Methods and apparatus for processing a substrate
Methods and apparatus for processing substrates are provided herein. For example, a magnet to target spacing system configured for use with an apparatus for processing a substrate comprises a sensor configured to provide a signal corresponding to a distance between a front of a magnet and a back of a target while rotating the magnet with respect to the target and a magnet controller configured to control the distance between the front of the magnet and the back of the target based upon the signal provided by the sensor.
1. A magnet to target spacing system configured for use with an apparatus for processing a substrate, comprising:
a sensor configured to provide a signal corresponding to a distance between a front of a magnet and a back of a target while rotating the magnet with respect to the target, wherein the sensor is a laser sensor configured to transmit a detection beam toward the back of the target and a receive a reflection beam from the back of the target; and
a magnet controller configured to control the distance between the front of the magnet and the back of the target based upon the signal provided by the sensor, wherein the magnet controller is further configured to control the distance between the front of the magnet and the back of the target based on a travel speed of the detection beam, a change in time from when the detection beam is transmitted to when the reflection beam is received, and a fixed scalar value, and
wherein the fixed scalar value is 0.5.
2. The magnet to target spacing system of claim 1 , wherein the magnet controller is further configured to control the distance between the front of the magnet and the back of the target using Equation:
change in a distance=0.5 *Δt *VBEAM,
where VBEAM=travel speed of the detection beam and Δt=a change in time from when the detection beam is transmitted to when the reflection beam is received.
3. The magnet to target spacing system of claim 1 , wherein the target is made from copper.
4. The magnet to target spacing system of claim 1 , wherein the magnet controller is further configured to control the distance between the front of the magnet and the back of the target such that a change in the distance between the front of the magnet and the back of the target is about 2.75 mm to about 3.25 mm.
5. A processing chamber for processing a substrate, comprising:
a substrate support disposed within a processing volume of the processing chamber and configured to support a substrate;
a target configured to sputter material toward the substrate support;
a magnetron comprising a magnet rotatable along a pathway during operation;
a sensor configured to provide a signal corresponding to a distance between a front of the magnet and a back of the target while rotating the magnet with respect to the target, wherein the sensor is a laser sensor configured to transmit a detection beam toward the back of the target and a receive a reflection beam from the back of the target; and
a magnet controller configured to control the distance between the front of the magnet and the back of the target based upon the signal provided by the sensor, wherein the magnet controller is further configured to control the distance between the front of the magnet and the back of the target based on a travel speed of the detection beam, a change in time from when the detection beam is transmitted to when the reflection beam is received, and a fixed scalar value, and
wherein the fixed scalar value is 0.5.
6. The processing chamber of claim 5 , wherein the magnet controller is further configured to control the distance between the front of the magnet and the back of the target using Equation:
change in the distance=0.5 *Δt VBEAM,
where VBEAM=travel speed of the detection beam and Δt=a change in time from when the detection beam is transmitted to when the reflection beam is received.
7. The processing chamber of claim 5 , wherein the target is made from copper.
8. The processing chamber of claim 5 , wherein the magnet controller is further configured to control the distance between the front of the magnet and the back of the target such that a change in the distance between the front of the magnet and the back of the target is about 2.75 mm to about 3.25 mm.
9. A method for processing a substrate, comprising:
detecting a distance between a front of a magnet and a back of a target while rotating the magnet with respect to the target, wherein detecting the distance between the front of the magnet and the back of the target comprises transmitting a detection beam toward the back of the target and receiving a reflection beam from the back of the target; and
controlling the distance between the front of the magnet and the back of the target to a desired value based upon a detected distance, wherein controlling the distance between the front of the magnet and the back of the target is based on a travel speed of a detection beam, a change in time from when the detection beam is transmitted to when the reflection beam is received, and a fixed scalar value, and
wherein the fixed scalar value is 0.5.
10. The method of claim 9 , wherein controlling the distance between the front of the magnet and the back of the target is determined using Equation:
change in the distance=0.5*Δ t VBEAM,
where VBEAM=travel speed of the detection beam and Δt=a change in time from when the detection beam is transmitted to when the reflection beam is received.
11. The method of claim 9 , wherein the target is made from copper.