System and method for fast magnetometer calibration using gyroscope
An electronic device includes a magnetometer that outputs magnetometer sensor signals and a gyroscope that outputs gyroscope sensor signals. The electronic device includes a magnetometer calibration module that calibrates the magnetometer utilizing the gyroscope sensor signals. The electronic device generates a first magnetometer calibration parameter based on a Kalman filter process. The electronic device generates a second magnetometer calibration parameter based on a least squares estimation process.
1 . A method, comprising:
generating gyroscope sensor signals with a gyroscope of an electronic device;
generating magnetometer sensor signals with a magnetometer of the electronic device;
estimating a first magnetometer calibration parameter by performing a first analysis process with the gyroscope sensor signals and the magnetometer sensor signals;
estimating a second magnetometer calibration parameter by performing a second analysis process different than the first analysis process with the gyroscope sensor signals and the magnetometer sensor signals;
validating the first and second magnetometer calibration parameters by analyzing a convergence between the first magnetometer calibration parameter and the second magnetometer calibration parameter; and
simultaneously operating multiple instances of the first analysis process and the second analysis process, wherein the multiple instances of the first analysis process are offset from each other in time, wherein simultaneously operating multiple instances of the first analysis process includes continuously calibrating the magnetometer.
2 . The method of claim 1 , wherein estimating the first magnetometer calibration parameter includes determining a hard iron offset.
3 . The method of claim 2 , wherein estimating the hard iron offset includes minimizing an error constraint on a total magnetic field based, in part, on the gyroscope sensor signals.
4 . The method of claim 1 , wherein estimating the second magnetometer calibration includes determining a hard iron offset.
5 . The method of claim 4 , wherein estimating the hard iron offset includes minimizing an error between a first derivative of magnetic field and a gyroscope propagated magnetic field.
6 . The method of claim 1 , wherein validating the first and second magnetometer calibration parameters includes determining a difference between the first and second magnetometer calibration parameters.
7 . The method of claim 1 , wherein the first analysis process is a Kalman filter.
8 . The method of claim 7 , wherein the second analysis process is a least squares process.
9 . The method of claim 8 , wherein the multiple instances of the Kalman filter and the least squares process are offset from each other in time.
10 . The method of claim 1 , further comprising determining an orientation of the electronic device based on the first and second magnetometer calibration parameters.
11 . An electronic device, comprising:
a gyroscope configured to output gyroscope sensor signals;
a magnetometer configured to output magnetometer sensor signals; and
a magnetometer calibration module configured to receive the gyroscope sensor signals and the magnetometer sensor signals and to generate a first magnetometer calibration parameter with a first analysis process with the gyroscope sensor signals and the magnetometer sensor signals and to generate a second magnetometer calibration parameter based on a second analysis process different than the first analysis process with the gyroscope sensor signals and the magnetometer sensor signals, wherein the magnetometer calibration module is configured to simultaneously operate multiple instances of the first analysis process and the second analysis process to continuously calibrate the magnetometer, wherein the multiple instances of the first analysis process and the second analysis process are offset from each other in time.
12 . The electronic device of claim 11 , wherein the magnetometer calibration module is configured to validate the first and second magnetometer calibration parameters based on a convergence of the first magnetometer calibration parameter and the second magnetometer calibration parameter.
13 . The electronic device of claim 12 , further comprising a sensor processor configured to receive the at least one of the first and second magnetometer calibration parameters and to determine an orientation of the magnetometer based on at least one of the first and second magnetometer calibration parameters.
14 . The electronic device of claim 11 , wherein the magnetometer calibration module is configured to determine a first hard iron offset with the first analysis process.
15 . The electronic device of claim 14 , wherein the magnetometer calibration module is configured to determine a second hard iron offset with the second analysis process.
16 . The electronic device of claim 15 , wherein the first analysis process is a Kalman filter and the second analysis process is a least squares process.
17 . The electronic device of claim 11 , further comprising:
at least one memory configured to store software instructions; and
at least one processor configured to execute the software instructions, wherein the magnetometer calibration module is a software module implemented by executing the software instructions with the at least one processor.
18 . A method, comprising:
generating a first magnetometer calibration parameter by performing a first analysis process on gyroscope sensor signals and magnetometer sensor signals;
generating a second magnetometer calibration parameter by performing a second analysis process different than the first analysis process with the gyroscope sensor signals and the magnetometer sensor signals;
validating the first and second magnetometer calibration parameters by comparing the first and second magnetometer calibration parameters;
determining an orientation of the electronic device based on the magnetometer sensor signals and at least one of the first and second magnetometer calibration parameters; and
continuously calibrate the magnetometer sensor by simultaneously operating multiple instances of the first analysis process and the second analysis process, wherein the multiple instances of the first analysis process and the second analysis process are offset from each other in time.
19 . The method of claim 18 , further comprising determining a heading of the electronic device based on the magnetometer sensor signals and at least one of the first and second magnetometer calibration parameters.
20 . The method of claim 18 , wherein the electronic device is a virtual reality headset or an augmented reality headset.