IP Library Granted Patent US 11,276,816
Granted Patent B2
US 11,276,816 · App. 16/489,838 · Granted Mar 15, 2022

Method of manufacturing magnetic tunnel junction and magnetic tunnel junction

Inventors: Yu Zhao (Tokyo, JP); Katsuya Miura (Tokyo, JP); Hirotaka Hamamura (Tokyo, JP); Masaki Yamada (Tokyo, JP); Kiyohiko Sato (Tokyo, JP)
Assignee: HITACHI HIGH-TECH CORPORATION
H01L43/12H01L21/3065H01L27/222H01L43/02H01L43/10
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Quick Facts
Patent No.
US 11,276,816
App. No.
16/489,838
Granted
Mar 15, 2022
Kind
B2
Abstract

Provided is a method of manufacturing a magnetic tunnel junction that simultaneously realizes removal of oxides on side walls of a magnetic layer and formation of a protective film and prevents deterioration of magnetic characteristics. The method includes: a first step 802 of etching a stacked film including a first magnetic layer, a MgO barrier layer, and a second magnetic layer stacked in order by plasma etching using an oxidizing gas to form the magnetic tunnel junction; and a second step 803 of simultaneously introducing an organic acid gas which is an n-valent acid and a precursor gas having a corresponding metal element valence of m, to form a first protective film on side walls of the magnetic tunnel junction. In the second step, the precursor gas is introduced at a molar ratio of n/m or more with respect to 1 mole of the organic acid gas introduced.

Claims (7)

1. A method of manufacturing a magnetic tunnel junction, comprising:

a first step of etching a stacked film including a first magnetic layer, a second magnetic layer, and a barrier layer disposed between the first magnetic layer and the second magnetic layer by plasma etching using an oxidizing gas to form the magnetic tunnel junction; and

a second step of introducing an organic acid gas which is an n-valent acid and a precursor gas whose valence of a corresponding metal element is m into a chamber for forming the magnetic tunnel junction, to form a first protective film on side walls of the magnetic tunnel junction after the first step, wherein

n and m are natural numbers, and

a molar ratio of the precursor gas to the organic acid gas is greater than or equal to n/m.

2. The method of manufacturing a magnetic tunnel junction according to claim 1 , further comprising:

a third step of forming, by a plasma CVD method, a second protective film on the magnetic tunnel junction on which the first protective film is formed.

Assignments (2)
CHANGE OF NAME Recorded Mar 25, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052225/0894 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 5, 2019
From: ZHAO, YU; MIURA, KATSUYA; HAMAMURA, HIROTAKA; YAMADA, MASAKI; SATO, KIYOHIKO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 050285/0486 →
Priority Claims (1)
JP JP2018-116619 · Jun 20, 2018 · national
Continuity (1)
Related Publication 20200006644A1 · Jan 2, 2020
Cited By (1)
US 12,464,955