Voltage reference with low sensitivty to package shift
In a bandgap voltage reference with low package shift, a proportional to absolute temperature (PTAT) voltage is generated using a single diode biased at two different current levels at two different times. Using the same diode for both current density measurements removes the absolute value of the base-emitter junction voltage (Vbe) and any package shift in the PTAT voltage. The bandgap voltage reference can be implemented in a single or differential circuit topology. In some implementations, the bandgap voltage reference can include circuitry for curvature correction.
1. A bandgap voltage reference circuit, comprising:
a bias voltage generator circuit for generating a proportional to absolute temperature (PTAT) voltage, the bias voltage generator circuit including a first PTAT current source configured to be coupled to a diode during a first phase of operation and a second PTAT current source configured to be coupled to the diode during a second phase of operation, where the first PTAT current source is configured for providing a higher current level than the second PTAT current source and where the first and second phases occur at different times;
a measurement circuit configured to be coupled to the first PTAT current source during the first phase of operation for measuring a base-emitter junction voltage (Vbe) of the diode and to be coupled to the second PTAT current source during the second phase of operation for measuring a shift in Vbe (ΔVbe);
a bandgap voltage generator circuit configured to be coupled to the measurement circuit during the second phase of operation for generating a bandgap voltage based on ΔVbe;
a first set of switches that are operable during the first phase of operation to couple the measurement circuit to the bias voltage generator circuit; and
a second set of switches that during the second phase of operation are operable to couple the measured voltages to the bandgap voltage generator circuit, where the second set of switches are open when the first set of switches are closed and vice-versa, wherein the first and second sets of switches are commanded closed or open based on four clock signals, a first clock signal, a delayed version of the first clock signal, a second clock signal and a delayed version of the second clock signal.
2. The bandgap voltage reference circuit of claim 1 , where the measurement circuit comprises:
a first measurement capacitor configured to be coupled to the first PTAT current source during the first phase of operation; and
a second measurement capacitor configured to be coupled to the second current source during the first and second phases of operation.
3. The bandgap voltage reference circuit of claim 1 , where the bandgap voltage generator comprises:
an operational amplifier coupled to the measurement circuit; and
a feedback capacitor coupled between an output of the operational amplifier and an input of the operational amplifier during the second phase of operation.
4. The bandgap voltage reference circuit of claim 1 , further comprising:
a curvature correction circuit coupled to the measurement circuit for correcting a non-linearity of Vbe, the curvature correction circuit including a zero temperature coefficient (ZTC) current source configured to be coupled to a second diode during the first phase of operation to produce a ZTC voltage and a third PTAT current source configured to be coupled to the second diode during the second phase of operation to provide a PTAT voltage.
5. The bandgap voltage reference circuit of claim 4 , where the measurement circuit includes a third measurement capacitor coupled to the curvature correction circuit for measuring a curvature correction voltage that is a difference between the ZTC voltage and the PTAT voltage.
6. The bandgap voltage reference circuit of claim 1 , further comprising:
a low-pass filter configured to be coupled the output of the bandgap voltage generator circuit during the second phase of operation.
7. A method of providing a bandgap voltage reference comprising:
generating, by a bias voltage generator circuit, a first proportional to absolute temperature (PTAT) current by a first PTAT current source during a first phase of operation and a second PTAT current by a second PTAT current source during a second phase of operation, where the first and second PTAT current sources are operable to couple to a single diode during the first phase of operation and the second phase of operation, respectively, and where the first PTAT current level is higher than the second PTAT current level and the first and second phases of operation occur at different times;
coupling, by a first set of switches during the first phase of operation, a measurement circuit to the bias voltage generator circuit;
measuring, by the measurement circuit, a base-emitter junction voltage (Vbe) of the diode coupled to the first PTAT current source during the first phase of operations;
coupling, by a second set of switches during the second phase of operation, the measured Vbe of the diode to the bandgap voltage generator circuit;
measuring a shift in Vbe (ΔVbe) during the second phase of operation; and
generating a bandgap voltage based on ΔVbe,
wherein the second set of switches are open when the first set of switches are closed and vice-versa, wherein the first and second sets of switches are commanded closed or open based on four clock signals, a first clock signal, a delayed version of the first clock signal, a second clock signal and a delayed version of the second clock signal.
8. The method of claim 7 , further comprising:
generating a curvature correction voltage; and
correcting a non-linearity of the bandgap voltage using the curvature correction voltage.
9. The method of claim 7 , further comprising:
filtering the bandgap voltage using a low-pass filter.