Semiconductor package and method of manufacturing the semiconductor package
Provided is a mounting substrate for a semiconductor package, including a substrate having an upper surface and a lower surface opposite to each other, the substrate including a plurality of insulation layers and wirings in the plurality of insulation layers, first substrate pads and second substrate pads on the upper surface in a chip mounting region of the mounting surface, heat absorbing pads on the upper surface in a peripheral region of the mounting surface adjacent to the chip mounting region, and connection lines in the substrate, the connection lines being configured to thermally couple the heat absorbing pads and the second substrate pads to each other.
1. A semiconductor package, comprising:
a mounting substrate including a substrate having an upper surface and a lower surface opposite to each other and including wirings provided respectively in a plurality of insulation layers, first substrate pads and second substrate pads on the upper surface arranged in a chip mounting region, heat absorbing pads, configured to absorb heat, on the upper surface arranged in a peripheral region surrounding the chip mounting region, and connection lines comprising conductive material and configured to transfer heat from the heat absorbing pads to the second substrate pads;
a semiconductor chip disposed within the chip mounting region of the mounting substrate; and
first and second bumps interposed between the semiconductor chip and the mounting substrate, the first and second bumps being bonded to the first and second substrate pads respectively,
wherein the second bump is thermally connected to the heat absorbing pad by the connection line and the second substrate pad.
2. The semiconductor package of claim 1 , wherein the first bump is provided on a chip pad of the semiconductor chip, and the second bump is provided on an insulation layer pattern that exposes the chip pad.
3. The semiconductor package of claim 2 , wherein the insulation layer pattern includes photosensitive polyimide.
4. The semiconductor package of claim 1 , wherein the heat absorbing pads and the second substrate pads are provided in the same insulation layer.
5. The semiconductor package of claim 1 , wherein the second substrate pad has a first thickness, and the heat absorbing pad has a second thickness greater than the first thickness.
6. The semiconductor package of claim 1 , wherein a length of one side of the heat absorbing pad is within a range of 0.5 mm to 3.0 mm.
7. The semiconductor package of claim 1 , wherein the connection line is provided in an insulation layer different from an insulation layer on which the second substrate pad is provided.
8. The semiconductor package of claim 7 , wherein the connection line includes a via structure that thermally connects the second substrate pad and the heat absorbing pad to each other.
9. The semiconductor package of claim 1 , wherein an outer surface of the heat absorbing pad is exposed to the outside from one side portion of the substrate.
10. The semiconductor package of claim 9 , wherein the mounting substrate further includes a connection pad line that extends along the side portion of the substrate and connects the heat absorbing pads to each other.