IP Library › Granted Patent US 12,743,145
Granted Patent B2
US 12,743,145 · App. 18/805,984 · Granted Sep 22, 2026

Energy efficiency using a power saving clock buffer for clock grid-based scanning

Inventors: William V. Huott (Holmes, NY); Ann Chen Wu (Hopewell Junction, NY); Paul Alan Bunce (Poughkeepsie, NY); Leon Sigal (Monsey, NY)
Assignee: International Business Machines Corporation
G06F1/3237
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Quick Facts
Patent No.
US 12,743,145
App. No.
18/805,984
Granted
Sep 22, 2026
Kind
B2
Abstract

A local clock buffer for improving energy efficiency using a power saving clock buffer for clock grid-based scanning includes a grid node that receives a global clock signal from a global clock grid; a clock enable latch configured to latch a clock enable signal, wherein the clock enable latch is clocked based on the global clock signal; a clock gate configured to output a functional clock signal in dependence upon a latched value of the clock enable signal; a scan clock enable latch configured to latch a scan enable signal, wherein the scan enable latch is a non-clocked latch; and a scan clock gate coupled to the output of the functional clock gate and configured to output a scan clock signal in dependence upon a latched value of the scan enable signal.

Claims (37)

1 . A local clock buffer comprising:

a grid node that receives a global clock signal from a global clock grid;

a clock enable latch configured to latch a clock enable signal, wherein the clock enable latch is clocked based on the global clock signal;

a clock gate configured to output a functional clock signal in dependence upon a latched value of the clock enable signal;

a scan clock enable latch configured to latch a scan enable signal, wherein the scan clock enable latch is a non-clocked latch; and

a scan clock gate coupled to an output of the clock gate and configured to output a scan clock signal in dependence upon a latched value of the scan enable signal.

2 . The local clock buffer of claim 1 , wherein the clock gate is configured to output a pulsed clock signal when clock chopping is enabled for the clock gate; and wherein clock chopping is disabled by enabling the scan clock signal.

3 . The local clock buffer of claim 1 further comprising a functional clock output gate configured to gate the output of the functional clock signal by the local clock buffer; and wherein output of the functional clock signal by the local clock buffer is disabled by enabling the scan clock signal.

4 . The local clock buffer of claim 1 , wherein the scan clock gate is coupled to a slow input path for enabling the scan clock signal and a fast input path for disabling the scan clock signal, wherein both the slow input path and the fast input path propagate the latched value of the scan enable signal to the scan clock gate.

5 . The local clock buffer of claim 4 , wherein a clock chopping disable gate and a functional clock output gate receive an input based on the scan enable signal.

6 . The local clock buffer of claim 1 , wherein the scan clock enable latch is a set-reset latch.

7 . The local clock buffer of claim 6 , wherein a set input of the set-reset latch receives the scan enable signal and wherein a reset input of the set-reset latch receives the output of the scan clock gate.

8 . A processor comprising:

one or more data latches configured for functional data latching and scan data latching; and

a local clock buffer configured to provide a functional clock signal and a scan clock signal to the one or more data latches, the local clock buffer comprising:

a grid node that receives a global clock signal from a global clock grid;

a clock enable latch configured to latch a clock enable signal, wherein the clock enable latch is clocked based on the global clock signal;

a clock gate configured to output the functional clock signal in dependence upon a latched value of the clock enable signal;

a scan clock enable latch configured to latch a scan enable signal, wherein the scan clock enable latch is a non-clocked latch; and

a scan clock gate coupled to an output of the clock gate and configured to output the scan clock signal in dependence upon a latched value of the scan enable signal.

9 . The processor of claim 8 , wherein the clock gate is configured to output a pulsed clock signal when clock chopping is enabled for the clock gate; and wherein clock chopping is disabled by enabling the scan clock signal.

10 . The processor of claim 8 further comprising a functional clock output gate configured to gate the output of the functional clock signal by the local clock buffer; and wherein output of the functional clock signal by the local clock buffer is disabled by enabling the scan clock signal.

11 . The processor of claim 8 , wherein the scan clock gate is coupled to a slow input path for enabling the scan clock signal and a fast input path for disabling the scan clock signal, wherein both the slow input path and the fast input path propagate the latched value of the scan enable signal to the scan clock gate.

12 . The processor of claim 11 , wherein a clock chopping disable gate and a functional clock output gate receive an input based on the scan enable signal.

13 . The processor of claim 8 , wherein the scan clock enable latch is a set-reset latch.

14 . The processor of claim 13 , wherein a set input of the set-reset latch receives the scan enable signal and wherein a reset input of the set-reset latch receives the output of the scan clock gate.

15 . A method of improving energy efficiency using a power saving clock buffer for clock grid-based scanning, the method comprising:

generating, by a local clock buffer, a functional clock signal;

latching, in a non-clocked latch of the local clock buffer, a scan enable signal;

disabling, based on the scan enable signal, an output of the functional clock signal;

deriving, by a scan clock gate of the local clock buffer, a scan clock signal from the functional clock signal; and

outputting the scan clock signal.

16 . The method of claim 15 , wherein a functional clock gate is configured to output a pulsed clock signal as the functional clock signal when clock chopping is enabled for the functional clock gate; and wherein clock chopping is disabled by enabling the scan clock signal.

17 . The method of claim 15 , wherein the scan clock gate is coupled to a slow input path for enabling the scan clock signal and a fast input path for disabling the scan clock signal, wherein both the slow input path and the fast input path propagate a latched value of the scan enable signal to the scan clock gate.

18 . The method of claim 17 , wherein a clock chopping disable gate and a functional clock output gate receive an input based on the scan enable signal.

19 . The method of claim 15 , wherein the non-clocked latch is a scan clock enable latch that is a set-reset latch.

20 . The method of claim 19 , wherein a set input of the set-reset latch receives the scan enable signal and wherein a reset input of the set-reset latch receives the output of the scan clock gate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2024
From: HUOTT, WILLIAM V.; WU, ANN CHEN; BUNCE, PAUL ALAN; SIGAL, LEON
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 068298/0897 →
Continuity (1)
Related Publication 20260050318A1 · Feb 19, 2026
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