IP Library Granted Patent US 10,409,429
Granted Patent B2
US 10,409,429 · App. 14/978,332 · Granted Sep 10, 2019

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Quick Facts
Patent No.
US 10,409,429
App. No.
14/978,332
Granted
Sep 10, 2019
Kind
B2
Abstract

In certain embodiments, a method includes selecting, for a touch sensor including a first number of electrodes and a second number of electrodes, a first set of the first number of electrodes and a second set of the second number of electrodes. The first number of electrodes has a first orientation and the second number of electrodes has a second orientation. The second orientation being different from the first orientation. An overlap area is formed by an overlap of the first set and second set. The method also includes applying, during a first time period, a signal including a first pre-determined voltage to the first set and the second set such that, during the first time period, the overlap area has a first signal state; and applying, during a second time period, the signal to the first set and a second pre-determined voltage to the second set.

Claims (54)

1. A method comprising:

selecting, for a touch sensor comprising a first plurality of electrodes and a second plurality of electrodes, a first set of the first plurality of electrodes and a second set of the second plurality of electrodes, the first plurality of electrodes having a first orientation and the second plurality of electrodes having a second orientation, the second orientation being different from the first orientation, an overlap area being formed by an overlap of the first set and second set;

applying, during a first time period, a signal comprising a first pre-determined voltage to each electrode of the first set and each electrode of the second set such that, during the first time period, the overlap area has a first signal state;

applying, during a second time period, the signal to each electrode of the first set and a second pre-determined voltage to each electrode of the second set such that, during the second time period, the overlap area has a second signal state; and

applying, during a third time period, the second pre-determined voltage to each electrode of the first set and each electrode of the second set such that, during the third time period, the overlap area has a third signal state;

wherein the first pre-determined voltage is different than the second pre-determined voltage.

2. The method of claim 1 , further comprising applying, during a fourth time period, the signal to each electrode of the second set and the second pre-determined voltage to each electrode of the first set such that, during the fourth time period, the overlap area has the second signal state.

3. The method of claim 1 , further comprising performing one or more of the following:

modifying a quantity of electrodes included in the first set such that a width of the first set is changed in response to determining an absence of a touch input; and

modifying a quantity of electrodes included in the second set such that a width of the second set is changed in response to determining an absence of a touch input.

4. The method of claim 1 , further comprising:

removing one of the electrodes from the first set of in response to determining an absence of a touch input;

selecting an electrode from among the first set based on the electrode being positioned adjacent to the selected set of the first plurality of electrodes; and

adding the first electrode to the first set, such that a location of the first set is offset at least in part along the second orientation.

5. The method of claim 1 , wherein the signal comprises one or more pulses comprising the first pre-determined voltage.

6. The method of claim 1 , further comprising applying, during the first time period, the second pre-determined voltage to the electrodes of the first plurality of electrodes other than the first set and the electrodes of the second plurality of electrodes other than the second set, wherein the first pre-determined voltage is higher than the second pre-determined voltage.

7. The method of claim 1 , wherein the second pre-determined voltage is ground.

8. A controller comprising:

a processor; and

a memory coupled to the processor, the memory storing logic configured to cause the processor as a result of being by executed the processor, to:

select, for a touch sensor comprising a first plurality of electrodes and a second plurality of electrodes, a first set of the first plurality of electrodes and a second set of the second plurality of electrodes, the first plurality of electrodes having a first orientation and the second plurality of electrodes having a second orientation, the second orientation being different from the first orientation, an overlap area being formed by an overlap of the first set and second set;

apply, during a first time period, a signal comprising a first pre-determined voltage to each electrode of the first set and each electrode of the second set such that, during the first time period, the overlap area has a first signal state;

apply, during a second time period, the signal to each electrode of the first set and a second pre-determined voltage to each electrode of the second set such that, during the second time period, the overlap area has a second signal state; and

apply, during a third time period, the second pre-determined voltage to each electrode of the first set and each electrode of the second set such that, during the third time period, the overlap area has a third signal state;

wherein the first pre-determined voltage is different than the second pre-determined voltage.

9. The controller of claim 8 , wherein the processor is further configured to apply, during a fourth time period, the signal to each electrode of the second set and the second pre-determined voltage to each electrode of the first set such that, during the fourth time period, the overlap area has the second signal state.

10. The controller of claim 8 , wherein the processor is further configured to perform one or more of the following:

modify a quantity of electrodes included in the first set such that a width of the first set is changed in response to determining an absence of a touch input; and

modify a quantity of electrodes included in the second set such that a width of the second set is changed in response to determining an absence of a touch input.

11. The controller of claim 8 , wherein the processor is further configured to:

remove one of the electrodes from the first set of in response to determining an absence of a touch input;

select an electrode from among the first set based on the electrode being positioned adjacent to the selected set of the first plurality of electrodes; and

add the first electrode to the first set, such that a location of the first set is offset at least in part along the second orientation.

12. The controller of claim 8 , wherein the signal comprises one or more pulses comprising the first pre-determined voltage.

13. The controller of claim 8 , wherein the processor is further configured to apply, during the first time period, the second pre-determined voltage to the electrodes of the first plurality of electrodes other than the first set and the electrodes of the second plurality of electrodes other than the second set, wherein the first pre-determined voltage is higher than the second pre-determined voltage.

14. The controller of claim 8 , wherein the second pre-determined voltage is ground.

15. A system comprising:

a touch sensor comprising a first plurality of electrodes and a second plurality of electrodes, a first set of the first plurality of electrodes and a first set of the second plurality of electrodes, the first plurality of electrodes having a first orientation and the second plurality of electrodes having a second orientation, the second orientation being different from the first orientation; and

a controller coupled to the touch sensor and embodying logic that is configured when executed to:

select, a first set of the first plurality of electrodes and a second set of the second plurality of electrodes, an overlap area being formed by an overlap of the first set and second set;

apply, during a first time period, a signal comprising a first pre-determined voltage to each electrode of the first set and each electrode of the second set such that, during the first time period, the overlap area has a first signal state;

apply, during a second time period, the signal to each electrode of the first set and a second pre-determined voltage to each electrode of the second set such that, during the second time period, the overlap area has a second signal state; and

apply, during a third time period, the second pre-determined voltage to each electrode of the first set and each electrode of the second set such that, during the third time period, the overlap area has a third signal state;

wherein the first pre-determined voltage is different than the second pre-determined voltage.

16. The system of claim 15 , wherein the processor is further configured to apply, during a fourth time period, the signal to each electrode of the second set and the second pre-determined voltage to each electrode of the first set such that, during the fourth time period, the overlap area has the second signal state.

17. The system of claim 15 , wherein the processor is further configured to perform one or more of the following:

modify a quantity of electrodes included in the first set such that a width of the first set is changed in response to determining an absence of a touch input; and

modify a quantity of electrodes included in the second set such that a width of the second set is changed in response to determining an absence of a touch input.

18. The system of claim 15 , wherein the processor is further configured to:

remove one of the electrodes from the first set of in response to determining an absence of a touch input;

select an electrode from among the first set based on the electrode being positioned adjacent to the selected set of the first plurality of electrodes; and

add the first electrode to the first set, such that a location of the first set is offset at least in part along the second orientation.

19. The system of claim 15 , wherein the signal comprises one or more pulses comprising the first pre-determined voltage.

20. The system of claim 15 , wherein the processor is further configured to apply, during the first time period, the second pre-determined voltage to the electrodes of the first plurality of electrodes other than the first set and the electrodes of the second plurality of electrodes other than the second set, wherein the first pre-determined voltage is higher than the second pre-determined voltage.

Assignments (17)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2025
From: MICROCHIP TECHNOLOGY INC.; MICROCHIP TECHNOLOGY IRELAND LIMITED; MICROSEMI CORPORATION; ATMEL CORPORATION; SILICON STORAGE TECHNOLOGY, INC.; MICROSEMI FREQUENCY AND TIME CORP.; MICROSEMI SEMICONDUCTOR ULC; MICROCHIP TECHNOLOGY GERMANY GMBH
To: CRESTONE IP MANAGEMENT, LLC
Reel/Frame 071991/0419 →
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2016
From: ATMEL TECHNOLOGIES U.K. LIMITED
To: ATMEL CORPORATION
Reel/Frame 037640/0514 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2015
From: BELL, THOMAS
To: ATMEL TECHNOLOGIES U.K. LIMITED
Reel/Frame 037350/0701 →