Carrier based high volume system level testing of devices with pop structures

1. A method of testing devices under test (DUTs), the method comprising:

loading an array of DUTs on a carrier comprising a plurality of membrane pockets operable to hold the array of DUTs;

moving the carrier to a slot of a rack associated with a tester using an elevator, wherein the tester comprises a plurality of racks, wherein each rack of the plurality of racks comprises a plurality of slots;

inserting the carrier into the slot of the rack;

affixing an interface board in the slot of the rack, wherein the interface board comprises a plurality of sockets, and wherein each socket of the plurality of sockets is operable to receive a respective device under test (DUT), and wherein each DUT in the array of DUTs aligns with a respective socket of the plurality of sockets on the interface board;

positioning a package-on-package (POP) memory array adjacent to the array of DUTs, wherein the POP memory array comprises an array of memory devices, wherein each memory device of the array of memory devices corresponds to a DUT in the array of DUTs; and

actuating a socket cover of a plurality of socket covers onto each respective memory device in the POP memory array and a corresponding DUT to push through a corresponding membrane pocket, to make physical and electrical contact with each respective socket of the plurality of sockets.

2. The method of claim 1 , wherein each DUT of the array of DUTs comprises pads disposed on a top surface thereof and operable to make contact with a respective POP memory device.

3. The method of claim 1 , wherein said positioning comprises placing the array of memory devices into position using a parallel cover assembly system.

4. The method of claim 1 , wherein the elevator comprises a dual-slot elevator comprising first and second slots, wherein the first slot is operable to transport the carrier to the slot of the rack, and wherein the second slot is operable to transport a different carrier previously loaded into the slot of the rack.

5. The method of claim 1 , wherein the actuating is performed by a plurality of plungers, and wherein the plurality of socket covers and the POP memory array are integrated within the plurality of plungers.

6. The method of claim 1 wherein said loading is performed using a handler and transport system.

7. The method of claim 1 further comprising testing said array of DUTs and said array of memory devices, in combination, using said tester.

8. A method of testing devices under test (DUTs), the method comprising:

disposing an array of DUTs on a carrier using a handler and transport system, wherein the carrier comprises a plurality of membrane pockets operable to hold the array of DUTs;

transporting the carrier to a slot of a rack associated with a tester using an elevator, wherein the tester comprises a plurality of racks and wherein each rack of the plurality of racks comprises a plurality of slots;

inserting the carrier into the slot of the rack;

placing an interface board in the slot of the rack, wherein the interface board comprises a plurality of sockets, and wherein each socket of the plurality of sockets is operable to receive a respective device under test (DUT), and wherein each DUT in the array of DUTs aligns with a respective socket of the plurality of sockets on the interface board;

positioning a memory array adjacent to the array of DUTs, wherein the memory array comprises an array of memory devices, wherein each memory device of the array of memory devices corresponds to a DUT in the array of DUTs; and

actuating a socket cover of a plurality of socket covers onto each respective memory device in the memory array and a corresponding DUT to push through a corresponding membrane pocket, to make physical and electrical contact with each respective socket of the plurality of sockets.

9. The method of claim 8 , wherein each DUT of the array of DUTs comprises pads disposed on a top surface thereof and operable to make contact with a respective memory device.

10. The method of claim 8 , wherein said positioning comprises placing the array of memory devices into position using a parallel cover assembly system.

11. The method of claim 8 , wherein the elevator comprises a dual-slot elevator comprising first and second slots, wherein the first slot is operable to transport the carrier to the slot of the rack, and wherein the second slot is operable to transport a different carrier previously loaded into the slot of the rack.

12. The method of claim 8 , wherein the actuating is performed by a plurality of plungers, and wherein the plurality of socket covers and the memory array are integrated within the plurality of plungers.

13. The method of claim 8 further comprising testing said array of DUTs and said array of memory devices, in combination, using said tester.

14. A method of testing devices under test (DUTs), the method comprising:

loading an array of DUTs on a carrier comprising a plurality of membrane pockets operable to hold the array of DUTs;

moving the carrier to a slot of a rack associated with a tester system, wherein the tester system comprises a plurality of racks, wherein each rack of the plurality of racks comprises a plurality of slots;

inserting the carrier into the slot of the rack;

affixing an interface board in the slot of the rack, wherein the interface board comprises a plurality of sockets, and wherein each socket of the plurality of sockets is operable to receive a respective device under test (DUT), and wherein each DUT in the array of DUTs aligns with a respective socket of the plurality of sockets on the interface board;

positioning a package-on-package (POP) memory array adjacent to the array of DUTs, wherein the POP memory array comprises an array of memory devices, wherein each memory device of the array of memory devices corresponds to a DUT in the array of DUTs;

actuating a socket cover of a plurality of socket covers onto each respective memory device in the POP memory array and a corresponding DUT to push through a corresponding membrane pocket, to make physical and electrical contact with each respective socket of the plurality of sockets; and

testing said array of DUTs and said array of memory devices, in combination, using said tester system.

15. The method of claim 14 , wherein each DUT of the array of DUTs comprises pads disposed on a top surface thereof and operable to make contact with a respective POP memory device.

16. The method of claim 14 , wherein said positioning comprises placing the array of memory devices into position using a parallel cover assembly system.

17. The method of claim 14 , wherein the moving is performing using an elevator and wherein the elevator comprises a dual-slot elevator comprising first and second slots, wherein the first slot is operable to transport the carrier to the slot of the rack, and wherein the second slot is operable to transport a different carrier previously loaded into the slot of the rack.

18. The method of claim 14 , wherein the actuating is performed by a plurality of plungers, and wherein the plurality of socket covers and the POP memory array are integrated within the plurality of plungers.

19. The method of claim 14 , wherein said loading is performed using a handler and transport system.

20. The method of claim 14 wherein said actuating comprises applying contact force on top of the array of DUTs for pushing them down to make electrical contact with electronics of the plurality of sockets.