Memory device comprising a plurality of memories sharing a resistance for impedance matching
A memory device includes a plurality of memories, a plurality of access units, and a controller configured to control data from an access unit according to an operation cycle of another access unit whose form factor is different from that of the access unit. A resistor can be shared by the plurality of memories for impedance matching, which can shorten calibration time.
1. A memory device comprising:
a plurality of memories having a plurality of form factors to support a plurality of access units; and
a controller configured to control data from an access unit according to an operation cycle of another access unit for a form factor different from that of the access unit,
wherein the plurality of memories are configured to share a resistor for impedance matching,
wherein the plurality of memories includes a first memory and a second memory,
wherein the first memory performs impedance matching according to a resistance value of the resistor and generates a completion signal when the impedance matching is completed, and
wherein the second memory starts impedance matching by receiving the completion signal provided from the first memory.
2. The memory device of claim 1 , wherein the access unit has a burst length different from that of another access unit, and wherein the plurality of memories are coupled to have a chain structure.
3. The memory device of claim 1 , wherein the controller is configured to generate an internal command based on the access unit.
4. The memory device of claim 1 , wherein the controller comprising a storage circuit is configured to store information about the access unit.
5. The memory device of claim 1 , wherein the controller comprising an error correction circuit is configured to generate error correction information and perform error correction on read data read from a memory.
6. A memory device comprising:
a plurality of memories having a plurality of form factors to support a plurality of access units;
a controller configured to manage data according to operation cycles of an access unit for a form factor different from that of another access unit; and
a storage circuit configured to store information about the access unit,
wherein the plurality of memories are configured to share a resistor for impedance matching,
wherein the plurality of memories includes a first memory and a second memory,
wherein the first memory performs impedance matching according to a resistance value of the resistor and generates a completion signal when the impedance matching is completed, and
wherein the second memory starts impedance matching by receiving the completion signal provided from the first memory.
7. The memory device of claim 6 , wherein the access unit has a burst length different from that of another access unit, and wherein the plurality of memories are coupled to have a chain structure.
8. The memory device of claim 6 , wherein the controller is configured to generate an internal command based on the access unit.
9. The memory device of claim 6 , wherein the controller comprising an access unit comparison circuit is configured to compare a size of the data with the access unit.
10. The memory device of claim 6 , wherein the controller comprising an error correction circuit is configured to generate error correction information and perform error correction on read data read from a memory.
11. A memory device comprising:
a plurality of memories having a plurality of form factors to support a plurality of access units;
a controller configured to control data from an access unit according to an operation cycle different from that of another access unit; and
a storage circuit configured to store information about the access unit,
wherein the plurality of memories are configured to share a resistor for impedance matching,
wherein the plurality of memories includes a first memory and a second memory,
wherein the first memory performs impedance matching according to a resistance value of the resistor and generates a completion signal when the impedance matching is completed, and
wherein the second memory starts impedance matching by receiving the completion signal provided from the first memory.
12. The memory device of claim 11 , wherein the access unit has a burst length different from that of another access unit, and wherein the plurality of memories are coupled to have a chain structure.
13. The memory device of claim 11 , wherein the controller is configured to generate an internal command based on the access unit.
14. The memory device of claim 11 ,
wherein the controller comprising an access unit comparison circuit is configured to compare a size of the data with the access unit.
15. The memory device of claim 11 , wherein the controller comprising an error correction circuit is configured to generate error correction information and perform error correction on read data read from a memory.
16. A memory device comprising:
a plurality of memories having a plurality of form factors to support a plurality of access units;
a controller configured to control data from an access unit according to an operation cycle different from that of another access unit whose form factor is different from that of the access unit; and
a storage circuit configured to store information about the access unit,
wherein the plurality of memories are configured to share a resistor for impedance matching,
wherein the plurality of memories includes a first memory and a second memory,
wherein the first memory performs impedance matching according to a resistance value of the resistor and generates a completion signal when the impedance matching is completed, and
wherein the second memory starts impedance matching by receiving the completion signal provided from the first memory.
17. The memory device of claim 16 , wherein the access unit has a burst length different from that of another access unit, and wherein the plurality of memories are coupled to have a chain structure.
18. The memory device of claim 16 , wherein the controller is configured to generate an internal command based on the access unit.
19. The memory device of claim 16 , wherein the controller comprising an access unit comparison circuit is configured to compare a size of the data with the access unit.
20. The memory device of claim 16 , wherein the controller comprising an error correction circuit is configured to generate error correction information and perform error correction on read data read from a memory.