Method and apparatus for debonding temporarily bonded wafers in wafer-level packaging applications
A method for debonding a wafer from a bonded wafer stack is disclosed. Initially, a light-absorbing layer is placed on a carrier. A wafer is then attached to the light-absorbing layer of the carrier via an adhesive layer to form a bonded wafer stack. After processing the wafer has been processed, a light pulse from a flashlamp is applied to a non-wafer side of the carrier to heat the light-absorbing layer and the adhesive layer in order to loosen the wafer from the bonded wafer stack. Finally, the wafer is removed from the bonded wafer stack.
1 . A flashlamp debonding system for debonding a manufacturing assembly comprising an electronics structure, wherein the electronics structure is temporarily bonded to a remainder of the manufacturing assembly, the flashlamp debonding system comprising:
a flashlamp configured to emit light pulses to illuminate the manufacturing assembly for debonding the electronics structure from the remainder of the manufacturing assembly;
a flashlamp control subsystem for controlling the flashlamp, the flashlamp control subsystem comprising:
a capacitive device; and
an electronic switch device; and
a debonding subsystem including:
a support configured to support the manufacturing assembly;
a feeder configured to feed the manufacturing assembly to the support for receiving illumination from the flashlamp; and
a separator configured to separate the electronics structure from the remainder of the manufacturing assembly after the manufacturing assembly has received illumination from the flashlamp.
2 . The system of claim 1 , wherein the debonding subsystem comprises at least one vacuum device.
3 . The system of claim 2 , wherein the at least one vacuum device is configured to apply distributed pressure across the electronics structure.
4 . The system of claim 2 , wherein the at least one vacuum device comprises a plurality of suction cups.
5 . The system of claim 2 , wherein the support comprises the at least one vacuum device, and wherein the separator comprises at least one gripper for separating the remainder of the manufacturing assembly from the electronics structure.
6 . The system of claim 5 , wherein the gripper comprises a vacuum gripper.
7 . The system of claim 1 , wherein the support is configured to retain the electronics structure while the separator separates the electronics structure from the remainder of the manufacturing assembly.
8 . The system of claim 1 , the flashlamp control subsystem further comprising a frequency controller configured to modulate a current flowing from the capacitive device to the electronic switch device to cause the flashlamp to emit light pulses.
9 . The system of claim 1 , wherein the electronic switch device comprises one of an IGBT-based switching device or a silicon controlled rectifier switching device.
10 . The system of claim 1 , wherein the debonding subsystem is configured to convey the manufacturing assembly relative to the flashlamp while light pulses are emitted by the flashlamp.
11 . The system of claim 10 , wherein the manufacturing assembly comprises a plurality of debonding regions; and
wherein the debonding subsystem is configured to convey the manufacturing assembly relative to the flashlamp such that each one of the plurality of debonding regions is exposed to illumination from the flashlamp.
12 . The system of claim 1 , wherein the feeding device comprises a robot.
13 . The system of claim 1 , further comprising a flashlamp calibration subsystem;
wherein the flashlamp calibration subsystem is configured to determine a flashlamp calibration factor based on an energy parameter of a reference light pulse emitted by the flashlamp; and
wherein the flashlamp control subsystem is configured to control the flashlamp as a function of the flashlamp calibration factor.
14 . The system of claim 13 , wherein the flashlamp calibration subsystem comprises a first light sensor and a second light sensor, wherein the determination of the flashlamp calibration criterion comprises comparing a first signal generated by the first light sensor in response to the reference light pulse with a second signal generated by the second light sensor in response to the reference light pulse.
15 . The system of claim 14 , wherein the first light sensor comprises a photodiode and the second light sensor comprises a bolometer.
16 . The system of claim 13 , wherein the flashlamp calibration subsystem is further configured to determine an energy parameter of at least one light pulse emitted by the flashlamp for debonding the electronics structure from the remainder of the manufacturing assembly.