Probes with planar unbiased spring elements for electronic component contact, methods for making such probes, and methods for using such probes
Probes for contacting electronic components include compliant modules stacked in a serial configuration, which are supported by a sheath, exoskeleton, or endoskeleton which allows for linear longitudinal compression of probe ends toward one another wherein the compliant elements within the compliant modules include planar springs (when unbiased). Alternatively, probes may be formed from single modules or back-to-back modules that may share a common base/standoff. Modules may allow for lateral and/or longitudinal alignment relative to array structures or other modules. Planar springs may be spirals, interlaced spirals having common or offset longitudinal levels, with similar or different rotational orientations that are functionally joined, and planar springs may transition into multiple thinner planar spring elements along their length. Compression of probe tips toward one another may cause portions of spring elements to move closer together or further apart.
1. A probe for making contact between two electronic circuit elements, comprising:
(a) at least one compliant structure, comprising:
(i) at least one standoff structure having a first end and a second end that are longitudinally separated;
(ii) at least one first compliant element comprising a two-dimensional substantially planar spring when not biased, wherein the first compliant element provides compliance in a direction substantially perpendicular to a planar configuration, wherein a first portion of the first compliant element functionally joins first standoffs of the at least one standoff structure and a second portion of the first compliant element functionally joins a first tip arm that can elastically move relative to the first standoffs of the at least one standoff structure, wherein the first tip arm directly or indirectly holds a first tip end that extends longitudinally beyond the first end of the first standoffs of the at least one standoff structure when the first compliant element is not biased;
(iii) at least one second compliant element comprising a spring, wherein the second compliant element provides compliance in a direction substantially perpendicular to the planar configuration, wherein a first portion of the second compliant element functionally joins second standoffs of the at least one standoff structure and a second portion of the second compliant element functionally joins a second tip arm that can elastically move relative to the second standoffs of the at least one standoff structure, wherein the second tip arm directly or indirectly holds a second tip end that extends longitudinally beyond the second end of the second standoffs of the at least one standoff structure when the second compliant element is not biased; and
(iv) an annular base which supports the second standoffs and is connected to first intermediate portions of the first standoffs separating the first and second compliant elements;
wherein the first compliant element comprises a plurality of N laterally separated first planar cantilever elements starting from at least two laterally separated, longitudinally co-planar locations on the first standoffs and ending in the first tip arm that directly or indirectly joins the laterally separated first planar cantilever structures;
wherein the second compliant element comprises a plurality of N laterally separated second planar cantilever elements starting from at least two laterally separated, longitudinally co-planar locations on the second standoffs and ending in the second tip arm that directly or indirectly joins the laterally separated second planar cantilever elements; and
wherein each of the first and second compliant elements starts an inward path from opposing pairs of first and second standoffs as thick longitudinally continuous co-planar pairs of laterally interlaced spiral cantilevers and ending their inward progress at the first and second tip arms as a plurality of longitudinally separated planar spring cantilevers elements.
2. The probe of claim 1 wherein the first portion of the first compliant element is located closer to the first end of the first standoffs of the at least one standoff structure than is the first portion of the second compliant element and the first portion of the second compliant element is located closer to the second end of the second standoffs of the at least one standoff structure than is the first portion of the first compliant element.
3. The probe of claim 2 wherein the spring of the second compliant element has a two-dimensional substantially planar configuration, when not biased, that is substantially parallel to the planar configuration of the planar spring of the first compliant element.
4. The probe of claim 1 wherein the first compliant element comprises at least two co-planar cantilever springs at a same longitudinal height that are laterally interleaved with one another and are attached to the first tip arm and with each being attached to laterally displaced locations on the at least one standoff.
5. The probe of claim 4 wherein the laterally displaced locations are located on two laterally separated portions of the at least one standoff that are in turn functionally and rigidly connected to one another via at least one laterally extending bridge element.
6. The probe of claim 5 wherein at least one bridge functions as at least a portion of the at least one standoff as it provides at least a portion of a longitudinal separation between the first and second compliant elements and wherein the at least one first compliant element comprises at least one first planar spiral that extends, at least in part, from the at least one standoff to the first tip arm.
7. The probe of claim 6 wherein the at least one first planar spiral has a configuration selected from the group consisting of: (i) an inward rotating circular spiral, (ii) an inward rotating rectangular spiral, (iii) an inward rotating hexagonal spiral, (iv) an inward rotating octagonal spiral, (v) an inward rotating counterclockwise spiral as observed looking from the first tip end toward the second tip end, and (vi) an inward rotating clockwise spiral as observed looking from the first tip end toward the second tip end.
8. The probe of claim 7 wherein at least one first planar spiral has a rotational extent selected from the group consisting of: (i) at least 180°, (ii) at least 360°, (iii) at least 540°, and (iv) at least 720°.
9. The probe of claim 8 wherein the at least one second compliant element comprises at least one second planar spiral that extends from the at least one standoff to the second tip arm.
10. The probe of claim 9 wherein the at least one second planar spiral of the second compliant element has a configuration selected from the group consisting of: (i) an inward rotating circular spiral, (ii) an inward rotating rectangular spiral, (iii) an inward rotating hexagonal spiral, (iv) an inward rotating octagonal spiral, (v) an inward rotating counterclockwise spiral as observed looking from the second tip end toward the first tip end, and (vi) an inward rotating clockwise spiral as observed looking from the second tip end toward the first tip end.
11. The probe of claim 10 wherein at least one second spiral of the second compliant element has a rotational extent selected from the group consisting of: (i) at least 180°, (ii) at least 360°, (iii) at least 540°, and (iv) at least 720°.
12. The probe of claim 11 wherein the base is located longitudinally between the first and second compliant elements and forms part of the at least one standoff wherein the base has at least some lateral extents that are larger than those of at least one of the first compliant element or the second compliant element.
13. The probe of claim 12 wherein the base has an annular configuration.
14. The probe of claim 13 wherein the planar spring of at least one of the at least one first compliant element has a first rotational orientation and the spring of at least one of the at least one second compliant element is planar and has a second rotational orientation wherein the first rotational orientation and second rotational orientation are selected from the group consisting of: (1) the same orientation, and (2) different orientations.
15. The probe of claim 14 wherein N is selected from the group consisting of at least 2, 3, 4, 5, 6, 7, and 8.
16. The probe of claim 15 wherein N is greater than 8.
17. The probe of claim 16 wherein the second compliant element starts from at least two laterally separated, longitudinally co-planar locations on the at least one standoff as at least two laterally separated second planar cantilever structures and ends in at least one first tip arm that, directly or indirectly, joins the laterally separated second planar cantilever structures and wherein the at least two laterally separated second planar cantilever structures each transition from an initial thicker single second planar cantilever structure to a plurality of P thinner longitudinally separated second planar cantilever structures prior to joining, directly or indirectly, the second tip arm.
18. The probe of claim 17 wherein P is selected from the group consisting of at least 2, 3, 4, 5, 6, 7, and 8.
19. The probe of claim 18 wherein P is greater than 8.
20. A probe for making contact between two electronic circuit elements, comprises:
(a) at least one first compliant structure comprising:
(i) a relatively rigid first base;
(ii) at least one first standoff connected to the first base; and
(iii) a first compliant element that comprises a two-dimensional substantially planar first spring when not biased and provides compliance in a direction substantially perpendicular to a plane of the first spring, wherein a first portion of the first compliant element functionally joins the first standoff and a second portion of the first compliant element functionally joins a first tip arm which in turn joins a first tip end that can compliantly move relative to the first base and wherein the first tip arm extends longitudinally away from the first base and beyond the first standoff when the first compliant element is not biased;
wherein the first compliant element starts from at least two laterally separated, longitudinally co-planar locations on the at least one first standoff as at least two laterally separated first planar cantilever structures and ends in at least one tip arm that directly or indirectly joins the laterally separated first planar cantilever structures and wherein the at least two laterally separated first planar cantilever structures each transition from an initial thicker single first planar cantilever structure to a plurality of N thinner longitudinally separated first planar cantilever structures prior to joining, directly or indirectly, the first tip arm.
21. The probe of claim 7 wherein the first planar cantilever elements of the first compliant element joining a first probe tip are spiral springs that have opposite or reverse rotational orientations relative to the second planar cantilever elements of the first compliant element joining a second probe tip, also being spiral springs.
22. The probe of claim 12 wherein the annular base is located at least partially around the second compliant element.
23. The probe of claim 22 wherein the annular base is located between two most upward second planar cantilever elements of the second compliant element.
24. The probe of claim 22 wherein the annular base surrounds and extends laterally beyond second intermediate portions of the second standoffs adjacent to the first intermediate portions of the first standoffs.
25. The probe of claim 24 wherein the annular base extends laterally beyond the first compliant element or the second compliant element.
26. The probe of claim 1 wherein a first number of laterally separated first planar cantilever elements and a second number of laterally separated second planar cantilever elements are selected: (i) as a same number; (ii) such that the first number of laterally separated first planar cantilever elements is greater than the second number of laterally separated second planar cantilever elements; or (iii) the first number of laterally separated first planar cantilever elements is lower that the second number of laterally separated second planar cantilever elements.
27. The probe of claim 1 wherein the annular base is a rigid annular base.