IP Library › Granted Patent US 11,776,589
Granted Patent B2
US 11,776,589 · App. 17/731,961 · Granted Oct 3, 2023

Vertical compression scheme for compressed soft bit data in non-volatile memories with data latch groups

Inventors: Hua-Ling Cynthia Hsu (Fremont, CA); YenLung Li (San Jose, CA)
Assignee: SanDisk Technologies LLC
G11C7/065G11C7/106G11C7/1012G11C7/1069G11C7/1087G11C7/12
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Quick Facts
Patent No.
US 11,776,589
App. No.
17/731,961
Granted
Oct 3, 2023
Kind
B2
Abstract

For a non-volatile memory that uses hard bit and soft bit data in error correction operations, to reduce the amount of soft bit data that needs to be transferred from a memory to the controller and improve memory system performance, the soft bit data can be compressed before transfer. After the soft bit data is read and stored into the internal data latches associated with the sense amplifiers, it is compressed within these internal data latches. The compressed soft bit data can then be transferred to the transfer data latches of a cache buffer, where the compressed soft bit data can be consolidated and transferred out over an input-output interface. Within the input-output interface, the compressed data can be reshuffled to put into logical user data order if needed.

Claims (70)

1. A non-volatile memory device, comprising:

a control circuit configured to connect to a plurality of bit lines each connected to a corresponding plurality of memory cells, the control circuit comprising:

a plurality of sense amplifiers each configured to read data from the memory cells connected to a corresponding one or more bit lines;

a plurality of sets of internal data latches, each set of internal data latches configured to store data associated with a corresponding one of the sense amplifiers and each set of internal data latches comprising a first subset of internal data latches connected along a first local data bus and a second subset of internal data latches connected along a second local data bus; and

an input-output interface configured to provide data to an external data bus, the control circuit configured to:

perform a read operation by each of the sense amplifiers on a plurality of memory cells;

store results of the read operation by each of the sense amplifiers in the corresponding set of internal data latches;

compress the results of the read operation stored in the first subset of the corresponding internal data latches within the first subset of the corresponding set of internal data latches;

compress the results of the read operation stored in the second subset of the corresponding internal data latches within the second subset of the corresponding set of internal data latches;

combine, for each of the corresponding sets of internal data latches, the compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches; and

transfer the combined compressed results of the read operation over the input-output interface to the external data bus.

2. The non-volatile memory device of claim 1 , wherein the control circuit is formed on a control die, the non-volatile memory device further comprising:

a memory die including the plurality of bit lines and corresponding pluralities of non-volatile memory cells, the memory die formed separately from and bonded to the control die.

3. The non-volatile memory device of claim 1 , wherein the results of the read operation are soft bit data values.

4. The non-volatile memory device of claim 3 , wherein the control circuit is further configured to:

perform a hard bit read operation by each of the sense amplifiers on the plurality of memory cells to determine a hard bit value for each of the plurality of memory cells indicating whether the memory cell is either reliably in a first data state or unreliability in a second data state, wherein each of the soft bit data values correspond to one of the hard bit values and indicate the reliability value of memory cells determined to be in the second data state, but not for memory cells determined to be in the first data state.

5. The non-volatile memory device of claim 1 , the control circuit further comprising:

a cache buffer comprising a plurality of sets of transfer data latches each corresponding to one of the sets of internal data latches, each set of transfer latches including:

a first subset of transfer data latches connect along the first local data bus of the corresponding set of internal data latches; and

a second subset of transfer data latches connect along the second local data bus of the corresponding set of internal data latches; and

logic and multiplexing circuitry connected, for each of the corresponding internal data latches, to the first subset of transfer data latches and the second subset of data latches,

wherein, to combine the compressed results of the read operation from the first subsets of the corresponding internal data latches with the compressed results of the read operation from the second subsets of the corresponding internal data latches, the control circuit further configured to:

transfer the compressed results of the read operation from each of the first subsets of internal data latches to a corresponding first subset of transfer data latches;

transfer the compressed results of the read operation from each of the second subsets of internal data latches to a corresponding second subset of transfer data latches; and

combine by the logic and multiplexing circuitry the compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches.

6. The non-volatile memory device of claim 5 , wherein the logic and multiplexing circuitry is configured to:

further compress the combined compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches.

7. The non-volatile memory device of claim 5 , wherein the logic and multiplexing circuitry is configured to:

interleave the compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches.

8. The non-volatile memory device of claim 1 , wherein, to compress the results of the read operation by each of the sense amplifiers within the corresponding set of internal data latches, the control circuit is further configured to:

perform logical combinations of multiple ones of the results of the read operation by each of the sense amplifiers.

9. The non-volatile memory device of claim 1 , further comprising:

an array of non-volatile memory cells, including the plurality bit lines each corresponding pluralities of memory cells, formed according to a three dimensional NAND architecture.

10. A method, comprising:

performing a read operation by each of a plurality of sense amplifiers on a plurality of memory cells;

storing results of the read operation by each of the sense amplifiers in a corresponding set of internal data latches, each set of internal data latches comprising a first subset of internal data latches connected along a first local data bus and a second subset of internal data latches connected along a second local data bus;

performing, within the corresponding set of internal data latches, a data compression operation of the results of the read operations by each of the sense amplifiers in which, for each set of internal data latches, the results of the read operation stored in the first subset of the corresponding internal data latches are compressed within the first subset of the corresponding set of internal data latches and the results of the read operation stored in the second subset of the corresponding internal data latches are compressed within the second subset of the corresponding set of internal data latches;

combining, for each of the corresponding sets of internal data latches, the compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches; and

transferring the combined compressed results of the read operations from the sets of internal data latches to an input-output interface.

11. The method of claim 10 , wherein combining the compressed results of the read operation from the first subsets of the corresponding internal data latches with the compressed results of the read operation from the second subsets of the corresponding internal data latches includes:

transferring the compressed results of the read operation from each of the first subsets of internal data latches to a corresponding first subset of transfer data latches;

transferring the compressed results of the read operation from each of the second subsets of internal data latches to a corresponding second subset of transfer data latches; and

combining the compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches.

12. The method of claim 11 , wherein combining the compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches includes:

further compressing the combined compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches.

13. The method of claim 11 , wherein combining the compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches includes:

interleaving the compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches.

14. The method of claim 10 , wherein the results of the read operation are soft bit data values.

15. The method of claim 14 , further comprising:

performing a hard bit read operation by each of the sense amplifiers on the plurality of memory cells to determine a hard bit value for each of the plurality of memory cells indicating whether the memory cell is either reliably in a first data state or unreliability in a second data state, wherein each of the soft bit data values correspond to one of the hard bit values and indicate a reliability value of memory cells determined to be in the second data state, but not for memory cells determined to be in the first data state.

16. The method of claim 15 , further comprising:

transferring the hard bit values and the corresponding soft bit data values from the input-output interface to an error correction code engine.

17. A non-volatile memory device, comprising:

a plurality of bit lines each connected to a corresponding plurality of non-volatile memory cells;

a plurality of sense amplifier circuits each configured to read data from memory connected to a corresponding one or more bit lines;

a plurality of sets of data latches, each set of data latches configured to store data associated with a corresponding one of the sense amplifiers and each set of data latches comprising a first subset of data latches connected along a first local data bus and a second subset of data latches connected along a second local data bus;

logic and multiplexing circuitry connected, for each of the corresponding sets of data latches, to the first subset of data latches and the second subset of data latches;

an input-output interface configured to provide data to an external data bus; and

one or more control circuits connected to the sense amplifier circuits, the sets of data latches, the logic and multiplexing circuitry, and the input-output interface, the one or more control circuits configured to:

perform a read operation by each of the plurality of sense amplifiers on a plurality of the corresponding memory cells;

store results of the read operation by each of the sense amplifiers in the corresponding set of data latches;

compress the results of the read operation stored in the first subset of the corresponding data latches within the first subset of the corresponding set of data latches;

compress the results of the read operation stored in the second subset of the corresponding data latches within the second subset of the corresponding set of data latches;

combine, by the logic and multiplexing circuitry, the compressed results of the read operation from the first subset of the corresponding data latches with the compressed results of the read operation from the second subset of the corresponding data latches for each of the corresponding sets of data latches; and

transfer the combined compressed results of the read operation over the input-output interface to the external data bus.

18. The non-volatile memory device of claim 17 , wherein the logic and multiplexing circuitry is configured to:

further compress the combined compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches.

19. The non-volatile memory device of claim 17 , wherein the logic and multiplexing circuitry is configured to:

interleave the compressed results of the read operation from the first subset of the corresponding internal data latches with the compressed results of the read operation from the second subset of the corresponding internal data latches for each of the corresponding sets of internal data latches.

20. The non-volatile memory device of claim 17 , wherein the results of the read operation are soft bit data values.

Assignments (4)
PARTIAL RELEASE OF SECURITY INTERESTS Recorded Apr 25, 2025
From: JPMORGAN CHASE BANK, N.A., AS AGENT
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 071382/0001 →
SECURITY AGREEMENT Recorded Apr 25, 2025
From: SANDISK TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 071050/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2024
From: SANDISK TECHNOLOGIES LLC
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 069796/0423 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2022
From: HSU, HUA-LING CYNTHIA; LI, YENLUNG
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 059761/0915 →
Continuity (4)
Continuation In Part 17666657 · Feb 8, 2022
Continuation In Part 17557236 · Dec 21, 2021
Provisional Application 63244951 · Sep 16, 2021
Related Publication 20230085405A1 · Mar 16, 2023
Cited By (2)
US 12,462,883 US 12,580,593