IP Library Granted Patent US 7,538,598
Granted Patent B1
US 7,538,598 · App. 12/172,675 · Granted May 26, 2009

Circuit and method for supplying programming potential at voltages larger than BVDss of programming transistors

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Quick Facts
Patent No.
US 7,538,598
App. No.
12/172,675
Granted
May 26, 2009
Kind
B1
Abstract

A circuit for programming an antifuse coupled between a first node and a second node includes at least one transistor for supplying a programming potential V PP to the first node. A first transistor has a source coupled to a third node switchably coupleable between a potential of V PP /2 and ground potential, a drain, and a gate. A second transistor has a source coupled to the drain of the first transistor, a drain coupled to the second node, and a gate. Programming circuitry is coupled to the gate of the first transistor and the gate of the second transistor and configured to in a programming mode apply a potential of either zero volts or VPP/2 to the gate of the first transistor and to apply a potential of VPP/2 to the gate of the second transistor. The first and second transistors have a BVDss rating of not more than about V PP /2.

Claims (33)

1. A circuit for applying current to a device having a first node and a second node with a potential V PP , the circuit disposed on an integrated circuit and comprising:

a first transistor having a first node coupled to a third node switchably coupleable between a potential of about V PP/2 and ground potential, a second node, and a gate;

a second transistor having a first node coupled to said second node of said first transistor, a second node coupled to the second node of the antifuse, and a gate;

a bootstrap circuit coupled to and programmably capable of precharging the first node of the device to a selected potential of V PP or V PP 2; and

circuitry coupled to said gate of said first transistor and said gate of said second transistor and configured to, in a current-applying mode, apply a potential of either zero volts or about V PP/2 to said gate of said first transistor and to apply a potential of about V PP/2 to said gate of said second transistor.

2. The circuit of claim 1 wherein:

the first node and second node are located off of the integrated circuit and the device is an external device.

3. The circuit of claim 1 wherein:

the first node of the device is connected to a wiring track;

the second node of the device is connected to a circuit input track; and

the second node of the first transistor and the first node of said second transistor are coupled to a circuit input associated with the circuit input track.

4. The circuit of claim 1 wherein:

the first node of the device is connected to a first wiring track and the second node of the device is connected to a second wiring track.

5. The circuit of claim 1 further including:

a circuit output track coupled to a circuit output through an output isolation transistor and to the second wiring track through a second device; and

a fifth transistor having a first node coupled to a fourth node switchably coupleable between a potential of V PP/2 and ground, a second node coupled to the circuit output track, and a gate coupled to the programming circuitry, the programming circuitry further configured to in a programming mode selectively turn on the fifth transistor.

6. The circuit of claim 1 further including:

a circuit input track coupled to a circuit input through an input isolation transistor and to the second wiring track through a third device; and

a sixth transistor having a first node coupled to a fifth node switchably coupleable between a potential of VPP/2 and ground, a second node coupled to the circuit input track, and a gate coupled to the programming circuitry, the programming circuitry further configured to in a programming mode selectively turn on the sixth transistor.

7. The circuit of claim 6 wherein:

the circuit input is an input to an inverter comprising:

an inverter transistor of a first type having a first node connected to a first power supply potential, a second node, and a gate,

an inverter transistor of a second type having a first node connected to the second node of the inverter transistor of the first type, a gate connected to the gate of the inverter transistor of the first type, and a first node; and

wherein the circuit further includes:

a transistor of the first type having a first node connected to the first node of the inverter transistor of the first type, a second node connected to the second node of the inverter transistor of the second type, and a gate coupled to the programming circuitry;

a transistor of the second type having a second node connected to the first node of the n-channel MOS inverter transistor of the second type, a first node coupled to ground, and a gate coupled to the programming circuitry.

8. The circuit of claim 7 wherein:

a transistor of the first type is a p-channel MOS transistor; and

a transistor of the second type is an n-channel MOS transistor.

9. The circuit of claim 1 wherein:

the bootstrap circuit is formed from a third transistor having a first node coupled to the first node of the antifuse, a second node coupled to a node selectively carrying the potential V PP or the potential V PP /2, and a gate, and a fourth transistor having a first node coupled to the gate of the third transistor, a second node coupled to a precharge select node, and a gate coupled to a programming control node.

10. The circuit of claim 1 wherein:

the first transistor and the second transistor are n-channel MOS transistors.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded May 29, 2018
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.), INC.; MICROSEMI FREQUENCY AND TIME CORPORATION; MICROSEMI COMMUNICATIONS, INC.; MICROSEMI SOC CORP.; MICROSEMI CORP. - POWER PRODUCTS GROUP; MICROSEMI CORP. - RF INTEGRATED SOLUTIONS
Reel/Frame 046251/0391 →
PATENT SECURITY AGREEMENT Recorded Feb 3, 2016
From: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC. (F/K/A LEGERITY, INC., ZARLINK SEMICONDUCTOR (V.N.) INC., CENTELLAX, INC., AND ZARLINK SEMICONDUCTOR (U.S.) INC.); MICROSEMI FREQUENCY AND TIME CORPORATION (F/K/A SYMMETRICON, INC.); MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION); MICROSEMI SOC CORP. (F/K/A ACTEL CORPORATION); MICROSEMI CORP. - POWER PRODUCTS GROUP (F/K/A ADVANCED POWER TECHNOLOGY INC.); MICROSEMI CORP. - RF INTEGRATED SOLUTIONS (F/K/A AML COMMUNICATIONS, INC.)
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037691/0697 →
RELEASE OF SECURITY INTEREST Recorded Jan 19, 2016
From: BANK OF AMERICA, N.A.
To: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP, A DELAWARE CORPORATION; MICROSEMI SOC CORP., A CALIFORNIA CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC., A DELAWARE CORPORATION; MICROSEMI FREQUENCY AND TIME CORPORATION, A DELAWARE CORPORATION; MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION), A DELAWARE CORPORATION; MICROSEMI CORP.-MEMORY AND STORAGE SOLUTIONS (F/K/A WHITE ELECTRONIC DESIGNS CORPORATION), AN INDIANA CORPORATION
Reel/Frame 037558/0711 →
CHANGE OF NAME Recorded Dec 28, 2015
From: ACTEL CORPORATION
To: MICROSEMI SOC CORP.
Reel/Frame 037393/0572 →
NOTICE OF SUCCESSION OF AGENCY Recorded Apr 9, 2015
From: ROYAL BANK OF CANADA (AS SUCCESSOR TO MORGAN STANLEY & CO. LLC)
To: BANK OF AMERICA, N.A., AS SUCCESSOR AGENT
Reel/Frame 035657/0223 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2011
From: WHITE ELECTRONIC DESIGNS CORP.; ACTEL CORPORATION; MICROSEMI CORPORATION
To: MORGAN STANLEY & CO. INCORPORATED
Reel/Frame 025783/0613 →