IP Library Patent Application 10934835
Patent Application
App. No. 10/934,835

Wire sweep resistant semiconductor package and manufacturing method thereof

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Quick Facts
Patent No.
US None
App. No.
10/934,835
Abstract

A method for manufacturing a wire sweep resistant semiconductor package provides a die attached to an interposer. The die is electrically connected to the interposer with conductive wires. A sealant is applied to the conductive wires and optionally the die to prevent wire sweep, the sealant being applied free of contact with the interposer. The die, the interposer, the conductive wires, and the sealant are enclosed in an encapsulant.

Claims (54)

1 . A method for manufacturing a wire sweep resistant semiconductor package, comprising:

providing a die attached to an interposer;

electrically connecting the die to the interposer with conductive wires;

applying a sealant to the conductive wires and optionally the die to prevent wire sweep, the sealant being applied free of contact with the interposer; and

encapsulating the die, the interposer, the conductive wires, and the sealant in an encapsulant.

2 . The method of claim 1 wherein applying the sealant to the conductive wires and optionally the die to prevent wire sweep further comprises applying the sealant to the conductive wires with the sealant completely covering the conductive wires and touching only the conductive wires.

3 . The method of claim 1 wherein applying the sealant to the conductive wires and optionally the die to prevent wire sweep further comprises applying discrete drops of the sealant to distinct groups of the conductive wires with each drop of the sealant touching only a respective distinct group of the conductive wires.

4 . The method of claim 1 wherein applying the sealant to the conductive wires and optionally the die to prevent wire sweep further comprises:

applying a first application of the sealant to the conductive wires with the first application of the sealant touching only the conductive wires; and

applying a second application of the sealant to substantially the same conductive wires with the second application of the sealant touching only the conductive wires.

5 . The method of claim 1 wherein applying the sealant to the conductive wires and optionally the die to prevent wire sweep further comprises applying the sealant to the die and the conductive wires with the sealant entirely covering the die and touching only the die and the conductive wires.

6 . A method for manufacturing a wire sweep resistant semiconductor package, comprising:

providing a die attached by an epoxy to a interposer;

electrically connecting the die to the interposer with conductive wires connected around the periphery of the die;

applying a sealant to the conductive wires and optionally the die to prevent wire sweep, the sealant being applied free of contact with the interposer; and

encapsulating the die, the epoxy, the interposer, the conductive wires, and the sealant in an encapsulant.

7 . The method of claim 6 wherein applying the sealant to the conductive wires and optionally the die to prevent wire sweep further comprises applying the sealant to the conductive wires with the sealant completely covering the conductive wires and touching only the conductive wires.

8 . The method of claim 6 wherein applying the sealant to the conductive wires and optionally the die to prevent wire sweep further comprises:

applying a first drop of the sealant to a first group of conductive wires, the first drop of the sealant touching only the first group of conductive wires;

applying a second drop of the sealant to a second group of conductive wires, the second drop of the sealant touching only the second group of conductive wires;

applying a third drop of the sealant to a third group of conductive wires, the third drop of the sealant touching only the third group of conductive wires; and

applying a fourth drop of the sealant to a fourth group of conductive wires, the fourth drop of the sealant touching only the fourth group of conductive wires.

9 . The method of claim 6 wherein applying the sealant to the conductive wires and optionally the die to prevent wire sweep further comprises:

applying a first application of the sealant to the conductive wires with the first application of the sealant touching only the conductive wires; and

applying a second application of the sealant to substantially the same conductive wires with the second application of the sealant touching only the conductive wires.

10 . The method of claim 6 wherein applying the sealant to the conductive wires and optionally the die to prevent wire sweep further comprises applying the sealant to the die and the conductive wires with the sealant entirely covering the die, covering the wires at their connected positions on the die, and touching only the die and the conductive wires.

11 . A wire sweep resistant semiconductor package, comprising:

a die attached to an interposer;

conductive wires electrically connecting the die to the interposer;

a sealant applied to the conductive wires and optionally the die to prevent wire sweep, the sealant being free of contact with the interposer; and

an encapsulant encapsulating the die, the interposer, the conductive wires, and the sealant.

12 . The semiconductor package of claim 11 wherein the sealant applied to the conductive wires and optionally the die to prevent wire sweep further comprises a sealant that touches only the conductive wires.

13 . The semiconductor package of claim 11 wherein the sealant applied to the conductive wires and optionally the die to prevent wire sweep further comprises discrete drops of the sealant applied to distinct groups of conductive wires with each drop of the sealant touching only a respective distinct group of the conductive wires.

14 . The semiconductor package of claim 11 wherein the sealant applied to the conductive wires and optionally the die to prevent wire sweep further comprises:

a first application of the sealant applied to the conductive wires to prevent wire sweep, the first application of the sealant touching only the conductive wires; and

a second application of the sealant applied to substantially the same conductive wires to prevent wire sweep, the second application of the sealant touching only the conductive wires.

15 . The semiconductor package of claim 11 wherein the sealant applied to the conductive wires and optionally the die to prevent wire sweep further comprises the sealant entirely covering the die and touching only the die and the conductive wires.

16 . A wire sweep resistant semiconductor package, comprising:

a die;

an interposer;

an epoxy attaching the die to the interposer;

conductive wires around the periphery of the die electrically connecting the die to the interposer;

a sealant applied to the conductive wires and optionally the die to prevent wire sweep, the sealant being free of contact with the interposer; and

an encapsulant encapsulating the die, the epoxy, the interposer, the conductive wires, and the sealant.

17 . The semiconductor package of claim 16 wherein the sealant applied to the conductive wires and optionally the die to prevent wire sweep further comprises the sealant completely covering the conductive wires and touching only the conductive wires.

18 . The semiconductor package of claim 16 wherein the sealant applied to the conductive wires and optionally the die to prevent wire sweep further comprises:

a first drop of the sealant applied to a first group of conductive wires, the first drop of the sealant touching only the first group of conductive wires;

a second drop of the sealant applied to a second group of conductive wires, the second drop of the sealant touching only the second group of conductive wires;

a third drop of the sealant applied to a third group of conductive wires, the third drop of the sealant touching only the third group of conductive wires; and

a fourth drop of the sealant applied to a fourth group of conductive wires, the fourth drop of the sealant touching only the fourth group of conductive wires.

19 . The semiconductor package of claim 16 wherein the sealant applied to the conductive wires and optionally the die to prevent wire sweep further comprises:

a first application of the sealant applied to the conductive wires to prevent wire sweep, the first application of the sealant touching only the conductive wires; and

a second application of the sealant applied to substantially the same conductive wires to prevent wire sweep, the second application of the sealant touching only the conductive wires.

20 . The semiconductor package of claim 16 wherein the sealant applied to the conductive wires and optionally the die to prevent wire sweep further comprises the sealant entirely covering the die, covering the wires at their connected positions on the die, and touching only the die and the conductive wires.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Jun 17, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 053476/0094 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR NAME PREVIOUSLY RECORDED AT REEL: 039514 FRAME: 0451. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded Aug 26, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 039980/0838 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR'S NAME PREVIOUSLY RECORDED ON REEL 038378 FRAME 0442. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded Jul 26, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 039514/0451 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0442 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2004
From: MAGNO, SHEILA RIMA C.; DO, BYUNG TAI; GUILLERMO, DENNIS; DIMAANO, JR., ANTONIO B.
To: STATS CHIPPAC LTD.
Reel/Frame 015374/0246 →