Semiconductor leadframes and packages with solder dams and related methods
A semiconductor package includes a leadframe having a first island and second island each having an upper surface corresponding with an upper surface of the leadframe. One or more tie bars couple the first island with the second island. At least one tie bar has a protrusion extending from the upper surface of the leadframe and configured to substantially prevent a flow of a solder between the first and second islands. A first die couples with the leadframe at the first island and a second die couples with the leadframe at the second island. At least one of the tie bars has a recess at a lower surface of the leadframe. The leadframe includes a slit between the first and second island.
1. A leadframe for a semiconductor package, comprising:
a first island comprising an upper surface corresponding with an upper surface of the leadframe, the upper surface of the first island comprising a largest planar surface of the leadframe;
a second island comprising an upper surface corresponding with the upper surface of the leadframe, the upper surface of the second island comprising a second largest planar surface of the leadframe, and;
one or more tie bars coupling the first island with the second island;
wherein at least one of the one or more tie bars comprises a protrusion extending upwards from the upper surface of the leadframe, the protrusion extending above a surface of one of the first island and the second island.
2. The leadframe of claim 1 , wherein the protrusion substantially prevents a flow of a solder between the first island and the second island.
3. The leadframe of claim 1 , wherein the first island and the second island are coupled together only through the one or more tie bars.
4. The leadframe of claim 1 , wherein the one or more tie bars comprises two tie bars.
5. The leadframe of claim 1 , wherein at least one of the one or more tie bars comprises a recess at a lower surface of the leadframe.
6. The leadframe of claim 1 , wherein the leadframe comprises a slit between the first island and the second island.
7. The leadframe of claim 1 , wherein one or more electrical contacts extend from the first island and one or more electrical contacts extend from the second island.
8. A semiconductor package, comprising:
a leadframe comprising:
a first island comprising an upper surface corresponding with an upper surface of the leadframe;
a second island comprising an upper surface corresponding with the upper surface of the leadframe, and;
one or more tie bars coupling the first island with the second island, wherein at least one of the one or more tie bars comprises a protrusion extending from the upper surface of the leadframe, the protrusion configured to prevent a flow of a solder between the first island and the second island;
a first die coupled with the leadframe at the first island;
a second die coupled with the leadframe at the second island;
a mold compound encapsulating the first die, the second die, at least a portion of the first island, and at least a portion of the second island, and;
a plurality of electrical contacts each comprising an exposed surface exposed through the mold compound.
9. The semiconductor package of claim 8 , wherein at least one electrical connector electrically couples the first die with at least one of the electrical contacts, at least one electrical connector electrically couples the second die with at least one of the electrical contacts, and at least one electrical connector electrically couples the first die with the second die.
10. The semiconductor package of claim 8 , wherein at least one of the one or more tie bars comprises a recess at a lower surface of the leadframe.
11. The semiconductor package of claim 8 , wherein the leadframe comprises a slit between the first island and the second island.
12. The semiconductor package of claim 11 , wherein the leadframe comprises only two tie bars between the first island and the second island, the two tie bars located on opposing ends of the slit.
13. The semiconductor package of claim 8 , wherein the upper surface of the first island comprises a largest planar surface of the leadframe.
14. The semiconductor package of claim 8 , wherein the upper surface of the second island comprises a second largest planar surface of the leadframe.
15. The semiconductor package of claim 8 , wherein the mold compound encapsulates a majority of the first island and a majority of the second island.
16. A semiconductor package, comprising:
a leadframe comprising:
a first island comprising an upper surface corresponding with an upper surface of the leadframe, the upper surface of the first island comprising a largest planar surface of the leadframe;
a second island comprising an upper surface corresponding with the upper surface of the leadframe, the upper surface of the second island comprising a second largest planar surface of the leadframe, and;
one or more tie bars coupling the first island with the second island, wherein at least one of the one or more tie bars comprises a protrusion extending upwards from the upper surface of the leadframe, the protrusion extending above a surface of one of the first island and the second island;
a first die coupled with the leadframe at the first island, the first die comprising a transistor comprising one of a field effect transistor (FET) and an insulated gate bipolar transistor (IGBT);
a second die coupled with the leadframe at the second island, the second die comprising a control integrated circuit (control IC) configured to control the transistor;
a mold compound encapsulating the first die, the second die, a majority of the first island, and a majority of the second island, and;
a plurality of electrical contacts each comprising an exposed surface exposed through the mold compound.
17. The semiconductor package of claim 16 , wherein at least one electrical connector electrically couples the first die with at least one of the electrical contacts, at least one electrical connector electrically couples the second die with at least one of the electrical contacts, at least one electrical connector electrically couples the first die with the second die, and wherein a bottom surface of the second die is coupled at the second island only through one or more electrical insulators.
18. The semiconductor package of claim 16 , wherein the protrusion is configured to substantially prevent a flow of a solder between the first island and the second island.
19. The semiconductor package of claim 16 , wherein at least one of the one or more tie bars comprises a recess at a lower surface of the leadframe.
20. The semiconductor package of claim 16 , wherein the leadframe comprises a slit between the first island and the second island, and wherein the leadframe comprises a first tie bar at a first end of the slit and a second tie bar at a second end of the slit.