High electron mobility transistor and method for fabricating the same
A method for fabricating high electron mobility transistor (HEMT) includes the steps of: forming a buffer layer on a substrate; forming a barrier layer on the buffer layer; forming a hard mask on the barrier layer; performing an implantation process through the hard mask to form a doped region in the barrier layer and the buffer layer; removing the hard mask and the barrier layer to form a first trench; forming a gate dielectric layer on the hard mask and into the first trench; forming a gate electrode on the gate dielectric layer; and forming a source electrode and a drain electrode adjacent to two sides of the gate electrode.
1. A method for fabricating high electron mobility transistor (HEMT), comprising:
forming a buffer layer on a substrate;
forming a barrier layer on the buffer layer;
forming a hard mask on the barrier layer;
performing an ion implantation process through the hard mask to form a doped region in the barrier layer and the buffer layer; and
removing a portion of the hard mask and a portion of the barrier layer to form a first trench, wherein a width of the first trench is less than a width of the doped region.
2. The method of claim 1 , further comprising:
forming a gate dielectric layer on the hard mask and into the first trench;
forming a gate electrode on the gate dielectric layer; and
forming a source electrode on a first side of the gate electrode and a drain electrode on a second side of the gate electrode, the first side being opposite the second side.
3. The method of claim 2 , further comprising:
removing the gate dielectric layer, the hard mask, and the barrier layer to form a second trench and a third trench adjacent to two sides of the gate electrode; and
forming the source electrode in the second trench and the drain electrode in the third trench.
4. The method of claim 1 , wherein the buffer layer comprises a group III-V semiconductor.
5. The method of claim 1 , wherein the buffer layer comprises gallium nitride (GaN).
6. The method of claim 1 , wherein the barrier layer comprise Al x Ga 1-x N.
7. The method of claim 1 , wherein the doped region comprises fluorine.
8. The method of claim 7 , wherein a concentration of fluorine decreases from the barrier layer to the buffer layer.