IP Library Granted Patent US 7,053,299
Granted Patent B2
US 7,053,299 · App. 10/920,660 · Granted May 30, 2006

Flange for integrated circuit package

Assignee: Quantum Leap Packaging, Inc.
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Quick Facts
Patent No.
US 7,053,299
App. No.
10/920,660
Granted
May 30, 2006
Kind
B2
Abstract

A circuit package for housing semiconductor or other integrated circuit devices (“die”) includes a high-copper flange, one or more high-copper leads and a liquid crystal polymer frame molded to the flange and the leads. The flange includes a dovetail-shaped groove or other frame retention feature that mechanically interlocks with the molded frame. During molding, a portion of the frame forms a key that freezes in or around the frame retention feature.

Claims (69)

1. A flange for mounting a semiconductor die, comprising:

a solid metallic body having:

a central planar die-attach area on a first side thereof, the die-attach area being flat to within about 0.005 inches per inch and having a surface roughness less than about 64 micro-inches; and

a second side, opposite the first side, having a surface roughness less than about 64 micro-inches; wherein:

the metallic body comprises at least 50% copper.

2. The flange of claim 1 , wherein the metallic body defines a plurality of openings by which the flange can be mounted to a substrate.

3. The flange of claim 1 , wherein the metallic body comprises at least 90% copper.

4. The flange of claim 1 , wherein the metallic body comprises at least about 98% copper.

5. The flange of claim 1 , wherein the metallic body comprises an alloy of copper and at least one material chosen from a group comprising zirconium and silver.

6. The flange of claim 1 , wherein the metallic body comprises an alloy containing at least about 98% copper.

7. The flange of claim 6 , wherein the alloy contains between about 0.05% and about 1.5% zirconium and at least about 98.5% copper.

8. The flange of claim 6 , wherein the alloy contains about 0.085% silver and at least about 99.9% copper.

9. The flange of claim 1 , wherein the metallic body includes a recess that defines at least one undercut portion.

10. The flange of claim 9 , wherein the recess includes a portion having a dovetail-shaped cross-section.

11. The flange of claim 9 , wherein the recess includes a portion having a T-shaped cross-section.

12. The flange of claim 9 , wherein the recess includes a portion having an L-shaped cross-section.

13. The flange of claim 1 , wherein the metallic body includes a ridge that defines at least one undercut portion.

14. The flange of claim 13 , wherein the ridge includes a portion having a dovetail-shaped cross-section.

15. The flange of claim 13 , wherein the ridge includes a portion having a T-shaped cross-section.

16. The flange of claim 13 , wherein the ridge includes a portion having an L-shaped cross-section.

17. The flange of claim 1 , wherein the second side of the body is convex.

18. The flange of claim 17 , wherein convexity of the second side is at least about 0.0001 inches.

19. The flange of claim 17 , wherein convexity of the second side is between about 0.0005 and about 0.0010 inches.

20. A flange for mounting a semiconductor die, comprising:

a solid metallic body having:

a central planar die-attach area on a first side thereof, the die-attach area being flat to within about 0.005 inches per inch and having a surface roughness less than about 64 micro-inches; and

a second side, opposite the first side, has a surface roughness less than about 64 micro-inches and is convex.

21. The flange of claim 20 , wherein the metallic body defines a plurality of openings by which the flange can be mounted to a substrate.

22. The flange of claim 20 , wherein convexity of the second side is at least about 0.0001 inches.

23. The flange of claim 20 , wherein convexity of the second side is between about 0.0005 and about 0.00010 inches.

24. The flange of claim 20 , wherein the metallic body comprises at least 50% copper.

25. The flange of claim 20 , wherein the metallic body comprises at least 90% copper.

26. The flange of claim 20 , wherein the metallic body comprises at least about 98% copper.

27. The flange of claim 20 , wherein the metallic body comprises an alloy of copper and at least one material chosen from a group comprising zirconium and silver.

28. The flange of claim 20 , wherein the metallic body comprises an alloy containing at least about 98% copper.

29. The flange of claim 28 , wherein the alloy contains between about 0.05% and about 1.5% zirconium and at least about 98.5% copper.

30. The flange of claim 28 , wherein the alloy contains about 0.085% silver and at least about 99.9% copper.

31. A flange for mounting a semiconductor die, comprising:

a solid metallic body having:

a central planar die-attach area on a first side thereof, the die-attach area being flat to within about 0.005 inches per inch and having a surface roughness less than about 64 micro-inches; and

a second side, opposite the first side, having a surface roughness less than about 64 micro-inches; wherein:

the metallic body includes a recess that defines at least one undercut portion.

32. The flange of claim 31 , wherein the metallic body defines a plurality of openings by which the flange can be mounted to a substrate.

33. The flange of claim 31 , wherein the recess includes a portion having a dovetail-shaped cross-section.

34. The flange of claim 31 , wherein the recess includes a portion having a T-shaped cross-section.

35. The flange of claim 31 , wherein the recess includes a portion having an L-shaped cross-section.

36. The flange of claim 31 , wherein the metallic body comprises at least 50% copper.

37. The flange of claim 31 , wherein the metallic body comprises at least 90% copper.

38. The flange of claim 31 , wherein the metallic body comprises at least about 98% copper.

39. The flange of claim 31 , wherein the metallic body comprises an alloy of copper and at least one material chosen from a group comprising zirconium and silver.

40. The flange of claim 31 , wherein the metallic body comprises an alloy containing at least about 98% copper.

41. The flange of claim 40 , wherein the alloy contains between about 0.05% and about 1.5% zirconium and at least about 98.5% copper.

42. The flange of claim 41 , wherein the alloy contains about 0.085% silver and at least about 99.9% copper.

43. A flange for mounting a semiconductor die, comprising:

a solid metallic body having:

a central planar die-attach area on a first side thereof, the die-attach area being flat to within about 0.005 inches per inch and having a surface roughness less than about 64 micro-inches; and

a second side, opposite the first side, having a surface roughness less than about 64 micro-inches; wherein:

the metallic body includes a ridge that defines at least one undercut portion.

44. The flange of claim 43 , wherein the metallic body defines a plurality of openings by which the flange can be mounted to a substrate.

45. The flange of claim 43 , wherein the ridge includes a portion having a dovetail-shaped cross-section.

46. The flange of claim 43 , wherein the ridge includes a portion having a T-shaped cross-section.

47. The flange of claim 43 , wherein the ridge includes a portion having an L-shaped cross-section.

48. The flange of claim 43 , wherein the metallic body comprises at least 50% copper.

49. The flange of claim 43 , wherein the metallic body comprises at least 90% copper.

50. The flange of claim 43 , wherein the metallic body comprises at least about 98% copper.

51. The flange of claim 43 , wherein the metallic body comprises an alloy of copper and at least one material chosen from a group comprising zirconium and silver.

52. The flange of claim 43 , wherein the metallic body comprises an alloy containing at least about 98% copper.

53. The flange of claim 52 , wherein the alloy contains between about 0.05% and about 1.5% zirconium and at least about 98.5% copper.

54. The flange of claim 53 , wherein the alloy contains about 0.085% silver and at least about 99.9% copper.

Assignments (7)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 18, 2024
From: IM1, LLC; IM2, LLC; IMH1, LLC; IMH2, LLC; IONIC MATERIALS, INC.; IONIC MATERIALS II, INC.; IM HOLDINGS I, INC.; IM HOLDINGS II, INC.
To: TEXTILES COATED, INCORPORATED
Reel/Frame 068626/0541 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 18, 2019
From: IQLP, LLC
To: IONIC MATERIALS, INC.
Reel/Frame 050762/0154 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 11, 2012
From: INTERPLEX QLP, INC.
To: IQLP, LLC
Reel/Frame 028028/0221 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2009
From: INTERPLEX ENGINEERED PRODUCTS, INC.
To: INTERPLEX QLP, INC.
Reel/Frame 022960/0406 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 15, 2009
From: QUANTUM LEAP PACKAGING, INC.
To: INTERPLEX ENGINEERED PRODUCTS, INC.
Reel/Frame 022951/0884 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME PREVIOUSLY RECORDED ON REEL 022892 FRAME 0082. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jul 6, 2009
From: QUANTUM LEAP PACKAGING, INC.
To: INTERPLEX ENGINEERED PRODUCTS, INC.
Reel/Frame 022915/0962 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2009
From: QUANTUM LEAP PACKAGING, INC.
To: INTERPLEXED ENGINEERED PRODUCTS, INC.
Reel/Frame 022892/0082 →
Continuity (3)
Division 1076730900 · Jan 29, 2004
Provisional Application 6044347000 · Jan 29, 2003
Related Publication 20050012118A1 · Jan 20, 2005