IP Library Granted Patent US 8,173,512
Granted Patent B2
US 8,173,512 · App. 13/080,436 · Granted May 8, 2012

Forming structures that include a relaxed or pseudo-relaxed layer on a substrate

Assignee: Soitec
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Quick Facts
Patent No.
US 8,173,512
App. No.
13/080,436
Granted
May 8, 2012
Kind
B2
Abstract

A method for forming a structure that includes a relaxed or pseudo-relaxed layer on a substrate. The method includes the steps of growing an elastically stressed layer of semiconductor material on a donor substrate; forming a glassy layer of a viscous material on the stressed layer; removing a portion of the donor substrate to form a structure that includes the glassy layer, the stressed layer and a surface layer of donor substrate material; patterning the stressed layer; and heat treating the structure at a temperature of at least a viscosity temperature of the glassy layer to relax the stressed layer and form the relaxed or pseudo-relaxed layer of the structure.

Claims (14)

1. A method for relaxing a layer of a strained material on a substrate which method comprises:

providing an elastically stressed layer on a first substrate;

providing a first glassy layer on the stressed layer or upon a second substrate;

bonding the first and second substrates together with the stressed layer and first glassy layer therebetween;

removing the first substrate to obtain a structure comprising the stressed layer, first glassy layer and second substrate;

providing a second glassy layer on the stressed layer; and

heat treating the structure at a temperature close to or higher than the viscosity temperature of one or both of the glassy layers to convert the stressed layer to a relaxed or pseudo-relaxed layer.

2. The method of claim 1 , wherein the heat treating temperature is about 1150 to 1500° C.

3. The method of claim 1 , wherein the heat treating temperature is about 1150 to 1200° C.

4. The method of claim 1 , wherein the stressed layer is provided by growing the layer on the first substrate.

5. The method of claim 1 , wherein the first glassy layer comprises a viscous material having an associated viscosity temperature, and the heat treating is conducted at or above the viscosity temperature.

6. The method of claim 1 , wherein the second glassy layer is provided by removing a portion of the first glassy layer and leaving a surface layer of the first substrate on the structure, applying a controlled treatment to transform at least a portion or all of the surface layer to a viscous material having an associated viscosity temperature, and the heat treating is conducted at or above the viscosity temperature.

7. The method of claim 6 , which further comprises growing a further layer on the structure.

8. The method of claim 7 , which further comprises removing the second glassy layer before growing the further layer.

Assignments (2)
CHANGE OF NAME Recorded Mar 1, 2012
From: S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
To: SOITEC
Reel/Frame 027793/0535 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 28, 2012
From: GHYSELEN, BRUNO; MAZURE, CARLOS; ARENE, EMMANUEL
To: S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
Reel/Frame 027772/0620 →
Priority Claims (1)
FR 03 02518 · Feb 28, 2003 · national
Continuity (5)
Continuation 12769299 · Apr 28, 2010
Continuation 11345495 · Feb 2, 2006
Continuation 10784016 · Feb 20, 2004
Provisional Application 60483476 · Jun 26, 2003
Related Publication 20110217825A1 · Sep 8, 2011