IP Library › Granted Patent US 12,630,570
Granted Patent B2
US 12,630,570 · App. 17/708,323 · Granted May 19, 2026

Organometallic adduct compound and method of manufacturing integrated circuit device by using the same

Inventors: Seungmin Ryu (Hwaseong-si, KR); Younsoo Kim (Yongin-si, KR); Jaewoon Kim (Seoul, KR); Kazuki Harano (Tokyo, JP); Kazuya Saito (Tokyo, JP); Takanori Koide (Tokyo, JP); Yutaro Aoki (Tokyo, JP); Gyuhee Park (Hwaseong-si, KR); Younjoung Cho (Hwaseong-si, KR); Wakana Fuse (Tokyo, JP); Yoshiki Manabe (Tokyo, JP); Hiroyuki Uchiuzou (Tokyo, JP); Masayuki Kimura (Tokyo, JP); Takahiro Yoshii (Tokyo, JP)
Assignees: SAMSUNG ELECTRONICS CO., LTD.; ADEKA CORPORATION
C07F9/005C23C16/34C23C16/45553H10B12/033H10D1/692
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Quick Facts
Patent No.
US 12,630,570
App. No.
17/708,323
Granted
May 19, 2026
Kind
B2
Abstract

An organometallic adduct compound and a method of manufacturing an integrated circuit device, the organometallic adduct compound being represented by General Formula (I):

Claims (75)

1 . An organometallic adduct compound represented by General Formula (I):

wherein, in General Formula (I),

R 1 , R 2 , R 3 , R 4 , and R 5 are each independently

a hydrogen atom,

a halogen atom,

a substituted or unsubstituted C1 to C5 linear alkyl group,

a substituted or unsubstituted C3 to C5 branched alkyl group,

a substituted or unsubstituted C2 to C5 linear alkenyl group, or

a substituted or unsubstituted C3 to C5 branched alkenyl group,

at least one of R 1 , R 2 , R 3 , R 4 , and R 5 is

a fluorine atom,

a fluorine atom-substituted C1 to C5 linear alkyl group,

a fluorine atom-substituted C3 to C5 branched alkyl group,

a fluorine atom-substituted C2 to C5 linear alkenyl group, or

a fluorine atom-substituted C3 to C5 branched alkenyl group

X is a halogen atom, and

M is a niobium atom or a tantalum atom.

2 . The organometallic adduct compound as claimed in claim 1 , wherein at least one of R 1 , R 2 , R 3 , R 4 , and R 5 is a fluorine atom.

3 . The organometallic adduct compound as claimed in claim 1 , wherein at least one of R 1 and R 2 is a fluorine atom.

4 . The organometallic adduct compound as claimed in claim 1 , wherein:

M is a niobium atom, and

at least one of R 1 , R 2 , R 3 , R 4 , and R 5 is a fluorine atom.

5 . The organometallic adduct compound as claimed in claim 1 , wherein:

X is a fluorine atom or a chlorine atom,

M is a niobium atom, and

at least one of R 1 , R 2 , R 3 , R 4 , and R 5 is a fluorine atom.

6 . The organometallic adduct compound as claimed in claim 1 , wherein:

M is a niobium atom.

7 . The organometallic adduct compound as claimed in claim 1 , wherein:

X is a fluorine atom or a chlorine atom, and

at least one of R 1 , R 2 , R 3 , R 4 , and R 5 includes a fluorine atom.

8 . The organometallic adduct compound as claimed in claim 1 , wherein:

X is a fluorine atom.

9 . A method of manufacturing an integrated circuit device, the method comprising forming a metal-containing film on a substrate by using an organometallic adduct compound represented by General Formula (I):

wherein, in General Formula (I),

R 1 , R 2 , R 3 , R 4 , and R 5 are each independently

a hydrogen atom,

a halogen atom,

a substituted or unsubstituted C1 to C5 linear alkyl group,

a substituted or unsubstituted C3 to C5 branched alkyl group,

a substituted or unsubstituted C2 to C5 linear alkenyl group, or

a substituted or unsubstituted C3 to C5 branched alkenyl group,

at least one of R 1 , R 2 , R 3 , R 4 , and R 5 is

a fluorine atom,

a fluorine atom-substituted C1 to C5 linear alkyl group,

a fluorine atom-substituted C3 to C5 branched alkyl group,

a fluorine atom-substituted C2 to C5 linear alkenyl group, or

a fluorine atom-substituted C3 to C5 branched alkenyl group

X is a halogen atom, and

M is a niobium atom or a tantalum atom.

10 . The method as claimed in claim 9 , wherein, in General Formula (I), at least one of R 1 , R 2 , R 3 , R 4 , and R 5 is a fluorine atom.

11 . The method as claimed in claim 9 , wherein, in General Formula (I), at least one of R 1 and R 2 is a fluorine atom.

12 . The method as claimed in claim 9 , wherein, in General Formula (I):

X is a fluorine atom or a chlorine atom,

M is a niobium atom, and

at least one of R 1 , R 2 , R 3 , R 4 , and R 5 is a fluorine atom.

13 . The method as claimed in claim 9 , wherein forming the metal-containing film includes:

supplying the organometallic adduct compound represented by General Formula (I) onto the substrate; and

supplying a reactive gas onto the substrate.

14 . The method as claimed in claim 13 , wherein the reactive gas includes NH 3 , N 2 plasma, an organic amine compound, a hydrazine compound, or a combination thereof.

15 . The method as claimed in claim 9 , wherein, in General Formula (I):

M is a niobium atom, and

forming the metal-containing film includes forming an NbN film.

16 . An organometallic adduct compound represented by General Formula (I):

wherein, in General Formula (I),

R 1 , R 2 , R 3 , R 4 , and R 5 are each independently

a hydrogen atom,

a halogen atom,

a substituted or unsubstituted C1 to C5 linear alkyl group,

a substituted or unsubstituted C3 to C5 branched alkyl group,

a substituted or unsubstituted C2 to C5 linear alkenyl group, or

a substituted or unsubstituted C3 to C5 branched alkenyl group,

at least one of R 1 , R 2 , R 3 , R 4 , and R 5 is a halogen atom,

X is a halogen atom, and

M is a niobium atom or a tantalum atom.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2022
From: RYU, SEUNGMIN; KIM, YOUNSOO; KIM, JAEWOON; HARANO, KAZUKI; SAITO, KAZUYA; KOIDE, TAKANORI; AOKI, YUTARO; PARK, GYUHEE; CHO, YOUNJOUNG; FUSE, WAKANA; MANABE, YOSHIKI; UCHIUZOU, HIROYUKI; KIMURA, MASAYUKI; YOSHII, TAKAHIRO
To: SAMSUNG ELECTRONICS CO., LTD.; ADEKA CORPORATION
Reel/Frame 059546/0659 →
Priority Claims (2)
KR 10-2021-0043507 · Apr 2, 2021 · national
KR 10-2021-0123465 · Sep 15, 2021 · national
Continuity (1)
Related Publication 20220324887A1 · Oct 13, 2022
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