IP Library › Granted Patent US 11,049,716
Granted Patent B2
US 11,049,716 · App. 16/194,102 · Granted Jun 29, 2021

Gap fill using carbon-based films

Inventors: Wei Tang (Fremont, CA); Jason Daejin Park (Lake Oswego, OR); Bart J. van Schravendijk (Palo Alto, CA); Shu Tsai Wang (Dublin, CA); Kaihan Abidi Ashtiani (Cupertino, CA)
Assignee: Lam Research Corporation
H01L21/02274C23C16/045C23C16/26C23C16/325H01L21/02115H01L21/02167H01L21/02211H01L21/76224H01L21/76837
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Quick Facts
Patent No.
US 11,049,716
App. No.
16/194,102
Granted
Jun 29, 2021
Kind
B2
Abstract

Provided herein are methods of filling gaps using high density plasma chemical vapor deposition (HDP CVD). According to various implementations, carbon-containing films such as amorphous carbon and amorphous carbide films are deposited by HDP CVD into gaps on substrates to fill the gaps. The methods may involve using high hydrogen-content process gasses during HDP CVD deposition to provide bottom-up fill. Also provided are related apparatus.

Claims (15)

1. A method comprising:

introducing a process gas to a high density plasma chemical vapor deposition (HDP CVD) chamber that houses a substrate having a gap, wherein the process gas includes a hydrocarbon reactant and has a H:C ratio of at least 4:1; and

filling the gap with an amorphous carbon (a-C) film by an HDP CVD reaction of the process gas.

2. The method of claim 1 , wherein the gap is filled in a single deposition operation with no intervening etch operations.

3. The method of claim 1 , wherein the hydrocarbon reactant has a H:C ratio of at least 3:1.

4. The method of claim 1 , wherein the hydrocarbon reactant has a H:C ratio of at least 4:1.

5. The method of claim 1 , wherein the process gas includes molecular hydrogen (H 2 ).

6. The method of claim 1 , further comprising generating a plasma including hydrogen radicals.

7. The method of claim 1 , wherein the filling the gap comprises a hydrogen radical etch at a top of the gap during the HDP CVD reaction.

8. The method of claim 1 , wherein filling the gap with an amorphous carbon film comprises two or more deposition stages and one or more intervening etch operations.

9. The method of claim 8 , wherein the one or more intervening etch operations are hydrogen-based etches.

10. The method of claim 9 , wherein transitioning from a deposition stage to an intervening etch operation comprises stopping flow of the hydrocarbon reactant to the HDP CVD chamber while maintaining flow of hydrogen (H 2 ) to the HDP CVD chamber.

11. The method of claim 1 , wherein the hydrocarbon reactant is selected from ethane and methane.

12. The method of claim 1 , wherein the hydrocarbon reactant is acetylene.

13. The method of claim 1 , wherein neutral species preferentially etch material deposited at a top of the gap with respect to material deposited at a bottom of the gap during gap fill.

Continuity (2)
Continuation 14692627 · Apr 21, 2015
Related Publication 20190181004A1 · Jun 13, 2019
Cited By (4)
US 12,272,547 US 12,300,488 US 12,334,332 US 12,359,311