IP Library › Granted Patent US 12,308,347
Granted Patent B2
US 12,308,347 · App. 17/718,145 · Granted May 20, 2025

Interconnected stacked circuits

Inventor: Didier Campos (Charavines, FR)
Assignee: STMicroelectronics (Grenoble 2) SAS
H01L25/0657H01L21/56H01L21/76802H01L23/3128H01L24/13H01L24/81
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Quick Facts
Patent No.
US 12,308,347
App. No.
17/718,145
Granted
May 20, 2025
Kind
B2
Abstract

The disclosure concerns an electronic device and methods of making an electronic device. The electronic device includes a circuit that is at least partially formed in an active region of a substrate. An electronic package is stacked on the substrate. A via extends through the circuit from the active region of the substrate to a surface of the substrate that is opposite the active region. At least one contacting element connects the via to the electronic package.

Claims (36)

1. An electronic device, comprising:

a substrate;

a circuit at least partially formed in an active region of the substrate;

an encapsulation block partially encapsulating the circuit, wherein the encapsulation block is formed of a plastic material containing additive particles activatable by a laser radiation;

an electronic package stacked on the substrate;

a via extending through said circuit from the active region of the substrate to a surface of the substrate opposite the active region; and

a contacting element connecting said via to the electronic package.

2. The electronic device of claim 1 , wherein said contacting element includes at least one of: a conductive track or a conductive pad.

3. The device of claim 1 , wherein the electronic package includes at least one solder bump.

4. The device of claim 1 , wherein said circuit is arranged on a support including an array of solder bumps.

5. The device of claim 1 , wherein said circuit is a microprocessor, a microcontroller, or an integrated system.

6. The device of claim 1 , wherein the electronic package includes at least one memory circuit.

7. The device of claim 1 , wherein said contacting element is arranged on the surface of the substrate.

8. The device of claim 1 , wherein the encapsulation block is at least partially surrounding the substrate, the surface of the substrate being at least partially uncovered by the encapsulation block.

9. The device of claim 8 , wherein said contacting element is arranged on a surface of the encapsulation block and on the surface of the substrate.

10. The device of claim 1 , wherein said contacting element is attached or anchored to areas, at a surface of the encapsulation block, where the additive particles, contained in the plastic material forming the encapsulation block, have been previously activated by a laser structuring technology.

11. The device of claim 1 , wherein said contacting element is at least partially formed by at least one chemical deposition in a metal bath.

12. An electronic device, comprising:

a substrate;

a circuit at least partially formed in an active region of the substrate;

an encapsulation layer at least partially surrounding the substrate, wherein the encapsulation layer includes a plastic material containing additive particles activatable by a laser radiation;

an electronic package on the substrate;

a via extending through the circuit from the active region of the substrate to a surface of the substrate opposite the active region; and

a contacting element connecting the via to the electronic package.

13. The device of claim 12 , wherein the electronic package includes at least one memory circuit.

14. An electronic device, comprising:

a substrate;

a circuit in an active portion of the substrate;

an electronic package stacked on the substrate;

a plurality of conductive vias formed across the circuit and the substrate;

contacting elements having a plurality of first conductive pads coupled to the plurality of conductive vias and arranged on an encapsulation layer, wherein the encapsulation layer includes a plastic material containing additive particles activatable by a laser radiation; and

a plurality of solder bumps interposed between the plurality of first conductive pads and a plurality of second conductive pads, wherein the circuit is connected to the electronic package via the plurality of solder bumps.

15. The electronic device of 14 , wherein a first side of the circuit is partially exposed.

16. The electronic device of 14 , wherein the contacting elements further comprise a conductive track at least partially arranged on the encapsulation layer.

17. The electronic device of 14 , further comprising a wafer having a first surface and a second surface opposite the first surface, wherein the first surface comprises a ball grid array.

18. The electronic device of 14 , wherein the electronic package comprises a chip having a first dimension and a second dimension, the first and second dimensions of the chip smaller than a first dimension and a second dimension of the circuit.

Priority Claims (1)
FR 1902807 · Mar 19, 2019 · national
Continuity (2)
Division 16818792 · Mar 13, 2020
Related Publication 20220238492A1 · Jul 28, 2022
References Cited (20)
US 9633924B1 · Yu · 2017 [cited by examiner]
US 11302672B2 · Campos · 2022 [cited by examiner]
US 20110149493A1 · Kwon · 2011 [cited by examiner]
US 20120286432A1 · Do · 2012 [cited by examiner]
US 20130082383A1 · Aoya · 2013 [cited by examiner]
US 20130171752A1 · Val · 2013 [cited by examiner]
US 20130200528A1 · Lin · 2013 [cited by examiner]
US 20130320471A1 · Luan · 2013 [cited by examiner]
US 20150348928A1 · Co · 2015 [cited by examiner]
US 20160358893A1 · Kwon · 2016 [cited by examiner]
US 20170033462A1 · Clemente · 2017 [cited by examiner]
US 20180061810A1 · Lin · 2018 [cited by examiner]
US 20180277495A1 · Chiu · 2018 [cited by examiner]
US 20180342433A1 · Ziglioli et al. · 2018 [cited by applicant]
US 20190164941A1 · Wu · 2019 [cited by examiner]
US 20200303348A1 · Campos · 2020 [cited by examiner]
US 20210233848A1 · Chung · 2021 [cited by examiner]
US 20220238492A1 · Campos · 2022 [cited by examiner]
US 20240088019A1 · Lee · 2024 [cited by examiner]
DE 102011007537A1 · 2012 [cited by applicant]