IP Library Granted Patent US 10,290,907
Granted Patent B2
US 10,290,907 · App. 14/813,314 · Granted May 14, 2019

Automatically programmable battery protection system and related methods

Inventors: Keiji Amemiya (Fukaya, JP); Hiroshi Saito (Ota, JP); Mutsuki Niki (Saitama, JP); Yasuaki Hayashi (Oura-gun, JP)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H01M10/4257H01M2/348H02J7/0031H01M2010/4271H01M2200/103H01M2220/30H02J2007/004H02J2007/0037H02J2007/0039
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Quick Facts
Patent No.
US 10,290,907
App. No.
14/813,314
Granted
May 14, 2019
Kind
B2
Abstract

A programmable battery protection system. Implementations may include: a battery, only two field effect transistors (FETs), and a battery protection integrated circuit (IC). The battery protection IC may include an array of fuses, first plurality of latches, second plurality of latches, and a comparator. The array of fuses, first plurality of latches, and second plurality of latches may be coupled with a fuse refresh circuit coupled with an analog trigger circuit and a logic trigger circuit. The fuse refresh circuit may be configured to refresh the states of the latches using states of the array of fuses in response to receiving an operating trigger signal generated by the analog trigger circuit or a logic trigger signal generated by the logic trigger circuit. The first plurality of latches may be used to generate a threshold voltage that is provided to the comparator.

Claims (30)

1. An automatically refreshable programmable battery protection system comprising:

a battery;

at least two field effect transistors (FETs) coupled with the battery;

a battery protection integrated circuit (IC) coupled with the FETs wherein the battery protection IC comprises:

an array of fuses;

a first plurality of latches coupled with the array of fuses;

a second plurality of latches coupled with the array of fuses; and

a comparator coupled with the first plurality of latches;

wherein the array of fuses, the first plurality of latches, and the second plurality of latches are coupled with a fuse refresh circuit coupled with an analog trigger circuit and a logic trigger circuit, the fuse refresh circuit configured to refresh the states of the first plurality of latches and the second plurality of latches using states of the array of fuses in response to receiving one of an operating trigger signal generated by the analog trigger circuit and a logic trigger signal generated by the logic trigger circuit; and

wherein the first plurality of latches are used to generate a threshold voltage that is provided to the comparator; and

wherein the fuse refresh circuit is configured to refresh the states of the first plurality of latches and the second plurality of latches using states of the array of fuses in response to receiving a power on/reset signal from the battery.

2. The system of claim 1 , wherein the logic trigger circuit comprises a plurality of XOR gates coupled with an AND gate coupled with an OR gate, where the OR gate is configured to generate the logic trigger signal to the fuse refresh circuit in response to receiving a first logic trigger signal from the AND gate.

3. The system of claim 2 , wherein each of the plurality of XOR gates are coupled with a first latch of the first plurality of latches and a corresponding first dummy latch from the second plurality of latches and is configured to compare a state of the first latch with a state of the first dummy latch and output the result to the AND gate.

4. The system of claim 3 , wherein if any XOR gate of the plurality of XOR gates returns a null value, the AND gate generates the first logic trigger signal.

5. The system of claim 1 , wherein the logic trigger circuit comprises a plurality of XOR gates where each of the plurality of XOR gates is coupled to a first latch and a second immediately adjacent latch of the first plurality of latches, the outputs of the plurality of XOR gates are coupled to an XOR gate, and the output of the XOR gate is coupled to a first D flip flop and to a inverter coupled with a second D flip flop, wherein the output of the first D flip flop and the output of the second D flip flop are coupled with an OR gate coupled to the fuse refresh circuit and the OR gate is configured to generate the logic trigger signal.

6. The system of claim 5 , wherein during operation, if the XOR gate outputs a 0, this indicates that the comparison of the states of the first plurality of latches by the plurality of XOR gates shows that a sum of the states of the first plurality of latches has changed from an even number to an odd number, the second D flip flop generates a second logic trigger signal and outputs the result to the OR gate which then, in response, generates the logic trigger signal.

7. The system of claim 5 , wherein during operation, if the XOR gate outputs a 0, indicating that the comparison of the states of the first plurality of latches by the plurality of XOR gates shows that a sum of the states of the first plurality of latches has changed from an odd number to an even number, the first D flip flop generates a second logic trigger signal and outputs the result to the OR gate which then, in response, generates the logic trigger signal.

8. The system of claim 1 , wherein the plurality of latches are gated D latches and the first plurality of latches and second plurality of latches are located in separate portions of the battery protection integrated circuit (IC).

9. The system of claim 1 , wherein the first plurality of latches are coupled with a plurality of metal oxide semiconductor field effect transistors (MOSFETs) and where the plurality of MOSFETs are coupled in parallel with a plurality of resistors coupled to the comparator.

10. A battery protection integrated circuit (IC) comprising:

an array of fuses;

a first plurality of latches coupled with the array of fuses;

a second plurality of latches coupled with the array of fuses;

a comparator coupled with the plurality of latches and with a battery control circuit;

a fuse refresh circuit coupled with a trigger circuit and coupled with the array of fuses, the first plurality of latches, and the second plurality of latches;

wherein the trigger circuit comprises an analog trigger circuit and a logic trigger circuit; and

wherein the logic trigger circuit comprises a plurality of XOR gates where each of the plurality of XOR gates is coupled to a first latch and a second immediately adjacent latch of the first plurality of latches, the outputs of the plurality of XOR gates are coupled to an XOR gate, and the output of the XOR gate is coupled to a first D flip flop and to an inverter coupled with a second D flip flop.

11. The IC of claim 10 , wherein the first plurality of latches are coupled with a plurality of metal oxide semiconductor field effect transistors (MOSFETs) which are coupled in parallel with a plurality of resistors coupled to the comparator.

12. The IC of claim 10 , wherein the plurality of latches are gated D latches and the first plurality of latches and second plurality of latches are located in separate portions of the IC.

13. The IC of claim 10 , wherein the logic trigger circuit comprises a plurality of XOR gates coupled with an AND gate coupled with an OR gate.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2015
From: AMEMIYA, KEIJI; SAITO, HIROSHI; NIKI, MUTSUKI; HAYASHI, YASUAKI
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 036215/0263 →
Continuity (3)
Continuation In Part 14811973 · Jul 29, 2015
Continuation In Part 14809425 · Jul 27, 2015
Related Publication 20170033413A1 · Feb 2, 2017
Cited By (1)
US 12,633,486