Semiconductor device and method for manufacturing the same
By using a conductive layer including Cu as a long lead wiring, increase in wiring resistance is suppressed. Further, the conductive layer including Cu is provided in such a manner that it does not overlap with the oxide semiconductor layer in which a channel region of a TFT is formed, and is surrounded by insulating layers including silicon nitride, whereby diffusion of Cu can be prevented; thus, a highly reliable semiconductor device can be manufactured. Specifically, a display device which is one embodiment of a semiconductor device can have high display quality and operate stably even when the size or definition thereof is increased.
1. A semiconductor device comprising:
a first conductive layer and a capacitor wiring over a substrate, wherein each of the first conductive layer and the capacitor wiring comprises copper;
a first insulating layer over the first conductive layer and the capacitor wiring, wherein the first insulating layer comprises nitrogen;
a second insulating layer over the first insulating layer, wherein the second insulating layer comprises oxygen;
a semiconductor layer over the second insulating layer;
a third insulating layer over the semiconductor layer, wherein the third insulating layer comprises an opening;
a second conductive layer over the second insulating layer, wherein the second conductive layer is electrically connected to the semiconductor layer through the opening, and wherein the second conductive layer comprises at least one selected from the group consisting of W, Ta, Mo, Ti and Cr;
a third conductive layer over the second conductive layer, wherein the third conductive layer is electrically connected to the semiconductor layer, and wherein the third conductive layer comprises copper;
a fourth insulating layer over the third conductive layer; and
a fourth conductive layer over the fourth insulating layer, wherein the fourth conductive layer is electrically connected to the semiconductor layer, wherein the fourth conductive layer comprises a transparent conductive material, and wherein the fourth conductive layer overlaps the capacitor wiring.
2. The semiconductor device according to claim 1 , wherein the first conductive layer further comprises at least one element selected from the group consisting of tungsten, tantalum, molybdenum, titanium, chromium, zirconium, and calcium.
3. The semiconductor device according to claim 1 , wherein the semiconductor layer comprises at least one of indium, gallium, and zinc.
4. The semiconductor device according to claim 1 , wherein the third conductive layer further comprises at least one element selected from the group consisting of tungsten, tantalum, molybdenum, titanium, chromium, zirconium, and calcium.
5. The semiconductor device according to claim 1 , wherein the first conductive layer is not overlapped with the semiconductor layer.
6. The semiconductor device according to claim 1 , wherein the semiconductor device is incorporated in one selected from the group consisting of electronic paper, an advertisement, an electronic book reader, a television set, a digital photo frame, a portable amusement machine, a slot machine, a portable computer, and a cellular phone.