Semiconductor device and method of forming TSV semiconductor wafer with embedded semiconductor die
A semiconductor device has a TSV semiconductor wafer with a cavity formed in a first surface of the wafer. A second cavity can be formed in a second surface of the wafer. A plurality of semiconductor die is mounted within the cavities. The semiconductor die can be mounted side-by-side and/or stacked within the cavity. Conductive TSV can be formed through the die. An encapsulant is deposited within the cavity over the die. A CTE of the die is similar to a CTE of the encapsulant. A first interconnect structure is formed over a first surface of the encapsulant and wafer. A second interconnect structure is formed over a second surface of the encapsulant and wafer. The first and second interconnect structure are electrically connected to the TSV wafer. A second semiconductor die can be mounted over the first interconnect structure with encapsulant deposited over the second die.
1. A semiconductor device, comprising:
a substrate;
a first cavity formed in a first surface of the substrate;
a first semiconductor die disposed within the first cavity of the substrate;
a first encapsulant deposited within the first cavity;
a first interconnect structure formed over the substrate and first semiconductor die;
a conductive via formed through the substrate and electrically connected to the first interconnect structure;
a second cavity formed in a second surface of the substrate opposite the first surface of the substrate;
a second semiconductor die disposed within the second cavity of the substrate; and
a second encapsulant deposited within the second cavity over the second semiconductor die.