IP Library › Granted Patent US 12,230,479
Granted Patent B2
US 12,230,479 · App. 18/599,767 · Granted Feb 18, 2025

Processing chamber with multiple plasma units

Inventors: Kazuya Daito (Milipitas, CA); Yi Xu (San Jose, CA); Yu Lei (Belmont, CA); Takashi Kuratomi (San Jose, CA); Jallepally Ravi (San Ramon, CA); Pingyan Lei (San Jose, CA); Dien-Yeh Wu (San Jose, CA)
Assignee: Applied Materials, Inc.
H01J37/32357C23C16/45536C23C16/50H01J37/32422H01L21/67028H01L21/67069H05H1/4652H01J2237/327H01J2237/332H01J2237/335
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,230,479
App. No.
18/599,767
Granted
Feb 18, 2025
Kind
B2
Abstract

Provided is a processing chamber configured to contain a semiconductor substrate in a processing region of the chamber. The processing chamber includes a remote plasma unit and a direct plasma unit, wherein one of the remote plasma unit or the direct plasma unit generates a remote plasma and the other of the remote plasma unit or the direct plasma unit generates a direct plasma. The combination of a remote plasma unit and a direct plasma unit is used to remove, etch, clean, or treat residue on a substrate from previous processing and/or from native oxide formation. The combination of a remote plasma unit and direct plasma unit is used to deposit thin films on a substrate.

Claims (8)

1. A non-transitory computer readable medium including instructions, that, when executed by a controller of a processing chamber, causes the processing chamber to perform operations of:

exposing a substrate to a remote plasma that remotely impacts the substrate; and

exposing the substrate to a direct plasma that directly impacts the substrate,

wherein the direct plasma is generated first between a pedestal electrode and an ion filter and the remote plasma is generated between the ion filter and one or more of an ICP coil and a top electrode after the direct plasma is generated.

2. The non-transitory computer readable medium of claim 1 , further including instructions that, when executed by a controller of a processing chamber causes the processing chamber to perform the operations of: exposing the substrate to at least one precursor to form a film on the substrate.

3. The non-transitory computer readable medium of claim 1 , wherein exposing the substrate to the remote plasma and to the direct plasma cleans or treats the substrate.

4. The non-transitory computer readable medium of claim 1 , wherein the substrate comprises one or more of a trench, a via, or a peak.

5. The non-transitory computer readable medium of claim 4 , wherein the substrate comprises one or more of a residue or a native oxide thereon.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2024
From: DAITO, KAZUYA; XU, YI; LEI, YU; KURATOMI, TAKASHI; RAVI, JALLEPALLY; LEI, PINGYAN; WU, DIEN-YEH
To: APPLIED MATERIALS, INC.
Reel/Frame 066711/0714 →
Continuity (5)
Division 17844245 · Jun 20, 2022
Division 17101074 · Nov 23, 2020
Provisional Application 62960293 · Jan 13, 2020
Provisional Application 62941148 · Nov 27, 2019
Related Publication 20240249918A1 · Jul 25, 2024
References Cited (54)
US 5091049A · Campbell et al. · 1992 [cited by applicant]
US 5710486A · Ye et al. · 1998 [cited by applicant]
US 6124003A · Mikami et al. · 2000 [cited by applicant]
US 6153530A · Ye et al. · 2000 [cited by applicant]
US 6835278B2 · Selbrede · 2004 [cited by applicant]
US 7294205B1 · Ravi et al. · 2007 [cited by applicant]
US 7977249B1 · Liu et al. · 2011 [cited by applicant]
US 9362130B2 · Ingle et al. · 2016 [cited by applicant]
US 9502218B2 · Chen et al. · 2016 [cited by applicant]
US 10256079B2 · Lubomirsky et al. · 2019 [cited by applicant]
US 10510553B1 · Kuo · 2019 [cited by examiner]
US 11195696B2 · Shin et al. · 2021 [cited by applicant]
US 20020029747A1 · Powell et al. · 2002 [cited by applicant]
US 20020073925A1 · Noble et al. · 2002 [cited by applicant]
US 20040161942A1 · Tabaru · 2004 [cited by applicant]
US 20040194890A1 · Moroz · 2004 [cited by applicant]
US 20040219737A1 · Quon · 2004 [cited by examiner]
US 20050211170A1 · Hanawa et al. · 2005 [cited by applicant]
US 20050211546A1 · Hanawa et al. · 2005 [cited by applicant]
US 20070074814A1 · Hahn et al. · 2007 [cited by applicant]
US 20080156771A1 · Jeon et al. · 2008 [cited by applicant]
US 20080178805A1 · Paterson · 2008 [cited by examiner]
US 20090017227A1 · Fu · 2009 [cited by applicant]
US 20130319615A1 · Cho et al. · 2013 [cited by applicant]
US 20140148014A1 · You et al. · 2014 [cited by applicant]
US 20150090583A1 · Kodaira et al. · 2015 [cited by applicant]
US 20150118862A1 · Reilly et al. · 2015 [cited by applicant]
US 20150140834A1 · Kashefi et al. · 2015 [cited by applicant]
US 20160276134A1 · Collins et al. · 2016 [cited by applicant]
US 20160358784A1 · Hudson et al. · 2016 [cited by applicant]
US 20170069466A1 · Tran et al. · 2017 [cited by applicant]
US 20170148630A1 · Kim et al. · 2017 [cited by applicant]
US 20170229290A1 · Kobayashi et al. · 2017 [cited by applicant]
US 20190198301A1 · Ma et al. · 2019 [cited by applicant]
US 20190318937A1 · Yang et al. · 2019 [cited by applicant]
US 20210082724A1 · Xie · 2021 [cited by examiner]
US 20220131071A1 · Lill et al. · 2022 [cited by applicant]
JP 2009238878A · 2009 [cited by applicant]
JP 2014531753A · 2014 [cited by applicant]
JP 2014532988A · 2014 [cited by applicant]
KR 100653217B1 · 2006 [cited by applicant]
KR 20140068055A · 2014 [cited by applicant]
KR 20140082850A · 2014 [cited by applicant]
TW 200735196A · 2007 [cited by applicant]
TW 201030798A · 2010 [cited by applicant]
TW 201909236A · 2019 [cited by applicant]
TW 201937551A · 2019 [cited by applicant]
WO 2015020792A1 · 2015 [cited by applicant]
“Final Office Action in U.S. Appl. No. 17/101,074, dated Oct. 27, 2022, 8 pages”. [cited by applicant]
“Non-Final Office Action in U.S. Appl. No. 17/101,074, dated Dec. 2, 2022, 12 pages”. [cited by applicant]
“Non-Final Office Action in U.S. Appl. No. 17/101,077, dated Oct. 27, 2022, 15 pages.” [cited by applicant]
“Non-Final Office Action in U.S. Appl. No. 17/101,074 dated Jan. 27, 2022, 10 pages”. [cited by applicant]
“PCT International Search Report and Written Opinion in PCT/US2020/061759 dated Mar. 18, 2021, 9 pages”. [cited by applicant]
“PCT International Search Report and Written Opinion in PCT/US2020/061763 dated Mar. 16, 2021, 9 pages”. [cited by applicant]