IP Library › Granted Patent US 12,726,021
Granted Patent B2
US 12,726,021 · App. 18/903,708 · Granted Sep 1, 2026

Multi-domain RC clamp circuit

Inventors: Jing Wan (Milton, VT); Alain F. Loiseau (Williston, VT); Sagar Premnath Karalkar (North Chelmsford, MA)
Assignee: GlobalFoundries U.S. Inc.
H02H9/046
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Quick Facts
Patent No.
US 12,726,021
App. No.
18/903,708
Granted
Sep 1, 2026
Kind
B2
Abstract

A multi-domain RC clamp circuit. A circuit is provided that includes a first power domain having a first RC clamp with a first transistor arranged to bypass a first resistor of the first RC clamp; and a second power domain having a second RC clamp with a second transistor arranged to bypass a second resistor of the second RC clamp, wherein the second transistor is controlled by a first input from the first power domain and the first transistor is controlled by a second input from the second power domain.

Claims (29)

1 . A circuit, comprising:

a first power domain having a first RC clamp with a first transistor arranged to bypass a first resistor of the first RC clamp; and

a second power domain having a second RC clamp with a second transistor arranged to bypass a second resistor of the second RC clamp,

wherein the second transistor is controlled by a first input from the first power domain and the first transistor is controlled by a second input from the second power domain.

2 . The circuit of claim 1 , wherein the first transistor and the second transistor comprise n-type field effect transistors.

3 . The circuit of claim 2 , wherein the second input is coupled to a gate of the first transistor, and wherein presence of an established power supply at the gate disables the first RC clamp.

4 . The circuit of claim 2 , wherein the first input is coupled to a gate of the second transistor, and wherein presence of an established power supply at the gate disables the second RC clamp.

5 . The circuit of claim 1 , further comprising at least one additional power domain, each having an additional RC clamp with an additional transistor arranged to bypass an additional resistor in the additional RC clamp.

6 . The circuit of claim 5 , wherein the additional transistor is controlled by the first input from the first power domain.

7 . The circuit of claim 5 , wherein the at least one additional power domain includes a first additional transistor controlled by the first power domain and second additional transistor controlled by the second power domain.

8 . The circuit of claim 1 , wherein the first RC clamp includes the first resistor and a capacitor arranged in series with a node therebetween, and an inverter and a metal oxide semiconductor field effect transistor coupled to the node in series.

9 . An integrated circuit, comprising:

a first power domain having a first RC clamp with a first transistor arranged to bypass a first resistor of the first RC clamp, the first RC configured to protect a first system in the first power domain; and

a second power domain having a second RC clamp with a second transistor arranged to bypass a second resistor of the second RC clamp, the second RC clamp configured to protect a second system in the second power domain,

wherein the second transistor is controlled by a first input from the first power domain and the first transistor is controlled by a second input from the second power domain.

10 . The integrated circuit of claim 9 , wherein the first transistor and the second transistor comprise n-type field effect transistors.

11 . The integrated circuit of claim 10 , wherein the second input is coupled to a gate of the first transistor, and wherein presence of an established power supply at the gate disables the first RC clamp.

12 . The integrated circuit of claim 10 , wherein the first input is coupled to a gate of the second transistor, and wherein presence of an established power supply at the gate disables the second RC clamp.

13 . The integrated circuit of claim 9 , further comprising at least one additional power domain, each having an additional RC clamp with an additional transistor arranged to bypass an additional resistor in the additional RC clamp.

14 . The integrated circuit of claim 13 , wherein the additional transistor is controlled by the first input from the first power domain.

15 . The integrated circuit of claim 13 , wherein the at least one additional power domain includes a first additional transistor controlled by the first power domain and second additional transistor controlled by the second power domain.

16 . The integrated circuit of claim 9 , wherein the first RC clamp includes the first resistor and a capacitor arranged in series with a node therebetween, and an inverter and metal oxide semiconductor field effect transistor coupled to the node in series.

17 . The integrated circuit of claim 9 , wherein the first system comprises a power supply.

18 . A circuit, comprising:

a first power domain having a first power supply; and

a second power domain having an RC clamp with a transistor arranged to bypass a resistor of the RC clamp,

wherein the transistor is controlled by a power supply input from the first power domain.

19 . The circuit of claim 18 , wherein the RC clamp is configured to protect a power supply in the second power domain.

20 . The circuit of claim 18 , wherein the transistor comprises an n-type field effect transistor, wherein the power supply input is coupled to a gate of the transistor, and wherein presence of an established power supply at the gate disables the RC clamp.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 2, 2024
From: WAN, JING; LOISEAU, ALAIN F.; KARALKAR, SAGAR PREMNATH
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 068765/0455 →
Continuity (1)
Related Publication 20260095042A1 · Apr 2, 2026
References Cited (32)
US 5721656A · Wu · 1998 [cited by examiner]
US 7394638B2 · Ahmad · 2008 [cited by examiner]
US 7570468B2 · Bernard et al. · 2009 [cited by applicant]
US 7839612B1 · Chan · 2010 [cited by examiner]
US 8643988B1 · Kwong · 2014 [cited by examiner]
US 9602071B2 · Tsai · 2017 [cited by examiner]
US 9721941B2 · Hwang · 2017 [cited by examiner]
US 10109998B2 · Altaras · 2018 [cited by examiner]
US 11876089B2 · Chen · 2024 [cited by examiner]
US 12009657B2 · Hung · 2024 [cited by examiner]
US 12401189B2 · Lee · 2025 [cited by examiner]
US 12519307B2 · Kim · 2026 [cited by examiner]
US 12519308B2 · Ishiguro · 2026 [cited by examiner]
US 12538585B2 · Kang · 2026 [cited by examiner]
US 12573843B2 · Hsu · 2026 [cited by examiner]
US 20030107859A1 · Pan · 2003 [cited by examiner]
US 20070076338A1 · Traynor · 2007 [cited by examiner]
US 20070223163A1 · Hung · 2007 [cited by examiner]
US 20110038084A1 · Lo · 2011 [cited by examiner]
US 20130235498A1 · Lai · 2013 [cited by examiner]
US 20130321961A1 · Lin · 2013 [cited by examiner]
US 20140334046A1 · Haruki · 2014 [cited by examiner]
US 20150155707A1 · Truong · 2015 [cited by examiner]
US 20150288172A1 · Yeh · 2015 [cited by examiner]
US 20150288173A1 · Chen · 2015 [cited by examiner]
US 20150333508A1 · Ko · 2015 [cited by examiner]
US 20190260203A1 · Seidl · 2019 [cited by examiner]
US 20240372360A1 · Davis · 2024 [cited by examiner]
US 20250246900A1 · Sivakumar · 2025 [cited by examiner]
US 20260095042A1 · Wan · 2026 [cited by examiner]
CN 111276952A · 2020 [cited by applicant]
KR 20110013223A · 2011 [cited by examiner]