IP Library Granted Patent US 10,001,884
Granted Patent B2
US 10,001,884 · App. 13/953,161 · Granted Jun 19, 2018

Voltage driven self-capacitance measurement

Inventor: Richard Collins (Southampton, GB)
Assignee: Atmel Corporation
G06F3/044G06F3/0416G06F2203/04108
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Quick Facts
Patent No.
US 10,001,884
App. No.
13/953,161
Granted
Jun 19, 2018
Kind
B2
Abstract

In one embodiment, a method includes substantially simultaneously applying a pre-determined voltage to a sense electrode and a corresponding drive electrode of a touch sensor. The application of the pre-determined voltage providing a measurement current at a capacitance including the sense electrode. The method also includes determining a difference between the measurement current at the capacitance and a reference value; and determining whether a proximity input to the touch sensor has occurred based at least in part on the difference.

Claims (33)

1. A method comprising:

coupling a first electrode of a touch sensor and a corresponding second electrode of the touch sensor to a voltage source, wherein the first electrode is capacitively coupled to the second electrode;

applying, through the voltage source, a pre-determined voltage to the first electrode and also substantially simultaneously applying the pre-determined voltage to the corresponding second electrode, the application of the pre-determined voltage providing a measurement current at a capacitance comprising the first electrode, wherein the measurement current results in a voltage at a negative input to a differential amplifier, and wherein the first electrode is oriented in a first orientation and the second electrode is oriented in a second orientation;

determining a difference between the measurement current at the capacitance and a reference value;

adjusting in real time a voltage of a reference path coupled to a positive input of the differential amplifier such that a voltage at the positive input of the differential amplifier is substantially equal to the voltage at the negative input of the differential amplifier resulting from the measurement current;

toggling an input of a lock-in demodulation circuit between an output voltage of the differential amplifier and an inverse of the output voltage from the differential amplifier every half cycle of the pre-determined voltage, wherein the output voltage of the differential amplifier is a function of the difference between the measurement current at the capacitance and the reference value, and wherein the pre-determined voltage comprises an alternating-current (AC) voltage;

generating an output voltage of the lock-in demodulation circuit by multiplying the voltage at the negative input to the differential amplifier by the pre-determined voltage, wherein the multiplication comprises applying lock-in demodulation to the voltage at the negative input to the differential amplifier; and

determining whether a proximity input to the touch sensor has occurred based at least in part on the output voltage.

2. The method of claim 1 , wherein the application of the pre-determined voltage comprises substantially simultaneously applying the pre-determined voltage to a plurality of second electrodes and a plurality of first electrodes, the plurality of second and first electrodes comprising all electrodes of the touch sensor.

3. The method of claim 1 , wherein applying lock-in demodulation comprises attenuating one or more components of the voltage at the capacitance out of phase with the pre-determined voltage.

4. The method of claim 1 , further comprising applying low-pass filtering to the output voltage.

5. A non-transitory computer-readable storage medium embodying logic configured when executed to:

couple a first electrode of a touch sensor and a corresponding second electrode of the touch sensor to a voltage source, wherein the first electrode is capacitively coupled to the second electrode;

apply, through the voltage source, a pre-determined voltage to the first electrode and also substantially simultaneously apply the pre-determined voltage to the corresponding second electrode, the application of the pre-determined voltage providing a measurement current at a capacitance comprising the first electrode wherein the measurement current results in a voltage at a negative input to a differential amplifier, and wherein the first electrode is oriented in a first orientation and the second electrode is oriented in a second orientation;

determine a difference between the measurement current at the capacitance and a reference value;

adjust in real time a voltage of a reference path coupled to a positive input of the differential amplifier such that a voltage at the positive input of the differential amplifier is substantially equal to the voltage at the negative input of the differential amplifier resulting from the measurement current;

toggle an input of a lock-in demodulation circuit between an output voltage of the differential amplifier and an inverse of the output voltage from the differential amplifier every half cycle of the pre-determined voltage, wherein the output voltage of the differential amplifier is a function of the difference between the measurement current at the capacitance and the reference value, and wherein the pre-determined voltage comprises an alternating-current (AC) voltage;

generate an output voltage of the lock-in demodulation circuit by multiplying the voltage at the negative input to the differential amplifier by the pre-determined voltage, wherein the multiplication comprises applying lock-in demodulation to the voltage at the negative input to the differential amplifier; and

determine whether a touch input to the touch sensor has occurred based at least in part on the output voltage.

6. The medium of claim 5 , wherein the software is further configured to substantially simultaneously apply the pre-determined voltage to a plurality of second electrodes and a plurality of first electrodes, the plurality of second and first electrodes comprising all electrodes of the touch sensor.

7. The medium of claim 5 , wherein the software is further configured to attenuate one or more components of the voltage at the capacitance out of phase with the pre-determined voltage.

8. The medium of claim 5 , wherein the software is further configured to apply low-pass filtering to the output voltage.

9. A device comprising:

a measurement circuit; and

a non-transitory computer-readable storage medium coupled to the measurement circuit and embodying logic configured when executed to:

couple a first electrode of a touch sensor and a corresponding second electrode of the touch sensor to a voltage source, wherein the first electrode is capacitively coupled to the second electrode;

apply, through the voltage source, a pre-determined voltage to the first electrode and also substantially simultaneously apply the pre-determined voltage to the corresponding second electrode, the application of the pre-determined voltage providing a measurement current at a capacitance comprising the first electrode, wherein the measurement current results in a voltage at a negative input to a differential amplifier, and wherein the first electrode is oriented in a first orientation and the second electrode is oriented in a second orientation;

determine a difference between the measurement current at the capacitance and a reference value;

adjust in real time a voltage of a reference path coupled to a positive input of the differential amplifier such that a voltage at the positive input of the differential amplifier is substantially equal to the voltage at the negative input of the differential amplifier resulting from the measurement current; and

toggle an input of a lock-in demodulation circuit between an output voltage of the differential amplifier and an inverse of the output voltage from the differential amplifier every half cycle of the pre-determined voltage, wherein the output voltage of the differential amplifier is a function of the difference between the measurement current at the capacitance and the reference value, and wherein the pre-determined voltage comprises an alternating-current (AC) voltage;

generate an output voltage of the lock-in demodulation circuit by multiplying the voltage at the negative input to the differential amplifier by the pre-determined voltage, wherein the multiplication comprises applying lock-in demodulation to the voltage at the negative input to the differential amplifier; and

determine whether a touch input to the touch sensor has occurred based at least in part on the output voltage.

10. The device of claim 9 , wherein the software is further configured to substantially simultaneously apply the pre-determined voltage to a plurality of second electrodes and a plurality of first electrodes, the plurality of second and first electrodes comprising all electrodes of the touch sensor.

Assignments (18)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 29, 2013
From: ATMEL TECHNOLOGIES U.K. LIMITED
To: ATMEL CORPORATION
Reel/Frame 031112/0251 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 29, 2013
From: COLLINS, RICHARD
To: ATMEL TECHNOLOGIES U.K. LIMITED
Reel/Frame 030896/0532 →
Continuity (1)
Related Publication 20150029130A1 · Jan 29, 2015