IP Library Granted Patent US 7,714,451
Granted Patent B2
US 7,714,451 · App. 11/307,614 · Granted May 11, 2010

Semiconductor package system with thermal die bonding

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Quick Facts
Patent No.
US 7,714,451
App. No.
11/307,614
Granted
May 11, 2010
Kind
B2
Abstract

A semiconductor package system includes providing a substrate having a plurality of thermal vias extending through the substrate. A solder mask is positioned over the plurality of thermal vias. A plurality of thermally conductive bumps is formed on at least some of the plurality of thermal vias using the solder mask. An integrated circuit die is attached to the plurality of thermally conductive bumps. An encapsulant encapsulates the integrated circuit die.

Claims (34)

1. A semiconductor package system, comprising:

providing a substrate having a plurality of thermal vias extending through the substrate;

providing a solder mask over the plurality of thermal vias;

forming a plurality of thermally conductive bumps on at least some of the plurality of thermal vias using the solder mask;

attaching an inactive side of an integrated circuit die to the plurality of thermally conductive bumps; and

encapsulating the integrated circuit die.

2. The semiconductor package as claimed in claim 1 , wherein:

forming a plurality of thermally conductive bumps on at least some of the thermal vias uses a screen printing process.

3. The semiconductor package system as claimed in claim 1 , wherein:

attaching an integrated circuit die to the plurality of thermally conductive bumps uses bumps of a thermally conductive material having a thermal conductivity greater than that of the substrate.

4. The semiconductor package system as claimed in claim 1 , wherein:

attaching an integrated circuit die to the plurality of thermally conductive bumps uses at least one of a high thermal epoxy, a eutectic solder paste, a tin-silver solder paste, compounds thereof, alloys thereof, and combinations thereof.

5. The semiconductor package system as claimed in claim 1 , wherein:

providing a solder mask over the plurality of thermal vias uses a solder mask having openings of a shape of at least one of circular, quadrangle, hexagonal, and combinations thereof.

6. The semiconductor package system as claimed in claim 1 , wherein:

providing a solder mask over the plurality of thermal vias uses a solder mask having openings in an array of at least one of a close packed array, an open array, and combinations thereof.

7. A semiconductor package system, comprising:

providing a substrate having a plurality of thermal vias extending through a central portion of the substrate;

providing a plurality of contacts on the upper and lower surfaces of the substrate;

providing an interconnect array connecting the plurality of contacts on the upper and lower surfaces of the substrate;

providing a solder mask over the plurality of thermal vias;

forming a plurality of thermally conductive bumps on at least some of the plurality of thermal vias using the solder mask;

attaching an inactive side of an integrated circuit die to the plurality of thermally conductive bumps; and

encapsulating the integrated circuit die.

8. The semiconductor package system as claimed in claim 7 , wherein:

forming the plurality of thermal vias extending through the central portion of the substrate uses a screen printing process.

9. The semiconductor package system as claimed in claim 7 , wherein:

attaching an integrated circuit die to the plurality of thermally conductive bumps uses bumps of a thermally conductive material having a thermal conductivity greater than that of the substrate.

10. The semiconductor package system as claimed in claim 7 , wherein:

attaching an integrated circuit die to the plurality of thermally conductive bumps uses at least one of a high thermal epoxy, a eutectic solder paste, a tin-silver solder paste, compounds thereof, alloys thereof, and combinations thereof.

11. The semiconductor package system as claimed in claim 7 , wherein:

providing a solder mask over the plurality of thermal vias uses a solder mask having openings having a shape of at least one of circular, quadrangle, hexagonal, and combinations thereof.

12. The semiconductor package system as claimed in claim 7 , wherein:

providing a solder mask over the plurality of thermal vias uses a solder mask having openings in an array of at least one of a close packed array, an open array, and combinations thereof.

Assignments (7)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2025
From: STATS CHIPPAC PTE. LTD.
To: STATS CHIPPAC MANAGEMENT PTE. LTD.
Reel/Frame 072788/0917 →
CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYING PARTY DATA FROM STATS CHIPPAC PTE. LTE. TO STATS CHIPPAC LTD. AND CORRECT THE NAME OF RECEIVING PARTY DATA FROM STATS CHIPPAC PTE. LTE. TO STATS CHIPPAC PTE. LTD. PREVIOUSLY RECORDED AT REEL: 64838 FRAME: 948. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded May 22, 2024
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 067553/0352 →
CORRECT ERROR IN ASSIGNMENT NAME FROM STATS CHIPPAC PTE. LTE. TO STATS CHIPPAC PTE. LTD. (REEL: 038378 FRAME: 0328 Recorded Aug 30, 2023
From: STATS CHIPPAC PTE. LTE.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 064838/0948 →
RELEASE OF SECURITY INTEREST Recorded Jun 15, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052935/0327 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0328 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 14, 2006
From: LEE, SANGKWON; LEE, TAE KEUN
To: STATS CHIPPAC LTD.
Reel/Frame 017168/0492 →