cantilever portion provides for elastic compression in a plane of primary motion when making contact with an electronic circuit element and wherein planes of the adhered planar layers are parallel to the plane of primary motion.
10. The compliant probe of claim 8 wherein the cantilever portion provides for elastic compression in a plane of primary motion when making contact with an electronic circuit element and wherein planes of the adhered planar layers are perpendicular to the plane of primary motion.