Semiconductor device package and method of manufacturing the same

1. A semiconductor device package, comprising:

a substrate;

an interconnection structure disposed over the substrate;

a package body disposed over the substrate and partially covering the interconnection structure, wherein the package body has a recess, and the interconnection structure is at least partially within the recess;

an electronic component comprising an electrical contact at least partially within the recess; and

a conductive element connecting the electrical contact and the interconnection structure wherein the conductive element contacts a lateral surface of the electrical contact, the electrical contact comprises a vertical portion and a horizontal portion, and an elevation of a bottom end of the vertical portion is higher than an elevation of a top surface of the horizontal portion with respect to the substrate.

2. A semiconductor device package, comprising:

a substrate;

a interconnection structure disposed over the substrate;

a package body disposed over the substrate and partially covering the interconnection structure, wherein the package body has a recess around the interconnection structure;

an electronic component disposed over the interconnection structure; and

a conductive element at least partially within the recess and electrically connecting the electronic component and the interconnection structure, wherein a melting point of the interconnection structure is higher than a melting point of the conductive element wherein the electronic component comprises an electrical contact at least partially extending over and from a lateral surface toward a bottom surface of the electronic component and connected to the conductive element.

3. A semiconductor device package, comprising:

a substrate;

a first interconnection structure disposed over the substrate; and

a package body disposed over the substrate and having a first recess exposing the first interconnection structure;

wherein in a top view perspective, the first interconnection structure has a geometric center,

the first recess has a first side, a second side opposite to the first side, a third side, and a fourth side opposite to the third side,

wherein a distance between the geometric center and the first side in a first direction is different from a distance between the geometric center and the second side in the first direction, and

wherein a distance between the geometric center and the third side in a second direction is different from a distance between the geometric center and the fourth side in the second direction, the second direction being substantially perpendicular to the first direction.

4. The semiconductor device package of claim 3 , further comprising an electronic component disposed under the first recess.

5. The semiconductor device package of claim 3 , further comprising a second interconnection structure disposed over the substrate, wherein the package body further has a second recess exposing the second interconnection structure, and in the top view perspective, a distance between a geometric center of the first recess and a geometric center of the second recess is less than a distance between the geometric center of the first interconnection structure and a geometric center of the second interconnection structure.

6. The semiconductor device package of claim 5 , wherein the package body further has a third recess adjacent to the first recess, and in the top view perspective, the distance between the geometric center of the first recess and the geometric center of the second recess is different from a distance between the geometric center of the first recess and a geometric center of the third recess.

7. The semiconductor device package of claim 5 , further comprising an electronic component free from overlapping the first recess and the second recess, wherein the electronic component is disposed between the first recess and the second recess from the top view perspective.

8. The semiconductor device package of claim 3 , further comprising an electronic component disposed below the first recess, wherein the first recess comprises a first portion overlapping the electronic component and a second portion without overlapping the electronic component.

9. The semiconductor device package of claim 8 , wherein an area of the first portion of the first recess is less than an area of the second portion of the first recess from the top view perspective.

10. The semiconductor device package of claim 1 , wherein the vertical portion of the electrical contact has a first lateral surface and a second lateral surface opposite to the first lateral surface, the first lateral surface is closer to the electronic component than to the second lateral surface, the conductive element comprises a first portion contacting the first lateral surface of the vertical portion and a second portion contacting the second lateral surface of the vertical portion, and an area of the first portion of the conductive element is greater than an area of the second portion of the conductive element in a cross-sectional view perspective.

11. The semiconductor device package of claim 1 , wherein the conductive element contacts an upper surface of the electrical contact in a cross-sectional view perspective.

12. The semiconductor device package of claim 1 , wherein in a cross-sectional view perspective, a bottom surface of the recess comprises a first portion and a second portion spaced apart from the first portion by the interconnection structure, and a roughness of the first portion of the bottom surface is different from a roughness of the second portion of the bottom surface.

13. The semiconductor device package of claim 12 , wherein in the cross-sectional view perspective, a width of the second portion of the bottom surface of the recess is greater than a width of the first portion of the bottom surface of the recess, the first portion does not vertically overlap the electronic component, and the second portion vertically overlaps the electronic component.

14. The semiconductor device package of claim 1 , wherein the conductive element has a curved surface between the interconnection structure and a lateral sidewall of the recess and under the horizontal portion of the electrical contact.

15. The semiconductor device package of claim 1 , wherein in a cross-sectional view perspective, the conductive element does not contact any lateral edge of the recess, the conductive element is spaced apart from a first lateral edge of the recess by a first distance, and the conductive element is spaced apart from a second lateral edge of the recess by a second distance different from the first distance.

16. The semiconductor device package of claim 2 , wherein the conductive element contacts the lateral surface of the electronic component.

17. The semiconductor device package of claim 2 , wherein the electrical contact comprises a portion extending over the lateral surface of the electronic component and partially embedded in the electronic component.

18. The semiconductor device package of claim 2 , wherein the electrical contact has a first curved surface adjacent to and horizontally overlapping a corner portion of the electronic component.

19. The semiconductor device package of claim 18 , wherein the electrical contact further has a second curved surface opposite to the first curved surface, the first curved surface is outside of the recess, the second curved surface is partially within the recess, and a length of the second curved surface is greater than a length of the first curved surface in a cross-sectional view perspective.

20. The semiconductor device package of claim 2 , wherein the lateral surface of the electronic component vertically overlaps the interconnection structure.