Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
In one embodiment, the invention provides a test assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component. The assembly comprises a contactor assembly to interconnect with the test component, a probe assembly to mechanically support the contactor assembly and electrically connect the contactor assembly to the testing machine, and a clamping mechanism comprising a first clamping member and a second clamping member, the clamping members being urged together to exert a clamping force to deform contactor bumps of an electrical connection between the probe assembly and the contactor assembly.
1. A unit for interfacing a test component with a testing machine for testing electrical circuits on the test component, the interface unit comprising:
a support component to support a contactor assembly to make electrical contact with the test component;
an external interface component on the support component comprising a plurality of electrical connectors for electrical connection to the testing machine;
a flexible substrate having a first end which is electrically connected to the interface component and a second end opposite the first end;
flexible conductors on the flexible substrate, the flexible conductors having a first part which is electrically connected to the interface component and a terminal part at the second end of the flexible substrate, the terminal part comprising a plurality of terminals, and a plurality of conductive bumps, each of which is connected to a respective one of the terminals, wherein the terminal part is connectable to the contactor assembly and carries electrical signals between the contactor assembly and the testing machine.
2. The unit of claim 1 , wherein two conductive bumps are connected to each terminal by wire bonding.
3. The unit of claim 2 , wherein the conductive bumps are of gold.
4. The unit of claim 3 , wherein the conductive bumps have a width of 100 micrometers and a height of 60 micrometers.