IP Library Granted Patent US 12,707,938
Granted Patent B2
US 12,707,938 · App. 18/448,638 · Granted Aug 11, 2026

Susceptor for semiconductor substrate processing

Inventors: Saket Rathi (Tempe, AZ); Shiva K.T. Rajavelu Muralidhar (Tempe, AZ); Siyao Luan (Phoenix, AZ); Alexandros Demos (Scottsdale, AZ); Xing Lin (Chandler, AZ)
Assignee: ASM IP Holding B.V.
H10P72/7614H10P34/422H10P72/0436H10P72/0604H10P72/7611H10P95/90H10P72/0602
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Quick Facts
Patent No.
US 12,707,938
App. No.
18/448,638
Filed
Aug 11, 2023
Granted
Aug 11, 2026
Kind
B2
Art Unit
2898
USPC
438/795
Abstract

A susceptor for semiconductor substrate processing is disclosed herein. In some embodiments, the susceptor may comprise an inner susceptor portion and an outer susceptor portion. The susceptor portions may self-align via complementary features, such as tabs on the outer susceptor and recesses on the inner susceptor portion. The inner susceptor portion may contain several contact pads with which to support a wafer during semiconductor processing. In some embodiments, the contact pads are hemispherical to reduce contact area with the wafer, thereby reducing risk of backside damage. The inner susceptor portion may contain a cavity with which to receive a thermocouple. In some embodiments, the diameter of the cavity is greater than the diameter of the thermocouple such that the thermocouple does not contact the walls of the cavity during processing, thereby providing highly accurate temperature measurements.

Claims (12)

1 . A method for processing a substrate, the method comprising:

providing the substrate on a susceptor in a processing chamber, wherein the susceptor comprises an inner susceptor portion and an outer susceptor portion that encircles the inner susceptor portion, and wherein the inner susceptor portion includes a cavity defining a volume for accommodating a thermocouple, the cavity being formed through an underside of a middle portion of the inner susceptor portion, wherein the inner susceptor portion includes a plurality of recesses, and the outer susceptor portion includes a plurality of lobes extending under the inner susceptor portion to support the inner susceptor portion, and wherein each of the lobes has a generally triangular shape, which is defined by sloping sides which extend towards a rounded apex pointed towards the interior of the susceptor, and aligns within a corresponding one of the recesses, wherein the apex of the triangular shape of the lobes protrudes toward a center of the inner susceptor portion;

providing a thermocouple in the cavity, wherein the thermocouple is separated from walls of the cavity by an air gap; and

processing the substrate on the susceptor in the processing chamber,

wherein processing the substrate comprises heating the substrate and the susceptor, wherein the air gap is maintained during substrate processing.

2 . The method of claim 1 , wherein a tip of the thermocouple contacts an upper end of the cavity while processing the substrate.

3 . The method of claim 1 , wherein material forming the thermocouple has a higher coefficient of thermal expansion than material forming the susceptor.

4 . The method of claim 1 , wherein a thickness of the inner susceptor portion above the thermocouple is about 1 mm or more.

5 . The method of claim 1 , wherein the thickness is less than 1.5 mm.

6 . The method of claim 1 , wherein the walls of the cavity define a cylinder.

7 . The method of claim 1 , wherein an upper end of the cavity is flat.

8 . The method of claim 1 , wherein a tip of the thermocouple is hemispherical.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 11, 2023
From: RATHI, SAKET; RAJAVELU MURALIDHAR, SHIVA K.T.; LUAN, SIYAO; DEMOS, ALEXANDROS; LIN, XING
To: ASM IP HOLDING, B.V.
Reel/Frame 064567/0195 →
Continuity (3)
Division 17075504 · Oct 20, 2020
Provisional Application 62925705 · Oct 24, 2019
Related Publication 20230386889A1 · Nov 30, 2023
References Cited (216)
US 3407783A · Capita · 1968 [cited by applicant]
US 3549847A · Clark et al. · 1970 [cited by applicant]
US 3641974A · Yamada et al. · 1972 [cited by applicant]
US 3796182A · Rosler · 1974 [cited by applicant]
US 4499354A · Hill et al. · 1985 [cited by applicant]
US 4522149A · Garbis et al. · 1985 [cited by applicant]
US 4560420A · Lord · 1985 [cited by applicant]
US 4710428A · Tamamizu et al. · 1987 [cited by applicant]
US 4821674A · deBoer et al. · 1989 [cited by applicant]
US 4958061A · Wakabayashi et al. · 1990 [cited by applicant]
US 4978567A · Miller · 1990 [cited by applicant]
US 4986215A · Yamada et al. · 1991 [cited by applicant]
US 4990374A · Keeley et al. · 1991 [cited by applicant]
US 5033407A · Mizuno et al. · 1991 [cited by applicant]
US 5044943A · Bowman et al. · 1991 [cited by applicant]
US 5071670A · Kelly · 1991 [cited by applicant]
US 5074017A · Toya et al. · 1991 [cited by applicant]
US 5098198A · Nulman et al. · 1992 [cited by applicant]
US 5108792A · Anderson et al. · 1992 [cited by applicant]
US 5119540A · Kong et al. · 1992 [cited by applicant]
US 5119541A · Ohmi et al. · 1992 [cited by applicant]
US 5121531A · Severns et al. · 1992 [cited by applicant]
US 5156820A · Wong et al. · 1992 [cited by applicant]
US 5188501A · Tomita et al. · 1993 [cited by applicant]
US 5199483A · Bahng · 1993 [cited by applicant]
US 5200157A · Toya et al. · 1993 [cited by applicant]
US 5242501A · McDiarmid · 1993 [cited by applicant]
US 5292554A · Sinha et al. · 1994 [cited by applicant]
US 5298465A · Levy · 1994 [cited by applicant]
US 5304248A · Cheng et al. · 1994 [cited by applicant]
US 5306699A · Eddy · 1994 [cited by applicant]
US 5308645A · Zachman et al. · 1994 [cited by applicant]
US 5332442A · Kubodera et al. · 1994 [cited by applicant]
US 5343938A · Schmidt · 1994 [cited by applicant]
US 5354715A · Wang et al. · 1994 [cited by applicant]
US 5356486A · Sugarman et al. · 1994 [cited by applicant]
US 5370739A · Foster et al. · 1994 [cited by applicant]
US 5383971A · Selbrede · 1995 [cited by applicant]
US 5393349A · Ohkase · 1995 [cited by applicant]
US 5403401A · Haafkens et al. · 1995 [cited by applicant]
US 5421893A · Perlov · 1995 [cited by applicant]
US 5427620A · deBoer et al. · 1995 [cited by applicant]
US 5444217A · Moore et al. · 1995 [cited by applicant]
US 5455069A · Lee · 1995 [cited by applicant]
US 5456757A · Aruga et al. · 1995 [cited by applicant]
US 5461214A · Peck et al. · 1995 [cited by applicant]
US 5467220A · Xu · 1995 [cited by applicant]
US 5492566A · Sumnitsch · 1996 [cited by applicant]
US 5514439A · Sibley · 1996 [cited by applicant]
US 5516367A · Lei et al. · 1996 [cited by applicant]
US 5527393A · Sato et al. · 1996 [cited by applicant]
US 5549756A · Sorensen et al. · 1996 [cited by applicant]
US 5551985A · Brors et al. · 1996 [cited by applicant]
US 5558717A · Zhao et al. · 1996 [cited by applicant]
US 5584936A · Pickering et al. · 1996 [cited by applicant]
US 5588827A · Muka · 1996 [cited by applicant]
US 5620525A · van de Ven et al. · 1997 [cited by applicant]
US 5645646A · Beinglass et al. · 1997 [cited by applicant]
US 5656093A · Burkhart et al. · 1997 [cited by applicant]
US 5683518A · Moore et al. · 1997 [cited by applicant]
US 5690742A · Ogata et al. · 1997 [cited by applicant]
US 5700725A · Hower et al. · 1997 [cited by applicant]
US 5738165A · Imai · 1998 [cited by applicant]
US 5761023A · Lue et al. · 1998 [cited by applicant]
US 5800622A · Takemi et al. · 1998 [cited by applicant]
US 5803977A · Tepman et al. · 1998 [cited by applicant]
US 5834737A · Hirose et al. · 1998 [cited by applicant]
US D404370S · Kimura · 1999 [cited by applicant]
US 5895530A · Shrotriya et al. · 1999 [cited by applicant]
US 5938850A · Arami et al. · 1999 [cited by applicant]
US 5960159A · Ikeda et al. · 1999 [cited by applicant]
US 6001183A · Gurary et al. · 1999 [cited by applicant]
US 6020212A · Mathis · 2000 [cited by applicant]
US 6068441A · Raaijmakers et al. · 2000 [cited by applicant]
US 6077357A · Rossman et al. · 2000 [cited by applicant]
US 6086680A · Foster et al. · 2000 [cited by applicant]
US 6090212A · Mahawili · 2000 [cited by applicant]
US 6093252A · Wengert et al. · 2000 [cited by applicant]
US 6100505A · Pike · 2000 [cited by applicant]
US 6167834B1 · Wang et al. · 2001 [cited by applicant]
US 6168668B1 · Yudovsky · 2001 [cited by applicant]
US 6280183B1 · Mayur et al. · 2001 [cited by applicant]
US 6293749B1 · Raaijmakers et al. · 2001 [cited by applicant]
US 6325858B1 · Wengert et al. · 2001 [cited by applicant]
US 6331023B1 · Goodwin et al. · 2001 [cited by applicant]
US 6343183B1 · Halpin et al. · 2002 [cited by applicant]
US 6355909B1 · Griffiths et al. · 2002 [cited by applicant]
US 6394797B1 · Sugaya et al. · 2002 [cited by applicant]
US 6402850B1 · Beinglass et al. · 2002 [cited by applicant]
US 6462411B1 · Watanabe et al. · 2002 [cited by applicant]
US 6464790B1 · Sherstinsky et al. · 2002 [cited by applicant]
US 6551404B2 · Snijders et al. · 2003 [cited by applicant]
US 6554906B1 · Kuibira et al. · 2003 [cited by applicant]
US 6561798B2 · Kuznetsov et al. · 2003 [cited by applicant]
US 6608287B2 · Halpin et al. · 2003 [cited by applicant]
US 6634882B2 · Goodman · 2003 [cited by applicant]
US 6709267B1 · Hawkins · 2004 [cited by applicant]
US D496008S · Takahashi et al. · 2004 [cited by applicant]
US 6893507B2 · Goodman et al. · 2005 [cited by applicant]
US 7033445B2 · Keeton · 2006 [cited by applicant]
US 7048488B1 · Kuznetsov et al. · 2006 [cited by applicant]
US D525127S · Cogley et al. · 2006 [cited by applicant]
US D600223S · Aggarwal et al. · 2009 [cited by applicant]
US 7601224B2 · Foree · 2009 [cited by applicant]
US 7602224B2 · Lee · 2009 [cited by applicant]
US 7648579B2 · Goodman · 2010 [cited by applicant]
US 7722441B2 · Goela et al. · 2010 [cited by applicant]
US 7740703B2 · Hasegawa et al. · 2010 [cited by applicant]
US 7758340B2 · Akimoto et al. · 2010 [cited by applicant]
US 8088225B2 · Goodman et al. · 2012 [cited by applicant]
US 8287648B2 · Reed et al. · 2012 [cited by applicant]
US 8366830B2 · Nakamura et al. · 2013 [cited by applicant]
US 8394229B2 · Aggarwal · 2013 [cited by applicant]
US 8801857B2 · Aggarwal · 2014 [cited by applicant]
US D743357S · Vyne · 2015 [cited by applicant]
US 9202727B2 · Dunn et al. · 2015 [cited by applicant]
US 9558985B2 · Wang et al. · 2017 [cited by applicant]
US D784276S · Tiner et al. · 2017 [cited by applicant]
US 9633889B2 · Cuvalci et al. · 2017 [cited by applicant]
US 10062598B2 · Ngo et al. · 2018 [cited by applicant]
US 10068791B2 · Parsey, Jr. et al. · 2018 [cited by applicant]
US D830981S · Jeong et al. · 2018 [cited by applicant]
US 10242890B2 · Volfovski et al. · 2019 [cited by applicant]
US 10269614B2 · Chu et al. · 2019 [cited by applicant]
US 10376916B2 · Ranish et al. · 2019 [cited by applicant]
US D864134S · Watarai et al. · 2019 [cited by applicant]
US 10930543B2 · Ngo et al. · 2021 [cited by applicant]
US D914620S · Rokkam · 2021 [cited by applicant]
US 11018047B2 · Rokkam et al. · 2021 [cited by applicant]
US D920936S · Rokkam · 2021 [cited by applicant]
US 11101115B2 · Kopec et al. · 2021 [cited by applicant]
US D958764S · Rokkam · 2022 [cited by applicant]
US 11404302B2 · Singu et al. · 2022 [cited by applicant]
US 11610803B2 · Xia · 2023 [cited by applicant]
US 11961756B2 · Rokkam · 2024 [cited by examiner]
US 20020011211A1 · Halpin · 2002 [cited by applicant]
US 20020043337A1 · Goodman et al. · 2002 [cited by applicant]
US 20030000472A1 · Lim et al. · 2003 [cited by applicant]
US 20030049580A1 · Goodman · 2003 [cited by applicant]
US 20030173031A1 · Aggarwal et al. · 2003 [cited by applicant]
US 20040060512A1 · Waldhauer et al. · 2004 [cited by applicant]
US 20040229002A1 · Davis et al. · 2004 [cited by applicant]
US 20050092439A1 · Keeton et al. · 2005 [cited by applicant]
US 20050284372A1 · Murugesh et al. · 2005 [cited by applicant]
US 20060057826A1 · De Boer · 2006 [cited by applicant]
US 20090068851A1 · Hirata et al. · 2009 [cited by applicant]
US 20090175605A1 · Kobayashi · 2009 [cited by applicant]
US 20090175606A1 · Bezama et al. · 2009 [cited by applicant]
US 20090280248A1 · Goodman et al. · 2009 [cited by applicant]
US 20100031884A1 · Aggarwal et al. · 2010 [cited by applicant]
US 20100107974A1 · Givens et al. · 2010 [cited by applicant]
US 20130109192A1 · Hawkins et al. · 2013 [cited by applicant]
US 20130272686A1 · Okada et al. · 2013 [cited by applicant]
US 20140094039A1 · Ranish et al. · 2014 [cited by applicant]
US 20140113458A1 · Pan et al. · 2014 [cited by applicant]
US 20150340266A1 · Ngo et al. · 2015 [cited by applicant]
US 20160002778A1 · Ravi et al. · 2016 [cited by applicant]
US 20160068996A1 · Lau et al. · 2016 [cited by applicant]
US 20160133504A1 · Chu et al. · 2016 [cited by applicant]
US 20160215393A1 · Ramanathan et al. · 2016 [cited by applicant]
US 20180021818A1 · VanHoomissen et al. · 2018 [cited by applicant]
US 20180094350A1 · Verghese et al. · 2018 [cited by applicant]
US 20180166281A1 · Fuse et al. · 2018 [cited by applicant]
US 20190355612A1 · Sakurai · 2019 [cited by applicant]
US 20200109484A1 · Yanagisawa · 2020 [cited by applicant]
US 20200234996A1 · Rokkam et al. · 2020 [cited by applicant]
US 20200373131A1 · Yamawaku et al. · 2020 [cited by applicant]
US 20200373187A1 · Singu et al. · 2020 [cited by applicant]
US 20210125853A1 · Rathi · 2021 [cited by applicant]
US 20210159111A1 · Prengle · 2021 [cited by applicant]
US 20210280448A1 · Ganguli et al. · 2021 [cited by applicant]
CN 102308362A · 2012 [cited by applicant]
CN 103733327A · 2014 [cited by applicant]
CN 106463365A · 2017 [cited by applicant]
EP 339279A2 · 1989 [cited by applicant]
EP 445596A2 · 1991 [cited by applicant]
EP 448346A1 · 1991 [cited by applicant]
EP 634785A1 · 1995 [cited by applicant]
EP 669640A1 · 1995 [cited by applicant]
EP 766289A2 · 1997 [cited by applicant]
EP 840358A2 · 1998 [cited by applicant]
GB 2181458A · 1987 [cited by applicant]
JP H0758039A · 1995 [cited by applicant]
JP 2000269310A · 2000 [cited by applicant]
JP 2002184843A · 2002 [cited by applicant]
JP 2002526915A · 2002 [cited by applicant]
JP 2003124167A · 2003 [cited by applicant]
JP 2006124758A · 2006 [cited by applicant]
JP 2006228802A · 2006 [cited by applicant]
JP 2007502022A · 2007 [cited by applicant]
JP 2008124758A · 2008 [cited by applicant]
JP 2009070915A · 2009 [cited by applicant]
JP 2011023508A · 2011 [cited by applicant]
JP 2011193011A · 2011 [cited by applicant]
JP 2012084691A · 2012 [cited by applicant]
JP 2013157502A · 2013 [cited by applicant]
JP D1422195S · 2014 [cited by applicant]
JP D1547357S · 2016 [cited by applicant]
JP D1570747S · 2018 [cited by applicant]
JP D1570748S · 2018 [cited by applicant]
KR 1019990069084A · 1999 [cited by applicant]
KR 19990069091A · 1999 [cited by applicant]
KR 100460338B1 · 2005 [cited by applicant]
KR 1020070098025A · 2007 [cited by applicant]
KR 1020090062892A · 2009 [cited by applicant]
KR 1020130103604A · 2013 [cited by applicant]
TW D111900S · 2006 [cited by applicant]
TW D136587S · 2010 [cited by applicant]
TW 201624608A · 2016 [cited by applicant]
TW D184695S · 2017 [cited by applicant]
TW D191199S · 2018 [cited by applicant]
WO 199630713A1 · 1996 [cited by applicant]
WO 199708743A1 · 1997 [cited by applicant]
WO 2010016964A2 · 2010 [cited by applicant]
WO 2012086012A1 · 2012 [cited by applicant]
“Shaping the Future in Semiconductor Processing.” Advertisement for Morton International, Inc., Ceramic Solutions. vol. 73, No. 7, Jul. 1994: advertisements (circa 1993). [cited by applicant]