Semiconductor device and method of forming an embedded SOP fan-out package

1. A method of making a semiconductor device, comprising:

providing a semiconductor package further including,

(a) providing a substrate,

(b) disposing a first semiconductor die below a first surface of the substrate,

(c) depositing a first encapsulant below the first semiconductor die and completely covering the first surface of the substrate, and

(d) disposing a plurality of first bumps directly on a second surface of the substrate opposite the first surface;

disposing a second semiconductor die over the second surface of the substrate between the first bumps including a back surface of the second semiconductor die oriented toward the second surface of the substrate;

depositing a second encapsulant around the substrate, first semiconductor die, first encapsulant, first bumps, and second semiconductor die, wherein an active surface opposite the back surface of the second semiconductor die and a portion of the first bumps are exposed from the second encapsulant;

forming a first insulating layer over the second encapsulant and the active surface of the second semiconductor die;

forming a first conductive layer in contact with a contact pad of the second semiconductor die, the exposed portion of the first bumps, and the first insulating layer; and

forming an interconnect structure over the first conductive layer, wherein a height of the semiconductor device is less than 1 millimeter (mm).

2. The method of claim 1 , wherein forming the interconnect structure further includes:

forming a second insulating layer over the first conductive layer; and

forming a second bump over the second insulating layer.

3. The method of claim 1 , further including forming a warpage balance layer over the semiconductor package.

4. The method of claim 1 , wherein the first bumps include a stud bump.

5. A method of making a semiconductor device, comprising:

providing a substrate;

disposing a first semiconductor die below a first surface of the substrate;

disposing a second semiconductor die over a second surface of the substrate;

forming a bump over the second surface of the substrate including a side surface of the bump adjacent to a side surface of the first semiconductor die; and

disposing an encapsulant contacting the side surface of the bump and the side surface of the second semiconductor die and around the first semiconductor die, second semiconductor die, and bump, wherein an active surface of the second semiconductor die and a portion of the bump are exposed from the encapsulant.

6. The method of claim 5 , wherein the second semiconductor die includes a height less than a height of the bump.

7. The method of claim 5 , further including forming a warpage balance layer over the first semiconductor die.

8. The method of claim 5 , further including disposing a shielding layer or heat sink over the first semiconductor die.

9. The method of claim 5 , further including forming an opening in the encapsulant to provide stress relief.

10. The method of claim 5 , further including electrically connecting the first semiconductor die to the substrate with bond wires or microbumps.

11. A semiconductor device, comprising:

a semiconductor package including,

(a) a substrate,

(b) a first semiconductor die disposed below a first surface of the substrate,

(c) a first encapsulant deposited below the first semiconductor die and completely covering the first surface of the substrate, and

(d) a plurality of first bumps disposed directly on a second surface of the substrate opposite the first surface;

a second semiconductor die disposed over the second surface of the substrate between the first bumps including a back surface of the second semiconductor die oriented toward the second surface of the substrate;

a second encapsulant deposited around the substrate, first semiconductor die, first encapsulant, first bumps, and second semiconductor die, wherein an active surface opposite the back surface of the second semiconductor die and a portion of the first bumps are exposed from the second encapsulant;

a first insulating layer formed over the second encapsulant and the active surface of the second semiconductor die;

a first conductive layer formed over and contacting a contact pad of the second semiconductor die, the exposed portion of the first bumps, and the first insulating layer; and

an interconnect structure formed over the first conductive layer, wherein a height of the semiconductor device is less than 1 millimeter (mm).

12. The semiconductor device of claim 11 , further including a warpage balance layer formed over the semiconductor package.

13. The semiconductor device of claim 11 , wherein the second surface of the substrate is exposed from the first encapsulant.

14. The semiconductor device of claim 11 , wherein the interconnect structure further includes:

a second insulating layer formed over the first conductive layer; and

a plurality of second bumps formed over the second insulating layer and electrically connected to the first conductive layer.

15. A semiconductor device, comprising:

a semiconductor package including a first semiconductor die and a first encapsulant disposed under and around the first semiconductor die;

a second semiconductor die disposed over a surface of the semiconductor package;

a plurality of bumps formed over and contacting the surface of the semiconductor package and outside a footprint of the second semiconductor die, wherein the second semiconductor die is disposed directly between the bumps; and

a second encapsulant deposited under and around the semiconductor package, bumps, and second semiconductor die, wherein an active surface of the second semiconductor die and a portion of the bumps are exposed from the second encapsulant.

16. The semiconductor device of claim 15 , wherein a width of the semiconductor device is substantially equal to a width of the semiconductor package.

17. The semiconductor device of claim 15 , wherein the second encapsulant is a paste printed on the semiconductor package.

18. The semiconductor device of claim 15 , wherein the first encapsulant further includes an opening partially but not completely through the first encapsulant.

19. The semiconductor device of claim 15 , further including a substrate disposed between the first semiconductor die and second semiconductor die.

20. The semiconductor device of claim 15 , further including an interconnect structure formed over the bumps and second semiconductor die.

21. The semiconductor device of claim 11 , wherein a side surface of the second semiconductor die is disposed adjacent to a side surface of one of the plurality of first bumps.

22. The semiconductor device of claim 11 , wherein the first encapsulant further includes an opening opposite the substrate.

23. A semiconductor device, comprising:

a substrate;

a first semiconductor die disposed below a first surface of the substrate;

a second semiconductor die disposed over a second surface of the substrate opposite the first surface;

a bump disposed over the second surface of the substrate and outside a footprint of the second semiconductor die including a side surface of the bump disposed adjacent to a side surface of the second semiconductor die; and

an encapsulant contacting the side surface of the bump and the side surface of the second semiconductor die and deposited around the first semiconductor die, second semiconductor die, and bump, wherein an active surface of the second semiconductor die and a portion of the bump are exposed from the encapsulant.

24. The semiconductor device of claim 23 , wherein the encapsulant further includes an opening.

25. The semiconductor device of claim 23 , further including an interconnect structure formed over the bump and second semiconductor die.

26. The semiconductor device of claim 23 , wherein the second semiconductor die includes a height less than a height of the bump.

27. The semiconductor device of claim 23 , wherein a back side of the second semiconductor die is oriented toward the second surface of the substrate.

28. The semiconductor device of claim 23 , further including:

an insulating layer formed over the encapsulant and the active surface of the second semiconductor die; and

a conductive layer formed over and contacting a contact pad of the second semiconductor die, the exposed portion of the bump, and the insulating layer.

29. The semiconductor device of claim 23 , wherein a height of the semiconductor device is less than 600 micrometers (μm).

30. The semiconductor device of claim 11 , wherein the height of the semiconductor device is less than 600 micrometers (μm).

31. The semiconductor device of claim 15 , wherein a height of the semiconductor device is less than 600 micrometers (μm).

32. The semiconductor device of claim 20 , wherein the interconnect structure further includes:

an insulating layer formed over the second encapsulant and the active surface of the second semiconductor die; and

a conductive layer formed over and contacting a contact pad of the second semiconductor die, the exposed portion of the bumps, and the insulating layer.