IP Library › Granted Patent US 10,518,387
Granted Patent B2
US 10,518,387 · App. 15/652,244 · Granted Dec 31, 2019

Grinding element, grinding wheel and manufacturing method of semiconductor package using the same

Inventors: Yi-Chao Mao (Taoyuan County, TW); Chin-Chuan Chang (Hsinchu County, TW); Jing-Cheng Lin (Hsinchu, TW); Wen-Hua Chang (Taoyuan, TW)
Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
B24D7/066B24D7/06H01L21/486H01L21/4853H01L21/4857H01L21/561H01L21/565H01L21/78H01L23/3114H01L23/5383H01L23/5384H01L23/5386H01L23/5389
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Quick Facts
Patent No.
US 10,518,387
App. No.
15/652,244
Granted
Dec 31, 2019
Kind
B2
Abstract

A grinding element mounted on a grinding wheel and a grinding wheel containing the same are provided for grinding. The grinding element includes a grinding tooth, and the grinding tooth includes a grinding material having a framework structure and pores distributed in the framework structure. The framework structure includes a bond material and abrasive particles that are bonded by the bond material. A pore size of the pores is larger than 40 microns but smaller than 70 microns. A manufacturing method for semiconductor packages using the same is also provided.

Claims (35)

1. A grinding element of a grinding wheel, comprising:

a grinding tooth including a grinding material having

a framework structure comprising abrasive particles and a bond material bonding the abrasive particles, wherein the bond material is a resin bond material, and

pores distributed in the framework structure,

wherein a pore size of the pores is greater than 40 microns and less than 70 microns, and the pores take about 55% volume per volume (% v/v) to about 70% v/v of a total volume of the grinding material.

2. The element according to claim 1 , wherein the pores take about 60% v/v of the total volume of the grinding material.

3. The element according to claim 1 , wherein a particle size of the abrasive particles ranges from about 1.5 microns to about 20 microns, and a weight ratio of the abrasive particles to the bond material ranges from 3:1 to 5:1.

4. The element according to claim 3 , wherein the particle size of the abrasive particles ranges from about 3 microns to about 20 microns, and the weight ratio of the abrasive particles to the bond material is about 4.5:1.

5. The element according to claim 1 , wherein the bond material includes a thermosetting resin binder.

6. The element according to claim 1 , wherein the abrasive particles include diamond particles, alumina particles, silicon carbide particles or cubic boron nitride particles.

7. The element according to claim 1 , wherein the pore size of the pores ranges from about 40 microns to about 60 microns, the abrasive particles are diamond particles having an average particle size ranging from about 3 microns to about 20 microns, and a weight ratio of the abrasive particles to the bond material is about 4.5:1.

8. A grinding wheel, comprising:

a ring shaped metal base; and

a plurality of grinding teeth mounted on a surface of the metal base,

wherein the plurality of grinding teeth is separate from one another by a distance and are arranged along an outer rim portion of the metal base,

wherein each of the plurality of grinding teeth includes a grinding material having a framework structure including abrasive particles and a bond material bonding the abrasive particle, and pores distributed in the framework structure, wherein the bond material is a resin bond material, and

wherein the pores take about 55% volume per volume (% v/v) to about 70% v/v of a total volume of the grinding material, a pore size of the pores is greater than 40 microns and less than 70 microns, and a weight ratio of the abrasive particles to the bond material ranges from 3:1 to 5:1.

9. The wheel according to claim 8 , wherein each of the plurality of grinding teeth is a block structure made of the grinding material.

10. The wheel according to claim 8 , wherein each of the plurality of grinding teeth is a rectangular block and at least an outermost portion of the block includes the grinding material.

11. The wheel according to claim 8 , wherein the bond material includes at least one material selected from phenol resins, synthetic rubber resins or urethane resins.

12. The wheel according to claim 8 , wherein the pores take about 60% v/v of the total volume of the grinding material.

13. The wheel according to claim 8 , wherein a particle size of the abrasive particles ranges from about 1.5 microns to about 20 microns.

14. The wheel according to claim 13 , wherein the particle size of the abrasive particles ranges from about 3 microns to about 20 microns, and the weight ratio of the abrasive particles to the bond material is about 4.5:1.

15. The wheel according to claim 8 , wherein the bond material includes a thermosetting resin binder, and the abrasive particles include diamond particles, alumina particles, silicon carbide particles or cubic boron nitride particles.

16. The wheel according to claim 8 , wherein a pore size of the pores ranges from about 40 microns to about 60 microns, the abrasive particles are diamond particles having an average particle size ranging from about 3 microns to about 20 microns, and a weight ratio of the abrasive particles to the bond material is about 4.5:1.

17. A manufacturing method for a semiconductor package, comprising:

providing a carrier;

forming through vias on the carrier and disposing chips on the carrier;

forming a molding compound encapsulating the chips and the through vias;

grinding the molding compound using a grinding wheel having grinding teeth including a grinding material, so as to expose the through vias;

forming a redistribution layer on the molding compound and on the chips, wherein the redistribution layer is electrically connected to the through vias and the chips; and

mounting conductive elements on the redistribution layer, wherein the conductive elements are electrically connected to the chips and the through vias, and

wherein the grinding material includes a framework structure including abrasive particles and a resin bond material bonding the abrasive particles, and pores distributed in the framework structure taking about 55% volume per volume (% v/v) to about 70% v/v of a total volume of the grinding material, and a pore size of the pores being larger than 40 microns and smaller than 70 microns.

18. The method according to claim 17 , wherein the grinding the molding compound comprises grinding the molding compound to expose metal posts of the chips.

19. The method according to claim 17 , wherein a pore size of the pores ranges from about 40 microns to about 60 microns, the abrasive particles are diamond particles having an average particle size ranging from about 3 microns to about 20 microns, and a weight ratio of the abrasive particles to the resin bond material ranges from 3:1 to 5:1.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 23, 2017
From: MAO, YI-CHAO; CHANG, CHIN-CHUAN; LIN, JING-CHENG; CHANG, WEN-HUA
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 043362/0296 →
Continuity (1)
Related Publication 20190022827A1 · Jan 24, 2019
Cited By (1)
US 12,592,502