IP Library › Granted Patent US 12,588,461
Granted Patent B2
US 12,588,461 · App. 18/647,126 · Granted Mar 24, 2026

Substrate processing method and substrate processing apparatus

Inventors: Hiroki Sakurai (Koshi, JP); Kazuki Kosai (Koshi, JP); Kazuyoshi Shinohara (Koshi, JP)
Assignee: Tokyo Electron Limited
H01L21/67253B08B3/022B08B13/00H01L21/67023
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Quick Facts
Patent No.
US 12,588,461
App. No.
18/647,126
Granted
Mar 24, 2026
Kind
B2
Abstract

A method includes: supplying a processing liquid to a center position of a substrate surface; shifting a supply position of the processing liquid from the center position to a first eccentric position; holding the supply position of the processing liquid at the first eccentric position and supplying a substitute liquid to a second eccentric position; shifting the supply position of the processing liquid in a direction away from the center position, and shifting a supply position of the substitute liquid to the center position; and supplying the processing liquid to the first eccentric position at a first flow rate, and reducing the flow rate of the processing liquid to a second flow rate after the supply position of the processing liquid starts to be shifted from the first eccentric position in the direction and until the supply position of the substitute liquid reaches the center position.

Claims (37)

1 . A control device that controls a substrate processing apparatus,

wherein the substrate processing apparatus comprises:

a chuck configured to hold a substrate;

a rotation mechanism configured to rotate the chuck;

a first nozzle configured to supply a processing liquid to a substrate surface of the substrate which is rotating;

a first flow rate controller configured to control a flow rate of the processing liquid supplied from the first nozzle;

a first movement mechanism configured to move the first nozzle and shift a supply position of the processing liquid in a radial direction of the substrate surface;

a second nozzle configured to supply a substitute liquid to the substrate surface of the substrate which is rotating;

a second flow rate controller configured to control a flow rate of the substitute liquid supplied from the second nozzle; and

a second movement mechanism configured to move the second nozzle and shift a supply position of the substitute liquid in the radial direction of the substrate surface, and

wherein the control device controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

supplying a processing liquid to a center position of a substrate surface of a rotating substrate;

shifting a supply position of the processing liquid from the center position to a first eccentric position;

supplying a substitute liquid for substituting the processing liquid to a second eccentric position different from the first eccentric position; and

shifting the supply position of the processing liquid from the first eccentric position in a direction away from the center position, and shifting a supply position of the substitute liquid from the second eccentric position to the center position.

2 . The control device of claim 1 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

supplying the processing liquid to the first eccentric position at a first flow rate, and reducing the flow rate of the processing liquid from the first flow rate to a second flow rate after the supply position of the processing liquid starts to be shifted from the first eccentric position in the direction away from the center position and until the supply position of the substitute liquid reaches the center position.

3 . The control device of claim 2 , wherein a timing at which the flow rate of the processing liquid is reduced from the first flow rate to the second flow rate is before the supply position of the substitute liquid reaches the center position.

4 . The control device of claim 3 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

continuously shifting the supply position of the processing liquid in the direction away from the center position in a state in which the supply position of the substitute liquid is fixed at the center position.

5 . The control device of claim 3 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

supplying the substitute liquid to the second eccentric position at a third flow rate and increasing the flow rate of the substitute liquid from the third flow rate to a fourth rate when the supply position of the processing liquid starts to be shifted from the first eccentric position in the direction away from the center position.

6 . The control device of claim 3 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

rotating the substrate surface at a first rotation speed when supplying the processing liquid to the first eccentric position, and reducing the rotation speed of the substrate surface to be smaller than the first rotation speed at any timing between start of shifting the supply position of the processing liquid from the first eccentric position in the direction away from the center position and completion of shifting the supply position of the substitute liquid from the second eccentric position to the center position.

7 . The control device of claim 2 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

continuously shifting the supply position of the processing liquid in the direction away from the center position in a state in which the supply position of the substitute liquid is fixed at the center position.

8 . The control device of claim 2 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

supplying the substitute liquid to the second eccentric position at a third flow rate and increasing the flow rate of the substitute liquid from the third flow rate to a fourth rate when the supply position of the processing liquid starts to be shifted from the first eccentric position in the direction away from the center position.

9 . The control device of claim 2 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

rotating the substrate surface at a first rotation speed when supplying the processing liquid to the first eccentric position, and reducing the rotation speed of the substrate surface to be smaller than the first rotation speed at any timing between start of shifting the supply position of the processing liquid from the first eccentric position in the direction away from the center position and completion of shifting the supply position of the substitute liquid from the second eccentric position to the center position.

10 . The control device of claim 1 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

continuously shifting the supply position of the processing liquid in the direction away from the center position in a state in which the supply position of the substitute liquid is fixed at the center position.

11 . The control device of claim 1 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

supplying the substitute liquid to the second eccentric position at a third flow rate and increasing the flow rate of the substitute liquid from the third flow rate to a fourth rate when the supply position of the processing liquid starts to be shifted from the first eccentric position in the direction away from the center position.

12 . The control device of claim 1 , wherein the control device further controls the rotation mechanism, the first movement mechanism, the first flow rate controller, the second movement mechanism, and the second flow rate controller to execute:

rotating the substrate surface at a first rotation speed when supplying the processing liquid to the first eccentric position, and reducing the rotation speed of the substrate surface to be smaller than the first rotation speed at any timing between start of shifting the supply position of the processing liquid from the first eccentric position in the direction away from the center position and completion of shifting the supply position of the substitute liquid from the second eccentric position to the center position.

13 . A non-transitory computer-readable storage medium storing a program that causes the control device of claim 1 to control the substrate processing apparatus.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 7, 2024
From: SAKURAI, HIROKI; KOSAI, KAZUKI; SHINOHARA, KAZUYOSHI
To: TOKYO ELECTRON LIMITED
Reel/Frame 067336/0765 →
Priority Claims (1)
JP 2020-037866 · Mar 5, 2020 · national
Continuity (3)
Continuation 18297042 · Apr 7, 2023
Continuation 17905551
Related Publication 20240290639A1 · Aug 29, 2024
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