IP Library › Granted Patent US 9,054,671
Granted Patent B2
US 9,054,671 · App. 13/292,729 · Granted Jun 9, 2015

Tunable filter structures and design structures

Inventors: James W. Adkisson (Jericho, VT); Panglijen Candra (Williston City, VT); Thomas J. Dunbar (Burlington, VT); Mark D. Jaffe (Shelburne, VT); Robert K. Leidy (Burlington, VT); Anthony K. Stamper (Williston, VT)
Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
H03H9/173Y10T29/42H03H9/56H03H2009/02204H03H9/0547
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Quick Facts
Patent No.
US 9,054,671
App. No.
13/292,729
Filed
Nov 9, 2011
Granted
Jun 9, 2015
Kind
B2
Art Unit
2842
USPC
333/188
Abstract

Tunable filter structures, methods of manufacture and design structures are disclosed. The method of forming a filter structure includes forming a piezoelectric resonance filter over a cavity structure. The forming of the piezoelectric resonance filter includes: forming an upper electrode on one side of a piezoelectric material; and forming a lower electrode on an opposing side of the piezoelectric material. The method further includes forming a micro-electro-mechanical structure (MEMS) cantilever beam at a location in which, upon actuation, makes contact with the piezoelectric resonance filter.

Claims (65)

1. A method of forming a filter structure, comprising:

forming a piezoelectric resonance filter over a cavity structure, wherein the forming comprises:

forming an upper electrode on one side of a piezoelectric material; and

forming a lower electrode on an opposing side of the piezoelectric material;

forming a micro-electro-mechanical structure (MEMS) cantilever beam at a location in which, upon actuation, makes contact with the piezoelectric resonance filter; and

forming an electrode in an insulator material, below the cavity and structured to apply an effective load to the MEMS cantilever beam.

2. The method of claim 1 , wherein forming of the MEMS cantilever beam comprises forming a comb structure over the piezoelectric resonance filter.

3. The method of claim 2 , wherein forming of the comb structure comprises forming a high resistive region on a plurality of fingers of the comb structure.

4. The method of claim 2 , wherein a plurality of fingers of the comb structure are locked in contact with the piezoelectric resonance filter through stiction.

5. The method of claim 1 , further comprising forming a loading bar on the upper electrode of the piezoelectric resonance filter, wherein the MEMS cantilever beam is formed at a location in which, upon actuation, makes contact with the loading bar.

6. The method of claim 5 , wherein:

the loading bar is formed by depositing a metal or metal alloy on the upper electrode; and

the loading bar acts as an electrode to pull down the MEMS cantilever beam into contact with the piezoelectric resonance filter.

7. The method of claim 5 , wherein:

the loading bar is formed by depositing a dielectric material on the upper electrode; and

the upper electrode acts as an electrode to pull down the MEMS cantilever beam into contact with the piezoelectric resonance filter.

8. A method of forming a filter structure, comprising:

forming a piezoelectric resonance filter over a cavity structure, wherein the forming comprises:

forming an upper electrode on one side of a piezoelectric material; and

forming a lower electrode on an opposing side of the piezoelectric material; and

forming a micro-electro-mechanical structure (MEMS) cantilever beam at a location in which, upon actuation, makes contact with the piezoelectric resonance filter,

wherein forming of the MEMS cantilever beam comprises forming a comb structure over the piezoelectric resonance filter,

wherein forming of the comb structure comprises forming a high resistive region on a plurality of fingers of the comb structure, and

wherein the high resistive region is formed of a different material than remaining portions of the comb structure.

9. A method of forming a filter structure, comprising:

forming a piezoelectric resonance filter over a cavity structure, wherein the forming comprises:

forming an upper electrode on one side of a piezoelectric material; and

forming a lower electrode on an opposing side of the piezoelectric material; and

forming a micro-electro-mechanical structure (MEMS) cantilever beam at a location in which, upon actuation, makes contact with the piezoelectric resonance filter, wherein

forming of the MEMS cantilever beam comprises forming a comb structure over the piezoelectric resonance filter, and

forming of the comb structure comprises at least one of forming fingers of different materials and fingers of different lengths.

10. A filter structure, comprising:

a piezoelectric resonance filter formed over a cavity structure, wherein the piezoelectric resonance filter comprises:

an upper electrode on one side of a piezoelectric material; and

a lower electrode on an opposing side of the piezoelectric material;

a micro-electro-mechanical structure (MEMS) cantilever beam fixed on one end to an insulator material and suspended over the piezoelectric resonance filter at a location in which, upon actuation, makes contact with the piezoelectric resonance filter, wherein

the MEMS cantilever beam comprises a comb structure,

the comb structure comprises a high resistive region on a plurality of fingers of the comb structure, and

the high resistive region is formed of a different material than remaining portions of the comb structure.

11. A filter structure, comprising:

a piezoelectric resonance filter formed over a cavity structure, wherein the piezoelectric resonance filter comprises:

an upper electrode on one side of a piezoelectric material; and

a lower electrode on an opposing side of the piezoelectric material;

a micro-electro-mechanical structure (MEMS) cantilever beam fixed on one end to an insulator material and suspended over the piezoelectric resonance filter at a location in which, upon actuation, makes contact with the piezoelectric resonance filter;

the MEMS cantilever beam comprises a comb structure, and

an electrode in an insulator material, below the cavity and structured to apply an effective load to the MEMS cantilever beam.

12. The filter structure of claim 11 , wherein the comb structure comprises a high resistive region on a plurality of fingers of the comb structure.

13. The filter structure of claim 11 , wherein a plurality of fingers of the comb structure are locked in contact with the piezoelectric resonance filter through stiction.

14. The filter structure of claim 11 , further comprising a loading bar on the upper electrode of the piezoelectric resonance filter,

wherein the MEMS cantilever beam is at a location in which, upon actuation, makes contact with the loading bar, and

wherein one of:

the loading bar is a dielectric material and the upper electrode is structured to act as an electrode to pull down the MEMS cantilever beam into contact with the loading bar; and

the loading bar is a metal or metal alloy, and is structured to act as an electrode to pull down the MEMS cantilever beam into contact with the loading bar.

15. A filter structure, comprising:

a piezoelectric resonance filter formed over a cavity structure, wherein the piezoelectric resonance filter comprises:

an upper electrode on one side of a piezoelectric material; and

a lower electrode on an opposing side of the piezoelectric material; and

a micro-electro-mechanical structure (MEMS) cantilever beam fixed on one end to an insulator material and suspended over the piezoelectric resonance filter at a location in which, upon actuation, makes contact with the piezoelectric resonance filter,

wherein the MEMS cantilever beam comprises a comb structure and the comb structure includes fingers of different lengths.

16. A filter structure, comprising:

a piezoelectric resonance filter formed over a cavity structure, wherein the piezoelectric resonance filter comprises:

an upper electrode on one side of a piezoelectric material; and

a lower electrode on an opposing side of the piezoelectric material; and

a micro-electro-mechanical structure (MEMS) cantilever beam fixed on one end to an insulator material and suspended over the piezoelectric resonance filter at a location in which, upon actuation, makes contact with the piezoelectric resonance filter,

wherein the MEMS cantilever beam comprises a comb structure and the comb structure includes fingers of different materials.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded May 12, 2021
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 056987/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2020
From: GLOBALFOUNDRIES INC.
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 054633/0001 →
SECURITY AGREEMENT Recorded Nov 29, 2018
From: GLOBALFOUNDRIES INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 049490/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2015
From: GLOBALFOUNDRIES U.S. 2 LLC; GLOBALFOUNDRIES U.S. INC.
To: GLOBALFOUNDRIES INC.
Reel/Frame 036779/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2015
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: GLOBALFOUNDRIES U.S. 2 LLC
Reel/Frame 036550/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2011
From: ADKISSON, JAMES W.; CANDRA, PANGLIJEN; DUNBAR, THOMAS J.; JAFFE, MARK D.; LEIDY, ROBERT K.; STAMPER, ANTHONY K.
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 027202/0421 →
Continuity (1)
Related Publication 20130113577A1 · May 9, 2013