IP Library › Granted Patent US 12,322,440
Granted Patent B2
US 12,322,440 · App. 17/901,430 · Granted Jun 3, 2025

Programming operation of memory device being switched from high-density mode to high speed mode and/or lower power mode

Inventors: Violante Moschiano (Avezzano, IT); Andrea Smaniotto (Albignasego, IT)
Assignee: Micron Technology, Inc.
G11C11/5628G06F1/30G11C5/143G11C16/0483G11C16/10G11C16/30G11C2211/5641
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,322,440
App. No.
17/901,430
Granted
Jun 3, 2025
Kind
B2
Abstract

Memory devices and methods for operating the same are described. The memory devices may include non-volatile memory having a plurality of memory cells, and a controller. The controller may be configured to begin a first programming operation configured to program a first one of the plurality of memory cells with more than one bit of information, terminate the first programming operation in response to detecting a power loss event, and program, with a second programming operation, second and third ones of the plurality of memory cells with the more than one bit of information.

Claims (50)

1. A memory device, comprising:

a non-volatile memory comprising a plurality of memory cells; and

a controller configured to:

begin a first programming operation configured to program a plurality of bits of information to a first one of the plurality of memory cells, wherein the first one of the plurality of memory cells has been previously programmed with one or more additional bits of information,

terminate the first programming operation in response to receiving a command from a connected host device to switch from a high-density operation mode to a high speed mode and/or a lower power mode and without reference to a current or impending power loss event, and

program, with a second programming operation, a second one of the plurality of memory cells with the plurality of bits of information.

2. The memory device of claim 1 , wherein:

the first one of the plurality of memory cells is configured as a triple level cell which has already been programmed with the one or more additional bits of information as lower page data prior to the first programming operation, and

the first programming operation is configured to program the plurality of bits of information as upper page data and extra page data to the first one of the plurality of memory cells.

3. The memory device of claim 2 , wherein:

the second programming operation is configured to program the upper page data and the extra page data to the second one of the plurality of memory cells.

4. The memory device of claim 3 , wherein:

the second programming operation is further configured to program the lower page data to a third one of the plurality of memory cells.

5. The memory device of claim 3 , wherein:

each of the first one and the second one of the plurality of memory cells is configured as a multilevel cell (MLC), a triple level cell (TLC), or a quad level cell (QLC).

6. The memory device of claim 1 , wherein:

the second programming operation requires less energy to program the second one of the plurality of memory cells than the first programming operation would have taken to complete.

7. The memory device of claim 1 , wherein:

the second programming operation is configured to program the second one of the plurality of memory cells in less time than the first programming operation would have taken to complete.

8. The memory device of claim 1 , wherein:

the first programming operation is configured to program the first one of the plurality of memory cells with a first plurality of programming pulses, and

the second programming operation is configured to program the second one of the plurality of memory cells with fewer programming pulses than the first plurality of programming pulses.

9. A memory device, comprising:

a non-volatile memory comprising a plurality of memory cells; and

a controller configured to:

begin a first programming operation configured to program a plurality of bits of information to a first one of the plurality of memory cells, wherein the first one of the plurality of memory cells has been previously programmed with one or more additional bits of information,

terminate the first programming operation in response to receiving a command from a connected host device to switch from a high-density operation mode to a high speed mode and/or a lower power mode and without reference to a current or impending power loss event, and

program, with a second programming operation, each of a subset of the plurality of memory cells with one of the plurality of bits of information.

10. The memory device of claim 9 , wherein:

the first one of the plurality of memory cells is configured as a triple level cell which has already been programmed with the one or more additional bits of information as lower page data prior to the first programming operation, and

the first programming operation is configured to program the plurality of bits of information as upper page data and extra page data to the first one of the plurality of memory cells.

11. The memory device of claim 10 , wherein:

the second programming operation is configured to program the upper page data and the extra page data to the separate ones of the subset of the plurality of memory cells.

12. The memory device of claim 11 , wherein:

the second programming operation is further configured to program the lower page data to one of the subset of the plurality of memory cells.

13. The memory device of claim 11 , wherein:

each of the subset of the plurality of memory cells is configured as a single level cell (SLC).

14. The memory device of claim 9 , wherein:

the second programming operation requires less energy to program the subset of the plurality of memory cells than the first programming operation would have taken to complete.

15. The memory device of claim 9 , wherein:

the second programming operation is configured to program the subset of the plurality of memory cells in less time than the first programming operation would have taken to complete.

16. The memory device of claim 9 , wherein:

the first programming operation is configured to program the first one of the plurality of memory cells with a first plurality of programming pulses, and

the second programming operation is configured to program each of the subset of the plurality of memory cells with fewer programming pulses than the first plurality of programming pulses.

17. A method of operating a memory device having a plurality of memory cells, the method comprising:

initiating a first programming operation configured to program a plurality of bits of information to a first one of the plurality of memory cells, wherein the first one of the plurality of memory cells has been previously programmed with one or more additional bits of information,

terminating the first programming operation in response to receiving a command from a connected host device to switch from a high-density operation mode to a high speed mode and/or a lower power mode and without reference to a current or impending power loss event, and

programming, with a second programming operation, a second one of the plurality of memory cells with the plurality of bits of information.

18. The method of claim 17 , further comprising:

programming, with the second programming operation, a third one of the plurality of memory cells with the one or more additional bits of information.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 1, 2022
From: MOSCHIANO, VIOLANTE; SMANIOTTO, ANDREA
To: MICRON TECHNOLOGY, INC.
Reel/Frame 060969/0132 →
Continuity (3)
Continuation 16418016 · May 21, 2019
Division 15456175 · Mar 10, 2017
Related Publication 20220415389A1 · Dec 29, 2022
References Cited (20)
US 5844841A · Takeuchi et al. · 1998 [cited by applicant]
US 9530491B1 · Uttarwar et al. · 2016 [cited by applicant]
US 9570159B1 · Wakchaure et al. · 2017 [cited by applicant]
US 11437093B2 · Moschiano · 2022 [cited by examiner]
US 20060136758A1 · Yoon · 2006 [cited by applicant]
US 20100306446A1 · Villa et al. · 2010 [cited by applicant]
US 20110125975A1 · Kim et al. · 2011 [cited by applicant]
US 20110296087A1 · Kim et al. · 2011 [cited by applicant]
US 20120113740A1 · Lee · 2012 [cited by applicant]
US 20120173827A1 · Wood et al. · 2012 [cited by applicant]
US 20120191900A1 · Kunimatsu et al. · 2012 [cited by applicant]
US 20120240012A1 · Weathers et al. · 2012 [cited by applicant]
US 20140043896A1 · Park et al. · 2014 [cited by applicant]
US 20150363105A1 · Nakao et al. · 2015 [cited by applicant]
US 20160011806A1 · Zaltsman · 2016 [cited by examiner]
US 20160268000A1 · Thompson et al. · 2016 [cited by applicant]
US 20170139626A1 · Wakchaure et al. · 2017 [cited by applicant]
US 20170277245A1 · Paley · 2017 [cited by examiner]
US 20180122480A1 · Maeda · 2018 [cited by applicant]
US 20190272872A1 · Moschiano et al. · 2019 [cited by applicant]