Method of etching silicon-containing film, computer-readable storage medium, and apparatus for etching silicon-containing film
There is provided a method of etching a silicon-containing film formed on a substrate, the method including: etching the silicon-containing film by using both a first fluorine-containing gas and a second fluorine-containing gas, the first fluorine-containing gas including at least an F 2 gas and the second fluorine-containing gas including at least a ClF 3 gas, an IF 7 gas, an IF 5 gas or an SF 6 gas.
1. A method of etching a silicon-containing film formed on a substrate, the method comprising:
etching, without using a plasma, the silicon-containing film in an etching apparatus by supplying a first fluorine-containing gas and a second fluorine-containing gas by turns, the first fluorine-containing gas including at least an F 2 gas and the second fluorine-containing gas including at least a ClF 3 gas, an IF 7 gas, an IF 5 gas or an SF 6 gas,
wherein the first fluorine-containing gas is different from the second fluorine-containing gas, and
the first fluorine-containing gas and the second fluorine-containing gas are differ in reactivity with the silicon-containing film.
2. The method of claim 1 , wherein the supplying the first fluorine-containing gas and the second fluorine-containing gas by turns is performed in a repetitive manner.
3. A non-transitory computer-readable storage medium storing a program that operates on a computer of a controller for controlling an etching apparatus and that causes the computer to perform the etching method of claim 1 by the etching apparatus.
4. The method of claim 1 , the first fluorine-containing gas further includes a NH 3 gas.
5. The method of claim 2 , wherein an amount of etching is gradually reduced in each repetitive process of the supplying the first fluorine-containing gas and the second fluorine-containing gas by turns.