IP Library › Granted Patent US 10,565,946
Granted Patent B2
US 10,565,946 · App. 15/824,343 · Granted Feb 18, 2020

Liquid crystal display device and electronic device including the liquid crystal display device

Inventors: Shunpei Yamazaki (Setagaya, JP); Ryo Arasawa (Isehara, JP); Jun Koyama (Sagamihara, JP); Masashi Tsubuku (Atsugi, JP); Kosei Noda (Atsugi, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
G09G3/3614G02F1/1368G02F1/13439G02F1/133553G09G3/3648G09G3/3677H01L21/02164H01L21/02266H01L21/02565H01L21/02631H01L21/467H01L21/477H01L27/1225H01L27/1255H01L29/24H01L29/42356H01L29/45H01L29/66969H01L29/7869H01L29/78648G02F2201/123G02F2202/10G09G2300/08G09G2310/0286G09G2310/08G09G2330/021
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Quick Facts
Patent No.
US 10,565,946
App. No.
15/824,343
Granted
Feb 18, 2020
Kind
B2
Abstract

In a liquid crystal display device including a plurality of pixels in a display portion and configured to performed display in a plurality of frame periods, each of the frame periods includes a writing period and a holding period, and after an image signal is input to each of the plurality of pixels in the writing period, a transistor included in each of the plurality of pixels is turned off and the image signal is held for at least 30 seconds in the holding period. The pixel includes a semiconductor layer including an oxide semiconductor layer, and the oxide semiconductor layer has a carrier concentration of less than 1×10 14 /cm 3 .

Claims (37)

1. A display device comprising:

a pixel portion comprising:

a transistor comprising a source, a drain and a channel formation region, the channel formation region comprising an oxide semiconductor;

a pixel electrode electrically connected to the source or the drain of the transistor; and

a liquid crystal material adjacent to the pixel electrode,

wherein the pixel portion does not include any capacitor line overlapping with the pixel electrode,

wherein the oxide semiconductor includes indium, gallium, and zinc,

wherein an off-state current per micrometer of a channel width of the channel formation region is 1×10 −17 A or less, and

wherein a specific resistance of the liquid crystal material measured at 20° C. is 1×10 12 Ω·cm or more.

2. The display device according to claim 1 , wherein the oxide semiconductor includes a microcrystalline portion with a grain diameter of 1 nm to 20 nm.

3. The display device according to claim 1 , wherein the specific resistance of the liquid crystal material measured at 20° C. is 1×10 14 Ω·cm or more.

4. A display device comprising:

a pixel portion comprising:

a transistor comprising a source, a drain and a channel formation region, the channel formation region comprising an oxide semiconductor;

a capacitor;

a pixel electrode electrically connected to the source or the drain of the transistor; and

a liquid crystal material adjacent to the pixel electrode,

wherein the pixel portion does not include any capacitor line overlapping with the pixel electrode,

wherein the oxide semiconductor includes indium, gallium, and zinc,

wherein the oxide semiconductor has a carrier concentration of less than 1×10 14 /cm 3 ,

wherein an off-state current per micrometer of a channel width of the channel formation region is 1×10 −17 A or less, and

wherein a specific resistance of the liquid crystal material measured at 20° C. is 1×10 12 Ω·cm or more.

5. The display device according to claim 4 , wherein the oxide semiconductor includes a microcrystalline portion with a grain diameter of 1 nm to 20 nm.

6. The display device according to claim 4 , wherein the specific resistance of the liquid crystal material measured at 20° C. is 1×10 14 Ω·cm or more.

7. The display device according to claim 4 , wherein the display device is driven by dot inversion driving.

8. A display device comprising:

a pixel comprising:

a transistor comprising a source, a drain and a channel formation region, the channel formation region comprising an oxide semiconductor;

a pixel electrode electrically connected to the source or the drain of the transistor; and

a liquid crystal material adjacent to the pixel electrode,

wherein the pixel does not include any storage capacitor,

wherein the oxide semiconductor includes indium, gallium, and zinc,

wherein an off-state current per micrometer of a channel width of the channel formation region is 1×10 −17 A or less, and

wherein a specific resistance of the liquid crystal material measured at 20° C. is 1×10 12 Ω·cm or more.

9. The display device according to claim 8 , wherein the oxide semiconductor includes a microcrystalline portion with a grain diameter of 1 nm to 20 nm.

10. The display device according to claim 8 , wherein the specific resistance of the liquid crystal material measured at 20° C. is 1×10 14 Ω·cm or more.

11. The display device according to claim 8 , wherein the display device is driven by dot inversion driving.

Priority Claims (2)
JP 2009-238869 · Oct 16, 2009 · national
JP 2009-279004 · Dec 8, 2009 · national
Continuity (5)
Continuation 15264014 · Sep 13, 2016
Continuation 15134937 · Apr 21, 2016
Continuation 14477172 · Sep 4, 2014
Continuation 12901023 · Oct 8, 2010
Related Publication 20180090086A1 · Mar 29, 2018