Metrology method, target and substrate
A diffraction measurement target that has at least a first sub-target and at least a second sub-target, and wherein (1) the first and second sub-targets each include a pair of periodic structures and the first sub-target has a different design than the second sub-target, the different design including the first sub-target periodic structures having a different pitch, feature width, space width, and/or segmentation than the second sub-target periodic structure or (2) the first and second sub-targets respectively include a first and second periodic structure in a first layer, and a third periodic structure is located at least partly underneath the first periodic structure in a second layer under the first layer and there being no periodic structure underneath the second periodic structure in the second layer, and a fourth periodic structure is located at least partly underneath the second periodic structure in a third layer under the second layer.
1. A method comprising:
illuminating with radiation a diffraction measurement target on a substrate, the measurement target comprising at least a first sub-target, a second sub-target, a third sub-target and a fourth sub-target, wherein the first, second, third and fourth sub-targets are different in design with at least one sub-target of the first to fourth sub-targets being at least partly on a different layer than the other of the first to fourth sub-targets and at least two sub-targets of the first to fourth sub-targets being at least partly on a same layer.
2. The method of claim 1 , wherein the different design comprises one of the first to fourth sub-targets having a different pitch, feature width, space width, and/or segmentation than another of the first to fourth sub-targets.
3. The method of claim 1 , wherein the first sub-target at least partly overlays a first periodic structure, the second sub-target at least partly overlays a second periodic structure, and the third sub-target at least partly overlays a third periodic structure, wherein the first periodic structure is at a different layer on the substrate than the second and third periodic structures and the second periodic structure is at a different layer on the substrate than the first and third periodic structures.
4. The method of claim 1 , wherein the illuminating comprises illuminating a measurement spot on the diffraction measurement target that covers at one time at least part of each of a periodic structure of the first to fourth sub-targets.
5. The method of claim 1 , wherein at least part of a periodic structure of each of the first to fourth sub-targets is within a contiguous area of less than or equal to 400 μm 2 on the substrate.
6. The method of claim 1 , wherein each of the first to fourth sub-targets is designed for a different process stack for the substrate.
7. The method of claim 1 , wherein each of the first to fourth sub-targets is designed for a different layer-pair for multiple layer overlay measurement.
8. A diffraction metrology target comprising at least a first sub-target, a second sub-target, a third sub-target and a fourth sub-target, wherein the first, second, third and fourth sub-targets are different in design with at least one sub-target of the first to fourth sub-targets being at least partly on a different layer than the other of the first to fourth sub-targets and at least two sub-targets of the first to fourth sub-targets being at least partly on a same layer.
9. The target of claim 8 , wherein the different design comprises one of the first to fourth sub-targets having a different pitch, feature width, space width, and/or segmentation than another of the first to fourth sub-targets.
10. The target of claim 8 , wherein at least part of a periodic structure of each of the first to fourth sub-targets is within a contiguous area of less than or equal to 400 μm 2 .
11. The target of claim 8 , wherein each of the first to fourth sub-targets is designed for a different process stack for a substrate.
12. The target of claim 8 , wherein each of the first to fourth sub-targets is designed for a different layer-pair for multiple layer overlay measurement.
13. A method comprising:
illuminating a first sub-target of a measurement target on a substrate with radiation having a first wavelength, and illuminating a second sub-target of the measurement target on the substrate with radiation having a second wavelength different from the first wavelength, wherein the first wavelength is selected for the first sub-target and the second wavelength is selected for the second sub-target; and
detecting at least some of the radiation coming from the first sub-target and at least some of the radiation coming from the second sub-target to obtain for the measurement target a measurement representing a parameter of a lithographic process,
wherein a value of the parameter is obtained from the first sub-target using the first wavelength without using the second wavelength and from the second sub-target using the second wavelength without using the first wavelength.
14. The method of claim 13 , wherein the first and second sub-targets are different in design.
15. The method of claim 13 , wherein first and second periodic structures of the second sub-target meet at a central portion of the measurement target and first and second periodic structures of the first sub-target are arranged around a periphery of the first and second periodic structures of the second sub-target.
16. The method of claim 13 , wherein the illuminating comprises illuminating the first sub-target with radiation having a first polarization and illuminating the second sub-target of the measurement target on the substrate with radiation having a second polarization, wherein the first polarization is different from the second polarization.
17. The method of claim 13 , wherein at least part of the first sub-target is located on a different layer than at least part of the second sub-target.
18. The method of claim 13 , wherein the measurement target has an area of less than or equal to 1000 μm 2 on the substrate.
19. The method of claim 13 , wherein the parameter of the lithographic process is overlay.
20. A non-transitory computer program product comprising machine-readable instructions therein, the instructions, upon execution by a computer system, configured to cause the computer system to at least:
cause illumination of a first sub-target of a measurement target on a substrate with radiation having a first wavelength, and illumination of a second sub-target of the measurement target on the substrate with radiation having a second wavelength different from the first wavelength, wherein the first wavelength is selected for the first sub-target and the second wavelength is selected for the second sub-target; and
cause detection of at least some of the radiation coming from the first sub-target and at least some of the radiation coming from the second sub-target to obtain for the measurement target a measurement representing a parameter of a lithographic process,
wherein a value of the parameter is obtained from the first sub-target using the first wavelength without using the second wavelength and from the second sub-target using the second wavelength without using the first wavelength.