IP Library › Granted Patent US 12,519,028
Granted Patent B2
US 12,519,028 · App. 17/959,580 · Granted Jan 6, 2026

Package structure including a side heat dissipator and method for manufacturing the package structure

Inventors: Ying Li (Suzhou, CN); Longhao Piao (Suzhou, CN)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H01L23/3675H01L21/4882H01L21/563H01L23/3677H01L24/11H01L24/16H01L24/32H01L24/73H01L23/552H01L2224/119H01L2224/16225H01L2224/32225H01L2224/73204H01L2924/1616H01L2924/16195H01L2924/16235H01L2924/16251H01L2924/16315H01L2924/1632H01L2924/3511H01L2924/384
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Quick Facts
Patent No.
US 12,519,028
App. No.
17/959,580
Filed
Oct 4, 2022
Granted
Jan 6, 2026
Kind
B2
Art Unit
2892
USPC
257/712
Abstract

Provided is a package structure, including a substrate, a chip on the substrate in a flip-chip manner, the chip including a circuit layer, and a side heat dissipator on a side of the chip, the side heat dissipator comprising a heat conduction material, wherein the side heat dissipator is electrically connected to the circuit layer.

Claims (60)

1 . A package structure, comprising:

a substrate;

a chip on the substrate in a flip-chip manner, the chip comprising a circuit layer;

a side heat dissipator on a side of the chip, the side heat dissipator comprising a heat conduction material;

a plurality of connectors between the chip and the substrate and configured to electrically connect the circuit layer included in the chip and the substrate; and

a connection portion on a lower surface of the chip facing the substrate and between a connector of the plurality of connectors and the side heat dissipator, the connection portion being configured to electrically connect the connector with the side heat dissipator,

wherein the side heat dissipator is electrically connected to the circuit layer.

2 . The package structure of claim 1 , further comprising:

a side heat conduction layer comprising a thermal interface material and between the side of the chip and the side heat dissipator, the side heat conduction layer directly contacting at least one of the chip and the side heat dissipator,

wherein an upper surface of the side heat conduction layer, an upper surface of the chip and an upper surface of the side heat dissipator are coplanar.

3 . The package structure of claim 1 , further comprising:

an upper heat conduction layer in contact with an upper surface of the chip; and

a heat dissipation cover in contact with an upper surface of the upper heat conduction layer,

wherein the upper heat conduction layer comprises a thermal interface material,

wherein the heat dissipation cover comprises a heat conduction material,

wherein at least one of the upper heat conduction layer and the heat dissipation cover has a flat plate shape.

4 . The package structure of claim 3 , wherein the heat dissipation cover comprises a cover portion having a flat plate shape and a wall portion extending downward from a peripheral part of the cover portion, a central part of the cover portion being in direct contact with the upper surface of the upper heat conduction layer.

5 . The package structure of claim 1 , wherein each of the plurality of connectors comprises an under bump metal, a bump and a solder ball disposed in sequence from the chip toward the substrate,

wherein the side heat dissipator comprises a material that is the same as a material of the bump, and

wherein the connection portion comprises a material that is the same as a material of the under bump metal, and is in a layer that is the same as a layer of the under bump metal.

6 . The package structure of claim 1 , wherein the side heat dissipator connects to a first signal, and

wherein the first signal is a chip signal or a dummy signal.

7 . The package structure of claim 6 , wherein the first signal is, among chip signals, the chip signal with the greatest current, at least one of the chip signals with top-three-greatest current, at least one of the chip signals with top-five-greatest current, or at least one of the chip signals with top-ten-greatest current.

8 . The package structure of claim 1 , further comprising:

a filler comprising at least one of an underfill, a non-conductive paste, and a non-conductive film and filling a space between the chip and the substrate.

9 . A method for manufacturing a package structure, comprising:

forming a side heat dissipator on a side of a chip, the side heat dissipator comprising a heat conduction material;

mounting the chip on a substrate in a flip-chip manner, the chip comprising a circuit layer;

forming a plurality of connectors between the chip and the substrate, the plurality of connectors being configured to electrically connect the circuit layer included in the chip and the substrate; and

forming a connection portion on a lower surface of the chip facing the substrate and between a connector of the plurality of connectors and the side heat dissipator, the connection portion being configured to electrically connect the connector with the side heat dissipator,

wherein the side heat dissipator is electrically connected to the circuit layer of the chip.

10 . The method of claim 9 , further comprising:

forming a side heat conduction layer, comprising a thermal interface material, between the side of the chip and the side heat dissipator, the side heat conduction layer directly contacting at least one of the chip and the side heat dissipator,

wherein an upper surface of the side heat conduction layer, an upper surface of the chip and an upper surface of the side heat dissipator are coplanar.

11 . The method of claim 9 , further comprising:

forming an upper heat conduction layer on an upper surface of the chip; and

forming a heat dissipation cover on an upper surface of the upper heat conduction layer,

wherein the upper heat conduction layer comprises a thermal interface material,

wherein the heat dissipation cover comprises a heat conduction material,

wherein at least one of the upper heat conduction layer and the heat dissipation cover has a flat plate shape.

12 . The method of claim 11 , wherein forming the heat dissipation cover comprises forming a cover portion having a flat plate shape and a wall portion extending downward from a peripheral part of the cover portion, a central part of the cover portion being in direct contact with the upper surface of the upper heat conduction layer.

13 . The method of claim 9 , wherein forming the plurality of connectors comprises forming an under bump metal, a bump and a solder ball in sequence from the chip toward the substrate,

wherein the side heat dissipator comprises a material that is the same as a material of the bump, and

wherein the connection portion comprises a material that is the same as a material of the under bump metal, and is in a layer that is the same as a layer of the under bump metal.

14 . The method of claim 9 , wherein the side heat dissipator connects to a first signal, and

wherein the first signal is a chip signal or a dummy signal.

15 . The method of claim 14 , wherein the first signal is, among chip signals, the chip signal with the greatest current, at least one of the chip signals with top-three-greatest current, at least one of the chip signals with top-five-greatest current, or at least one of the chip signals with top-ten-greatest current.

16 . The method of claim 9 , further comprising:

forming a filler comprising at least one of an underfill, a non-conductive paste, and a non-conductive film and filling a space between the chip and the substrate.

17 . A package structure, comprising:

a substrate;

a chip on the substrate in a flip-chip manner, the chip comprising a circuit layer;

a side heat dissipator on a side of the chip, the side heat dissipator comprising a heat conduction material;

a side heat conduction layer between the side of the chip and the side heat dissipator, the side heat conduction layer comprising a thermal interface material;

an upper heat conduction layer in contact with an upper surface of the chip;

a heat dissipation cover in contact with an upper surface of the upper heat conduction layer;

a plurality of connectors between the chip and the substrate and configured to electrically connect the circuit layer included in the chip and the substrate; and

a connection portion on a lower surface of the chip facing the substrate and between a connector of the plurality of connectors and the side heat dissipator, the connection portion being configured to electrically connect the connector with the side heat dissipator,

wherein the side heat dissipator is electrically connected to the circuit layer.

18 . The package structure of claim 17 , wherein the side heat conduction layer contacts at least one of the chip and the side heat dissipator.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 4, 2022
From: LI, YING; PIAO, LONGHAO
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 061304/0511 →
Priority Claims (1)
CN 202210123951.2 · Feb 10, 2022 · national
Continuity (1)
Related Publication 20230253285A1 · Aug 10, 2023
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