IP Library Granted Patent US 10,553,618
Granted Patent B2
US 10,553,618 · App. 16/190,249 · Granted Feb 4, 2020

Display device

Inventor: Atsushi Umezaki (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/124G02F1/1368G02F1/133345G02F1/136286G09G3/3266G09G3/3677G11C19/28H01L27/105H01L27/12H01L27/1214H01L27/1222H01L27/1251H01L27/1255H01L29/78663H01L29/78678G02F1/13454G02F1/13624G02F1/134309G02F2202/103G09G3/3688G09G2300/0417G09G2300/0426G09G2320/043G09G2330/021G09G2330/023H01L27/13H01L27/3262H01L27/3276H01L29/42384H01L29/78696
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Quick Facts
Patent No.
US 10,553,618
App. No.
16/190,249
Granted
Feb 4, 2020
Kind
B2
Abstract

By applying an AC pulse to a gate of a transistor which easily deteriorates, a shift in threshold voltage of the transistor is suppressed. However, in a case where amorphous silicon is used for a semiconductor layer of a transistor, the occurrence of a shift in threshold voltage naturally becomes a problem for a transistor which constitutes a part of circuit that generates an AC pulse. A shift in threshold voltage of a transistor which easily deteriorates and a shift in threshold voltage of a turned-on transistor are suppressed by signal input to a gate electrode of the transistor which easily deteriorates through the turned-on transistor. In other words, a structure for applying an AC pulse to a gate electrode of a transistor which easily deteriorates through a transistor to a gate electrode of which a high potential (VDD) is applied, is included.

Claims (74)

1. A display device comprising:

a scan driver circuit comprising a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor and a sixth transistor,

wherein one of a source and a drain of the first transistor is electrically connected to a first wiring,

wherein the other of the source and the drain of the first transistor is electrically connected to a scan line,

wherein one of a source and a drain of the second transistor is electrically connected to a second wiring,

wherein the other of the source and the drain of the second transistor is electrically connected to the scan line,

wherein one of a source and a drain of the third transistor is electrically connected to a third wiring,

wherein the other of the source and the drain of the third transistor is electrically connected to a gate of the first transistor,

wherein a gate of the third transistor is electrically connected to a fourth wiring,

wherein one of a source and a drain of the fourth transistor is electrically connected to a fifth wiring,

wherein the other of the source and the drain of the fourth transistor is electrically connected to the gate of the first transistor,

wherein a gate of the fourth transistor is electrically connected to a sixth wiring,

wherein one of a source and a drain of the fifth transistor is electrically connected to a seventh wiring supplied with an alternating current pulse,

wherein the other of the source and the drain of the fifth transistor is electrically connected to a gate of the second transistor,

wherein one of a source and a drain of the sixth transistor is electrically connected to the fifth wiring,

wherein the other of the source and the drain of the sixth transistor is electrically connected to the gate of the second transistor, and

wherein a gate of the sixth transistor is electrically connected to the gate of the first transistor.

2. The display device according to claim 1 ,

wherein the second wiring is a wiring different from the fifth wiring.

3. A display device comprising:

a scan driver circuit comprising a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor and a sixth transistor,

wherein one of a source and a drain of the first transistor is electrically connected to a first wiring,

wherein the other of the source and the drain of the first transistor is electrically connected to a scan line,

wherein one of a source and a drain of the second transistor is electrically connected to a second wiring,

wherein the other of the source and the drain of the second transistor is electrically connected to the scan line,

wherein one of a source and a drain of the third transistor is electrically connected to a third wiring,

wherein the other of the source and the drain of the third transistor is electrically connected to a gate of the first transistor,

wherein a gate of the third transistor is electrically connected to a fourth wiring,

wherein one of a source and a drain of the fourth transistor is electrically connected to a fifth wiring,

wherein the other of the source and the drain of the fourth transistor is electrically connected to the gate of the first transistor,

wherein a gate of the fourth transistor is electrically connected to a sixth wiring,

wherein one of a source and a drain of the fifth transistor is electrically connected to a seventh wiring supplied with an alternating current pulse,

wherein the other of the source and the drain of the fifth transistor is electrically connected to a gate of the second transistor,

wherein one of a source and a drain of the sixth transistor is electrically connected to the fifth wiring,

wherein the other of the source and the drain of the sixth transistor is electrically connected to the gate of the second transistor,

wherein a gate of the sixth transistor is electrically connected to the gate of the first transistor,

wherein the first transistor is configured to control an electrical continuity between the first wiring and the scan line,

wherein the second transistor is configured to control an electrical continuity between the second wiring and the scan line,

wherein the third transistor is configured to control an electrical continuity between the third wiring and the gate of the first transistor in response to a signal input to the fourth wiring,

wherein the fourth transistor is configured to control an electrical continuity between the fifth wiring and the gate of the first transistor in response to a signal input to the sixth wiring,

wherein the fifth transistor is configured to control an electrical continuity between the seventh wiring and the gate of the second transistor, and

wherein the sixth transistor is configured to control an electrical continuity between the fifth wiring and the gate of the second transistor.

4. The display device according to claim 3 ,

wherein the second wiring is a wiring different from the fifth wiring.

5. A display device comprising:

a scan driver circuit comprising a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor and a sixth transistor,

wherein one of a source and a drain of the first transistor is electrically connected to a first wiring,

wherein the other of the source and the drain of the first transistor is electrically connected to a scan line,

wherein one of a source and a drain of the second transistor is electrically connected to a second wiring,

wherein the other of the source and the drain of the second transistor is electrically connected to the scan line,

wherein one of a source and a drain of the third transistor is electrically connected to a third wiring,

wherein the other of the source and the drain of the third transistor is electrically connected to a gate of the first transistor,

wherein a gate of the third transistor is electrically connected to a fourth wiring,

wherein one of a source and a drain of the fourth transistor is electrically connected to a fifth wiring,

wherein the other of the source and the drain of the fourth transistor is electrically connected to the gate of the first transistor,

wherein a gate of the fourth transistor is electrically connected to a sixth wiring,

wherein one of a source and a drain of the fifth transistor is electrically connected to a seventh wiring supplied with an alternating current pulse,

wherein the other of the source and the drain of the fifth transistor is electrically connected to a gate of the second transistor,

wherein one of a source and a drain of the sixth transistor is electrically connected to the fifth wiring,

wherein the other of the source and the drain of the sixth transistor is electrically connected to the gate of the second transistor,

wherein a gate of the sixth transistor is electrically connected to the gate of the first transistor,

wherein the first transistor is configured to control an electrical continuity between the first wiring and the scan line,

wherein the second transistor is configured to control an electrical continuity between the second wiring and the scan line,

wherein the third transistor is configured to control an electrical continuity between the third wiring and the gate of the first transistor in response to a signal input to the fourth wiring,

wherein the fourth transistor is configured to control an electrical continuity between the fifth wiring and the gate of the first transistor in response to a signal input to the sixth wiring,

wherein the fifth transistor is configured to control an electrical continuity between the seventh wiring and the gate of the second transistor,

wherein the sixth transistor is configured to control an electrical continuity between the fifth wiring and the gate of the second transistor,

wherein the first transistor is configured to supply a clock signal supplied to the first wiring to the scan line,

wherein the third transistor is configured to control a gate potential of the first transistor such that the first transistor is turned on,

wherein the fourth transistor is configured to control the gate potential of the first transistor such that the first transistor is turned off,

wherein the fifth transistor is configured to control a gate potential of the second transistor such that the second transistor is turned on, and

wherein the sixth transistor is configured to control the gate potential of the second transistor such that the second transistor is turned off.

6. The display device according to claim 5 ,

wherein the second wiring is a wiring different from the fifth wiring.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 14, 2018
From: UMEZAKI, ATSUSHI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 047501/0719 →
Priority Claims (1)
JP 2006-269689 · Sep 29, 2006 · national
Continuity (8)
Continuation 15899472 · Feb 20, 2018
Continuation 15427103 · Feb 8, 2017
Continuation 15000096 · Jan 19, 2016
Continuation 14072878 · Nov 6, 2013
Division 13117658 · May 27, 2011
Division 12694514 · Jan 27, 2010
Division 11863913 · Sep 28, 2007
Related Publication 20190157305A1 · May 23, 2019
Cited By (6)
US 12,190,842 US 12,211,569 US 12,361,906 US 12,406,605 US 12,581,741 US 12,614,534