Trench capacitor structure with hybrid filling layer
A capacitor structure that includes a silicon substrate having a trench structure formed therein; a dielectric disposed over a surface of the trench structure, conformal to the surface of the trench structure; and a filling layer disposed over the dielectric layer and into the trench structure, the filling layer including a conductive layer and a polymer layer.
1. A capacitor structure, comprising:
a silicon substrate having a trench structure formed therein;
a dielectric layer disposed over a surface of the trench structure, conformal to said surface of the trench structure; and
a filling layer disposed over the dielectric layer and into the trench structure, the filling layer comprising:
a conductive layer; and
a polymer layer,
wherein the conductive layer is disposed between the dielectric layer and the polymer layer, and
wherein a trench depth of the trench structure ranges between 10 and 100 microns, an aspect ratio of the trench structure ranges between 1:10 and 1:60, a thickness of the dielectric layer ranges between 0.6 and 1.5 microns, a thickness of the conductive layer ranges between 10 and 500 nanometers, and a thickness of the polymer layer ranges between 150 and 2000 nanometers.
2. The capacitor structure of claim 1 , wherein the dielectric layer comprises a mineral-type dielectric layer.
3. The capacitor structure of claim 2 , wherein the mineral-type dielectric comprises silicon dioxide, silicon nitride, or silicon oxynitride.
4. The capacitor structure of claim 1 , wherein the conductive layer comprises a metallic layer or a polysilicon layer.
5. The capacitor structure of claim 4 , wherein the metallic layer comprises titanium nitride, vanadium nitride, or tungsten nitride.
6. The capacitor structure of claim 1 , wherein the polymer layer comprises Parylene AF- 4 .
7. The capacitor structure of claim 1 , wherein the conductive layer and the polymer layer completely fill the trench structure.