Granted Patent B2

US 12,295,271 · App. 17/457,930 · Granted May 6, 2025

Inventors: Devendra K. Sadana (Pleasantville, NY); Ning Li (White Plains, NY); Bahman Hekmatshoartabari (White Plains, NY)

Assignee: International Business Machines Corporation

H10N70/231G06N3/08H10B63/80H10N70/011H10N70/826H10N70/884

Abstract

Claims (59)

1. A structure comprising:

a crystallization seed layer in a substrate;

a phase change material layer on the substrate, the phase change material layer directly above the crystallization seed layer and extending beyond the crystallization seed layer, wherein the phase change material layer comprises a similar lattice constant as a lattice constant of the crystallization seed layer;

a top electrode on the substrate, adjacent to a first vertical side surface and overlapping a first portion of an upper horizontal surface of the phase change material layer, wherein the first vertical side surface of the phase change material layer is aligned above the crystallization seed layer;

a bottom electrode on the substrate, adjacent to a second vertical side surface and overlapping a second portion of the upper horizontal surface of the phase change material layer; and

a dielectric material horizontally isolating the bottom electrode and the top electrode.

2. The structure according to claim 1 ,

wherein the phase change material layer is selected from a group consisting of amorphous silicon, amorphous germanium and amorphous silicon germanium.

3. The structure according to claim 1 ,

wherein a first height of a first crystallized portion of the phase change material layer is 25% of a height of the phase change material layer measured horizontally from the bottom electrode, and the first height corresponds to a first resistive state of the structure,

wherein a second height of a second non-crystallized portion of the phase change material layer is 75% of the height of the phase change material layer measured horizontally from the bottom electrode, and the second height corresponds to a second resistive state of the structure,

wherein the second resistive state comprises a lower resistance than the first resistive state.

4. The structure according to claim 1 ,

wherein a first portion of the phase change material layer comprises crystallized amorphous silicon, and a second portion of the phase change material layer comprises non-crystallized amorphous silicon.

5. The structure according to claim 1 ,

wherein the structure comprises multiple resistive states corresponding to multiple memory states, dependent upon an amount of crystallization of the phase change material layer.

6. The structure according to claim 1 , further comprising:

wherein the structure comprises multiple resistive states corresponding to multiple memory states, dependent upon an amount of crystallization of the phase change material layer.

7. The structure according to claim 1 , further comprising:

wherein the structure is formed on the substrate above intervening structures.

8. A plurality of memory structures configured in a crossbar array, each of the plurality of memory structures comprising:

a crystallization seed layer in a substrate;

a phase change material layer on the substrate, the phase change material layer directly above the crystallization seed layer and extending beyond the crystallization seed layer, wherein the phase change material layer comprises a similar lattice constant as a lattice constant of the crystallization seed layer;

a top electrode on the substrate, adjacent to a first vertical side surface and overlapping a first portion of an upper horizontal surface of the phase change material layer, wherein the first vertical side surface of the phase change material layer is aligned above the crystallization seed layer;

a bottom electrode on the substrate, adjacent to a second vertical side surface and overlapping a second portion of the upper horizontal surface of the phase change material layer; and

a dielectric material horizontally isolating the bottom electrode from the top electrode.

9. The structure according to claim 8 ,

wherein the phase change material layer is selected from a group consisting of amorphous silicon, amorphous germanium and amorphous silicon germanium.

10. The structure according to claim 8 ,

wherein a first height of a first crystallized portion of the phase change material layer is 25% of a height of the phase change material layer measured horizontally from the bottom electrode, and the first height corresponds to a first resistive state of the structure,

wherein a second height of a second non-crystallized portion of the phase change material layer is 75% of the height of the phase change material layer measured horizontally from the bottom electrode, and the second height corresponds to a second resistive state of the structure,

wherein the second resistive state comprises a lower resistance than the first resistive state.

11. The structure according to claim 8 ,

wherein a first portion of the phase change material layer comprises crystallized amorphous silicon, and a second portion of the phase change material layer comprises non-crystallized amorphous silicon.

12. The structure according to claim 8 ,

wherein the structure comprises multiple resistive states corresponding to multiple memory states, dependent upon an amount of crystallization of the phase change material layer.

13. The structure according to claim 8 , further comprising:

wherein the structure comprises multiple resistive states corresponding to multiple memory states, dependent upon an amount of crystallization of the phase change material layer.

14. The structure according to claim 8 , further comprising:

wherein the structure is formed on the substrate above intervening structures.

15. A method to form a structure comprising:

forming a crystallization seed layer in a substrate;

forming a phase change material layer on the substrate, the phase change material layer directly above the crystallization seed layer and extending beyond the crystallization seed layer, wherein the phase change material layer comprises a similar lattice constant as a lattice constant of the crystallization seed layer;

forming a top electrode on the substrate adjacent to a first vertical side surface and overlapping a first portion of an upper horizontal surface of the phase change material layer; wherein the first vertical side surface of the phase change material layer is aligned above the crystallization seed layer;

forming a bottom electrode on the substrate, adjacent to a second vertical side surface and overlapping a second portion of the upper horizontal surface of the phase change material layer; and

forming a dielectric material horizontally isolating the bottom electrode and the top electrode.

16. The method according to claim 15 ,

wherein the phase change material layer is selected from a group consisting of amorphous silicon, amorphous germanium and amorphous silicon germanium.

17. The method according to claim 15 , further comprising:

controlling a resistance between the bottom electrode and the top electrode by controlling an amount of crystallization of the phase change material layer,

wherein a lower portion of the phase change material layer comprises crystallized amorphous silicon, and an upper portion of the phase change material layer comprises non-crystallized amorphous silicon.

18. The method according to claim 15 ,

wherein a lower portion of the phase change material layer comprises crystallized amorphous silicon, and an upper portion of the phase change material layer comprises non-crystallized amorphous silicon.

19. The method according to claim 15 , further comprising:

crystalizing a first portion of the phase change material layer by applying a voltage and a current between the top electrode and the bottom electrode, which corresponds to a first resistive state of the structure; and

crystalizing a second portion of the phase change material layer by applying a voltage and a current between the top electrode and the bottom electrode, the second portion of the phase change material layer is greater than the first portion of the phase change material layer, which corresponds to a second resistive state of the structure,

wherein the second resistive state comprises a lower resistance than the first resistive state.

20. The method according to claim 15 ,

wherein the structure comprises multiple resistive states corresponding to multiple memory states, dependent upon an amount of crystallization of the phase change material layer.

Assignments (1)

Continuity (1)

References Cited (25)